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Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

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Small Force Metrology
Last Updated Date: 05/30/2012

The Small Force Metrology project supports U.S. instrumentation vendors, academic researchers, government scientists, and a broad spectrum of … more

Mechanical Metrology Program
Last Updated Date: 05/30/2012

Providing critical measurements of mass, force, vibration, and acoustics for a broad range of industries and aspects of everyday life. Such … more

Fluctuations and Nanoscale Control
Last Updated Date: 03/29/2012

The behavior and properties of macroscale objects are stable and predictable because they are the result of the average behavior of very large … more

Modeling and Simulation of Nanofabrication
Last Updated Date: 03/09/2012

Most manufacturing has historically been based on top-down fabrication and assembly.  With rapid advances in nanotechnology, there is increasing … more

Quantum Conductance Project/Graphene-Based Quantum Metrology
Last Updated Date: 10/03/2011

The goal of the Quantum Conductance Project is to develop graphene metrology for intrinsic electrical standards, specifically … more

Designing Advanced Scanning Probe Microscopy Instruments
Last Updated Date: 09/22/2011

A scanning probe microscope (SPM) in its simplest form uses a fine probe tip in proximity to a sample surface to measure a particular physical … more

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