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Semiconductors Characterization Information at NIST
(the links below are a compilation of programs and projects, news/events, and other pages tagged with this term)
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2009 Presentations (05/28/2009)
2010 NIST Mobile Microrobotics Challenge (05/03/2010)
2011 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, 2011 Presentations (05/25/2011)
Analytical Transmission Scanning Electron Microscopy (01/02/2015)
CMOS and Novel Devices Group (02/11/2014)
CMOS Device and Reliability (06/12/2015)
FCMN, 2007 Presentations (05/03/2011)
FCMN, Publications and Talks (04/23/2015)
Nanocalorimetry Measurements (10/30/2008)
Not So Fast: Overlooked Resistance May Inflate Estimates of Organic-Semiconductor Performance (03/10/2016)
Novel Sources for Focused-ion Beams (02/23/2015)
Novel Sources for Focused-ion Beams Laboratory (02/11/2010)