NIST logo
NIST Home > Electronics & Telecommunications Programs and Projects 
 

Electronics & Telecommunications Programs & Projects

(showing 46 - 60 of 82)
Biomagnetic Imaging Standards and Microsystems
Last Updated Date: 12/02/2014

The Magnetics Group's program in biomagnetic imaging standards and microsystems develops calibration standards and new types of magnetic contrast … more

700 MHz Band Channel Propagation Model
Last Updated Date: 12/01/2014

To provide telecommunications designers working in public safety communications with channel propagation models to use in simulation and testing. more

Thermal Noise Metrology
Last Updated Date: 11/28/2014

This project develops methods for very accurate measurements of thermal noise and provides support for such measurements in the communications and … more

High Speed Electronics
Last Updated Date: 11/28/2014

This project supports the microwave, telecommunications, computing, and emerging nanoelectronics industries through research and development of … more

Theory of the optical properties of materials
Last Updated Date: 11/28/2014

The overarching objective of this project is reliably calculating the bulk optical properties of materials, such as complex index of refraction, … more

Seamless and Secure Mobility
Last Updated Date: 11/28/2014

The problem we are facing is how to interconnect a wide variety of heterogeneous and un-interoperable networks including wired and wireless … more

Genomics of Electronic Materials
Last Updated Date: 11/20/2014

Our goal is to develop the metrology to enable a materials genomic approach to the discovery and optimization of complex electronic and … more

Nanoelectronic Device Metrology
Last Updated Date: 09/30/2014

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

Optical Spectroscopy of Nanostructures
Last Updated Date: 09/30/2014

Understanding the underlying chemistry and physics of nanomaterials, including noble and transition metallic nanoparticles, carbon nanotubes, and … more

CMOS Device and Reliability
Last Updated Date: 09/29/2014

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Three-Dimensional Nanometer Metrology
Last Updated Date: 09/29/2014

Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the … more

Metrology for Advanced Bioelectronics
Last Updated Date: 09/29/2014

We are developing electronic chip-based technology for DNA and protein analysis for industry. This research will help revolutionize health care, … more

Back-End-of-Line Reliability Metrology Development
Last Updated Date: 09/26/2014

The Back-End-of-Line (BEOL) Reliability Metrology Development project aims to develop the metrology to enable quantitative and mechanistic … more

Nanoparticle Manipulation Metrology
Last Updated Date: 09/25/2014

We are advancing the measurement of dimension and function of engineered nanoparticles for biomedical research, manufacturing, and environmental … more

Thin Film Electronics
Last Updated Date: 09/23/2014

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070