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Device Design and Characterization Information at NIST

(the links below are a compilation of programs and projects, news/events, and other pages tagged with this term)

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2000_presentations (10/07/2011)

2003_presentations (12/15/2011)

2005_presentations (10/07/2011)

2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (04/23/2013)

2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2009 Presentations (10/23/2012)

2010 NIST Mobile Microrobotics Challenge (10/03/2011)

2011 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2011 Presentations (10/07/2011)

CMOS Device and Reliability (04/11/2013)

FCMN, 2007 Presentations (10/07/2011)

FCMN, Publications and Talks (04/01/2013)

Frontiers of Characterization and Metrology for Nanoelectronics, Past Conferences (03/14/2013)

Liposome-Hydrogel Hybrids: No Toil, No Trouble for Stronger Bubbles (11/02/2012)

Nanoelectronic Device Metrology (04/09/2013)

Nanoscale and Quantum Metrology (05/30/2012)

Nanoscale Stress Measurements and Standards (03/15/2013)

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