NIST logo
NIST Home > Characterization, Nanometrology, and Nanoscale Measurements Programs and Projects 
 

Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 61 - 66 of 66)
3D Elemental Mapping of Cells using Electron and Ion Beams
Last Updated Date: 10/02/2012

Although it is the most commonly used technique for the chemical analysis of cells, mass spectrometry of cell lysate can only provide bulk … more

Metrology of High Current Density Electron Field Emitters
Last Updated Date: 07/10/2012

Electron sources are ubiquitous in vacuum based electronics and are used for a variety of purposes.  These applications range from x-ray production … more

Infrared Imaging Beyond the Diffraction Limit
Last Updated Date: 07/09/2012

There are a variety of tools for characterizing nanoscale morphology and structure, such as scanning probe, scanning electron, and transmission … more

Fluctuations and Nanoscale Control
Last Updated Date: 03/29/2012

The behavior and properties of macroscale objects are stable and predictable because they are the result of the average behavior of very large … more

Modeling and Simulation of Nanofabrication
Last Updated Date: 03/09/2012

Most manufacturing has historically been based on top-down fabrication and assembly.  With rapid advances in nanotechnology, there is increasing … more

Designing Advanced Scanning Probe Microscopy Instruments
Last Updated Date: 09/22/2011

A scanning probe microscope (SPM) in its simplest form uses a fine probe tip in proximity to a sample surface to measure a particular physical … more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070