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2nd Atlas/NIST Workshop on Photovoltaic  Materials Durability

Purpose:

Solar panelsThis conference is focused on measurement science for assessing the durability and service lives of polymers used in photovoltaic applications and will feature technical presentations from industry experts, a poster session, standards discussion, and NIST facility tour. This event will allow participants to hear from and interact with experts representing material suppliers, module manufacturers, testing and certification companies, as well as universities and national laboratories. Attendees will also have an opportunity to engage in open discussions on and contribute recommendations to a road map for incorporating advanced research into consensus standards development efforts.

Who should attend:

  • PV panel producers faced with product longevity issues
  • R&D staff interested in new materials and systems for PV
  • Technical standards participants engaged in transitioning R&D into PV standards
  • Reliability and QA personnel tasked with maximizing longevity and durability of their products (suppliers and module manufacturers)
  • Financial managers and industry executives interested in warranty considerations and return on investment calculations in their business models
  • Anyone interested in understanding long-term performance issues in the PV market

Poster Session:  

A poster session will be held on Thursday morning, Nov. 14. Posters describing advances in lifetime test methods and characterization of PV material performance and durability are welcome. All poster submissions will be reviewed for technical quality and should be free of commercials.  If you are interested in presenting a poster, please send a title and short abstract to Joannie Chin at joannie.chin@nist.gov by Oct. 15, 2013.

Details:

Start Date: Wednesday, November 13, 2013
End Date: Thursday, November 14, 2013
Location: NIST Campus,  Gaithersburg, MD
Format: Workshop

Registration:

Registration Fee: $200 per person, includes continental breakfast, morning and afternoon coffee breaks, and buffet lunch. Registration will be limited due to space constraints.

Online Registration


Directions to NIST and information on local hotels


Agenda, includes links to the presentations


Organizing Committee

David Burns, 3M, dmburns@mmm.com
Joannie Chin, NIST, joannie.chin@nist.gov
Xiaohong Gu, NIST,  xiaohong.gu@nist.gov (co-chair)
Kurt Scott, Atlas, kurt.scott@ametek.com (co-chair)
John Wohlgemuth, NREL, John.Wohlgemuth@nrel.gov

Technical Contact:

Joannie Chin

Phone: 301-975-6815
Email: joannie.chin@nist.gov