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Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 16 - 30 of 66)
Synchrotron X-ray Measurement Method Development
Last Updated Date: 01/22/2015

Our goal is to develop state of-the-art synchrotron X-ray measurement technology, including instrumentation, methods, and analytical tools, to … more

Diffraction Metrology and Standards
Last Updated Date: 01/22/2015

Our objective is the development of Standard Reference Materials (SRMs) and quantitative, reproducible, and accurate measurement methods for … more

Nanoscale Strength Measurements and Standards
Last Updated Date: 01/22/2015

To develop new mechanical test structures and methodologies based on microelectromechanical and nanoelectromechanical systems (MEMS and NEMS) … more

Nanoscale Stress Measurements and Standards
Last Updated Date: 01/22/2015

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Scanning Probe Microscopy Measurements and Standards
Last Updated Date: 01/22/2015

Our goal is to develop standard reference materials and quantitative, reproducible, measurement methods and protocols for scanning probe … more

Quantum Conductance Project/Graphene-Based Quantum Metrology
Last Updated Date: 01/14/2015

The goal of the Quantum Conductance Project is to develop graphene metrology for intrinsic electrical standards, specifically … more

Strain Mapping and Simulation
Last Updated Date: 01/05/2015

We employ combined measurement and modeling to enhance understanding and capability of nanoscale strain-mapping via super-resolution confocal … more

Analytical Transmission Scanning Electron Microscopy
Last Updated Date: 01/02/2015

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

Quantum Voltage System Development and Dissemination
Last Updated Date: 12/11/2014

This project is developing new standards using Josephson junctions, superconductor-based devices whose quantum behavior makes them perfect … more

Advanced High Frequency Devices
Last Updated Date: 12/05/2014

The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at … more

Tracking Nanoparticles as Optical Indicators of Device Dynamics
Last Updated Date: 10/21/2014

Nanofabricated and microfabricated devices, ranging from nanomotors propelled by ultrasound to microelectromechanical systems (MEMS), can move in … more

Measuring Topological Insulator Surface State Properties
Last Updated Date: 10/03/2014

The transmission of information in today’s electronics requires the movement of electrical charge, which expends energy and generates heat, … more

Atom Manipulation with the Scanning Tunneling Microscope
Last Updated Date: 10/03/2014

At the heart of nanotechnology is the need to create nanostructures, which are material structures whose dimensions are in the nanometer scale. … more

Dimensional Metrology for Nanofabrication
Last Updated Date: 10/03/2014

Our goal is to develop measurements that quantify the shape, size, orientation, and fidelity of nanoscale patterns as a platform to quantitatively … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 10/01/2014

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

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