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Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 16 - 30 of 66)
Advanced High Frequency Devices
Last Updated Date: 12/05/2014

The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at … more

Magnetodynamics and Spin Electronics
Last Updated Date: 12/02/2014

The Magnetics Group's program in magnetodynamics and spin electronics develops new measurement techniques to characterize the high frequency … more

Thin Film and Interconnect Reliability
Last Updated Date: 12/01/2014

This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such … more

AFM-Based Nanomechanics
Last Updated Date: 12/01/2014

Local mechanical-property information is essential to evaluate emerging micro- and nanoscale materials, which many manufacturers would like to … more

Tracking Nanoparticles as Optical Indicators of Device Dynamics
Last Updated Date: 10/21/2014

Nanofabricated and microfabricated devices, ranging from nanomotors propelled by ultrasound to microelectromechanical systems (MEMS), can move in … more

Measuring Topological Insulator Surface State Properties
Last Updated Date: 10/03/2014

The transmission of information in today’s electronics requires the movement of electrical charge, which expends energy and generates heat, … more

Atom Manipulation with the Scanning Tunneling Microscope
Last Updated Date: 10/03/2014

At the heart of nanotechnology is the need to create nanostructures, which are material structures whose dimensions are in the nanometer scale. … more

Dimensional Metrology for Nanofabrication
Last Updated Date: 10/03/2014

Our goal is to develop measurements that quantify the shape, size, orientation, and fidelity of nanoscale patterns as a platform to quantitatively … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 10/01/2014

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Nanoelectronic Device Metrology
Last Updated Date: 09/30/2014

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

Atom-Based Dimensional Metrology
Last Updated Date: 09/30/2014

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Forensic Topography and Surface Metrology
Last Updated Date: 09/30/2014

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 09/23/2014

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Probing Graphene Electronic Devices with Atomic Scale Measurements
Last Updated Date: 06/17/2014

The interest in using graphene as an electronic material arises in large part from the high speed with which electrons move through the material — … more

Magnetic Nanoparticle Metrology
Last Updated Date: 04/17/2014

We are developing best practice metrology for characterization of magnetic nanoparticle systems (e.g. blocking temperature, anisotropy, property … more

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