Electronics & Telecommunications Programs & Projects | |
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Nanostructure Fabrication and Metrology
Last Updated Date: 11/07/2011 Single photons are the fundamental particles for all optical measurements. Single photon detectors made from avalanche photodiodes or … more
Metrology of the Ohm
Last Updated Date: 10/03/2011 Resistance standards traceable to NIST provide references for measurements of current at levels from 2000 A to below 1 pA and are used to support … more
Quantum Conductance Project/Graphene-Based Quantum Metrology
Last Updated Date: 10/03/2011 The goal of the Quantum Conductance Project is to develop graphene metrology for intrinsic electrical standards, specifically … more
Electronic Kilogram
Last Updated Date: 10/03/2011 This project provides the basis for a new definition of mass, based on unchanging quantum properties of nature rather than a physical … more
Electric Power Metrology and the Smart Grid
Last Updated Date: 10/03/2011 Our country's way of life depends on the electric power distribution system. Keeping the national electric grid in good working order -- and … more
Terahertz Imaging and Sources
Last Updated Date: 10/03/2011 Imaging in the terahertz frequency range enables the detection of concealed weapons and other contraband (e.g., explosives under clothing) without … more
Thermal Noise Metrology
Last Updated Date: 09/27/2011 This project develops methods for very accurate measurements of thermal noise and provides support for such measurements in the communications and … more
Antenna Metrology
Last Updated Date: 02/11/2011 Antennas are the eyes, ears and voices of everything from cell phones to interplanetary spacecraft. The Antenna Metrology Program carries on … more
Smart Grid Version 2.0
Last Updated Date: 12/03/2010 Under the Energy Independence and Security Act (EISA) of 2007, the National Institute of Standards and Technology (NIST) has … more
Antenna Metrology Project
Last Updated Date: 10/05/2010 Antennas are the eyes, ears and voice boxes of everything from cell phones to interplanetary spacecraft. The Antenna Metrology Program carries on … more
Advanced High Frequency Devices
Last Updated Date: 10/05/2010 The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at … more
Fundamental Guided Wave Metrology
Last Updated Date: 10/05/2010 Radio-frequency (RF) waves and microwaves are involved with almost every facet of everyday life. Radio stations, television, wireless devices, … more
Field Parameter Metrology
Last Updated Date: 10/05/2010 Consider the consequences if nearby electronics could interfere with a jet's instruments or cause an automobile to stall. The Field Parameter … more
Wireless Systems Metrology
Last Updated Date: 10/05/2010 Imagine how much safer a fire fighter's job would be if it were possible for a robot to navigate in a burning building and locate those in … more
Super-resolution Optical Microscopy
Last Updated Date: 10/05/2010 As the electronics and data storage industries build devices on ever decreasing scales, they need advanced imaging techniques that allow them to … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |