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Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 16 - 30 of 64)
Superresolving Optical Microscopy
Last Updated Date: 01/23/2015

Light microscopy is a widely used analytical tool because it provides non-destructive, real-time, three-dimensional imaging with chemical and … more

Surface Potential Imaging of Solution Processable Acene-Based Thin Film Transistors
Last Updated Date: 01/22/2015

Scanning Kelvin probe microscopy (SKPM) of functioning solution processed thin film transistors is used to correlate film microstructure with … more

Synchrotron Beamline Operations
Last Updated Date: 01/22/2015

Our objective is to ensure that the NIST beamlines U7A, X23A2, and X24A, located at the National Synchrotron Light Source (NSLS) at Brookhaven … more

Nanoparticle Measurements and Standards for Biomedical Applications and Health
Last Updated Date: 01/22/2015

Our goal is to develop certified reference materials, standard test methods, measurements, and critical data for the physicochemical … more

Synchrotron X-ray Measurements
Last Updated Date: 01/22/2015

Our objective is to provide comprehensive descriptions of the structure of advanced materials and devices by performing synchrotron-based … more

Measurement and Prediction of Local Structure
Last Updated Date: 01/22/2015

Our goal is to provide analytical tools that allow measurement and prediction of local structure to enable the development of ceramic materials … more

Synchrotron X-ray Measurement Method Development
Last Updated Date: 01/22/2015

Our goal is to develop state of-the-art synchrotron X-ray measurement technology, including instrumentation, methods, and analytical tools, to … more

Diffraction Metrology and Standards
Last Updated Date: 01/22/2015

Our objective is the development of Standard Reference Materials (SRMs) and quantitative, reproducible, and accurate measurement methods for … more

Nanoscale Strength Measurements and Standards
Last Updated Date: 01/22/2015

To develop new mechanical test structures and methodologies based on microelectromechanical and nanoelectromechanical systems (MEMS and NEMS) … more

Nanoscale Stress Measurements and Standards
Last Updated Date: 01/22/2015

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Scanning Probe Microscopy Measurements and Standards
Last Updated Date: 01/22/2015

Our goal is to develop standard reference materials and quantitative, reproducible, measurement methods and protocols for scanning probe … more

Strain Mapping and Simulation
Last Updated Date: 01/05/2015

We employ combined measurement and modeling to enhance understanding and capability of nanoscale strain-mapping via super-resolution confocal … more

Analytical Transmission Scanning Electron Microscopy
Last Updated Date: 01/02/2015

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Quantum Voltage System Development and Dissemination
Last Updated Date: 12/11/2014

This project is developing new standards using Josephson junctions, superconductor-based devices whose quantum behavior makes them perfect … more

Tracking Nanoparticles as Optical Indicators of Device Dynamics
Last Updated Date: 10/21/2014

Nanofabricated and microfabricated devices, ranging from nanomotors propelled by ultrasound to microelectromechanical systems (MEMS), can move in … more

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