NIST logo
*
Bookmark and Share

2000 Performance Metrics for Intelligent Systems (PerMIS'00) Workshop

Purpose:

The goal of this workshop is to discuss the challenges pertaining to intelligent system performance:
  • how to measure performance
  • how to evaluate intelligence, and
  • how to put performance and intelligence into correspondence.

 

 

Past Workshops

Details:

Start Date: Monday, August 14, 2000
End Date: Wednesday, August 16, 2000
Format: Workshop

Sponsor(s):

NIST, DARPA, IEEE, NASA, in cooperation with IEEE Neural Network Council.


PerMIS 2000 Agenda (pdf)

Plenary Addresses

Technical Contact:

Executive Chair
John Evans, NIST

General Chair
Elena Messina, NIST

Program Chair
Alex Meystel, NIST, Drexel University

Advisory Board
G. Adorni, University of Parma, Italy
J. Albus, NIST, USA
P. Antsaklis, University of Notre Dame, USA
M. Asada, Osaka University, Japan
G. A. Bekey, University of Southern California, USA
K. Bellman, Aerospace Integration Science Corp.,USA
J. G. Blitch, DARPA, USA
H.-H. Bothe, Technical University of Denmark, Denmark
B. Chandrasekaran, Ohio State University, USA
J. Cherniavsky, NSF, USA
M. Cotsaftis, LTME/ECE, France
F. Darema, NSF, USA
P. Dario, Scuola Superiore, Italy
P. Davis, RAND Graduate School, USA
G. Doeben-Henish, Knowbotic Systems, Germany
J. Fetzer, University of Minnesota, USA
D. Filev, Ford, USA
R. Finkelstein, Robotic Technology, Inc., USA
D. Fogel, Natural Selection, Inc., USA
N. Foo, University of New South Wales, Australia
W. Freeman, University of California at Berkeley, USA
E. Fromm, Drexel University, USA
T. Fukuda, University of Nagoya, Japan
R. Garner, Loebner Prize Winner for 1998 and 1999, USA
G. Gerhart, US Army TACOM, USA
E. Grant, CRIM, North Carolina State University, USA
S. Grossberg, Boston University, USA
R. Gudwin, State Univerity of Campinas, Brazil
W. Hamel, University of Tennessee, USA
W. Hargrove, Oak Ridge National Laboratory, USA
E. Horvitz, Microsoft Research, USA
M. Jabri, University of Sydney, Australia
D. Jaron, Drexel University, USA
R. Jordan, Lockheed Martin, USA
C. Joslyn, Los Alamos National Laboratory, USA
S. Kak, Louisiana State University, USA
H. Kitano, Sony Computer Science Labs, Japan
K. Kreutz-Delgado, University of California at San Diego
F. Kurfess, Concordia University, Canada
J. E. Laird, University of Michigan, USA
C. Landauer, Aerospace Integration Science Corp.,USA
S. Lee, Samsung Advanced Inst. of Technology, Korea
C.S. George Lee, Purdue University, USA
D. Lenat, Cycorp, USA
P. B. Luh, University of Connecticut, USA
B. Mirkin, Birkbeck College, GB
R. Morris, NIST, USA
T. Parisini, Politecnico di Milano, Italy
K. Passino, Ohio State University , USA
L. Perlovsky, Innoverity Inc., USA
L. Pouchard, Oak Ridge National Lab, USA
J. Pustejovsky, Brandeis University, USA
L. Reeker, NIST. USA
D. Repperger, AFRL/HECP, USA
E. H. Ruspini, SRI International, USA
T. Samad, Honeywell, USA
A. Sanderson, NSF, USA
R. Sanz, University of Madrid, Spain
A. Schultz, Naval Research Laboratory, USA
T. Shih, Tamkang University, Taiwan
R. Simmons, Carnegie-Mellon, USA
M. Swinson, DARPA, USA
M. Tilden, Los Alamos National Lab., USA
J. Tsotsos, York University, Canada
I. B. Turksen, University of Toronto, Canada
C. Weisbin, NASA, USA
T. Whalen, Georgia State University, USA
A. Wild, Motorola, USA
V. Winter, SANDIA, USA
J. Xiao, NSF, USA
R. Yager, Iona College, USA
A. Yavnai, RAFAEL, Israel
Y. Ye, IBM T. J. Watson Research Center, USA
B. Zeigler, University of Arizona, USA
L. Zadeh, University of California at Berkeley, USA