Large signal descriptions are now required as wireless networks are pushed beyond the limits of linear analysis. The complexity of the resulting problems demand multi-disciplinary solutions. NIST is beginning to address these needs and has established a new measurement facility for device level characterizations. However, the techniques being investigated under the existing program are limited by measurement uncertainty in the phase information and require an external validation to push to higher frequencies. In addition, general modeling techniques for nonlinear components at the system level are inadequate and do not exploit the wealth of measurement data that is now available at the device level.
Every segment of the wireless community, both in existing commercial systems and higher-frequency links now being considered.
The objective of this project is to advance the state of the art in measurement and modeling of high frequency wireless systems and components under large signal conditions. Develop and verify a standard nonlinear device with large-signal response that can be predicted from underlying physical principles; develop a measurement-based model, and validate by comparing system simulation predictions to those based on a physical model. Produce methods and software for instrument calibration and system simulations;
The timelines and milestones for this project are:
Lead Organizational Unit:itl