Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects | |
|
In Situ Characterization of Nanoscale Gas-Solid Interactions by TEM
Last Updated Date: 10/11/2011 Observing and measuring the dynamic changes that take place at the nanometer scale during the synthesis and use of carbon nanotubes (CNTs), … more
Quantum Conductance Project/Graphene-Based Quantum Metrology
Last Updated Date: 10/03/2011 The goal of the Quantum Conductance Project is to develop graphene metrology for intrinsic electrical standards, specifically … more
Designing Advanced Scanning Probe Microscopy Instruments
Last Updated Date: 09/22/2011 A scanning probe microscope (SPM) in its simplest form uses a fine probe tip in proximity to a sample surface to measure a particular physical … more
Electronic Transport in Nanoscale Organic/Inorganic Devices
Last Updated Date: 07/25/2011 Organic materials (multi-carbon compounds) are amenable to almost Lego©-like tinkering with their structure and composition, and can exhibit … more
Advanced High Frequency Devices
Last Updated Date: 10/05/2010 The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at … more
Super-resolution Optical Microscopy
Last Updated Date: 10/05/2010 As the electronics and data storage industries build devices on ever decreasing scales, they need advanced imaging techniques that allow them to … more
Three-Dimensional Plasmonic Metamaterials
Last Updated Date: 10/05/2010 Metamaterials are tailor-made photonic composites--combinations of materials designed to achieve optical properties not seen in nature. The … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |