Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo
NIST Home > Characterization, Nanometrology, and Nanoscale Measurements Programs and Projects 
 

Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 61 - 66 of 66)
Atomic Scale Imaging of Nanoscale Structures with Elemental Sensitivity in the NIST Titan 80-300
Last Updated Date: 10/02/2012

The characterization of CdSe/ZnS quantum dot structures has been carried out with compositionally sensitive imaging techniques utilizing the … more

Analysis of Copper Incorporation Into Zinc Oxide Nanowires
Last Updated Date: 10/02/2012

ZnO nanowires (NWs) are grown on bulk copper by chemical vapor deposition. Photoluminescence (PL) microscopy revealed band gap emission at 380 nm … more

Analysis of 3D Elemental Mapping Artifacts in Biological Specimens using Monte Carlo Simulation
Last Updated Date: 10/02/2012

We performed Monte Carlo simulation to demonstrate the feasibility of using the focused ion beam based X-ray microanalysis technique (FIB-EDS) for … more

3D Elemental Mapping of Cells using Electron and Ion Beams
Last Updated Date: 10/02/2012

Although it is the most commonly used technique for the chemical analysis of cells, mass spectrometry of cell lysate can only provide bulk … more

Metrology of High Current Density Electron Field Emitters
Last Updated Date: 07/10/2012

Electron sources are ubiquitous in vacuum based electronics and are used for a variety of purposes.  These applications range from x-ray production … more

Infrared Imaging Beyond the Diffraction Limit
Last Updated Date: 07/09/2012

There are a variety of tools for characterizing nanoscale morphology and structure, such as scanning probe, scanning electron, and transmission … more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070