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Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 61 - 65 of 65)
Analysis of 3D Elemental Mapping Artifacts in Biological Specimens using Monte Carlo Simulation
Last Updated Date: 10/02/2012

We performed Monte Carlo simulation to demonstrate the feasibility of using the focused ion beam based X-ray microanalysis technique (FIB-EDS) for … more

3D Elemental Mapping of Cells using Electron and Ion Beams
Last Updated Date: 10/02/2012

Although it is the most commonly used technique for the chemical analysis of cells, mass spectrometry of cell lysate can only provide bulk … more

Metrology of High Current Density Electron Field Emitters
Last Updated Date: 07/10/2012

Electron sources are ubiquitous in vacuum based electronics and are used for a variety of purposes.  These applications range from x-ray production … more

Infrared Imaging Beyond the Diffraction Limit
Last Updated Date: 07/09/2012

There are a variety of tools for characterizing nanoscale morphology and structure, such as scanning probe, scanning electron, and transmission … more

Designing Advanced Scanning Probe Microscopy Instruments
Last Updated Date: 09/22/2011

A scanning probe microscope (SPM) in its simplest form uses a fine probe tip in proximity to a sample surface to measure a particular physical … more

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