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Characterization, Nanometrology, and Nanoscale Measurements Programs & Projects

(showing 1 - 15 of 66)
Quantum Voltage System Development and Dissemination
Last Updated Date: 12/11/2014

This project is developing new standards using Josephson junctions, superconductor-based devices whose quantum behavior makes them perfect … more

Advanced High Frequency Devices
Last Updated Date: 12/05/2014

The Advanced High Frequency Devices Program develops measurement methods to determine the characteristics of advanced electronics and devices at … more

Magnetodynamics and Spin Electronics
Last Updated Date: 12/02/2014

The Magnetics Group's program in magnetodynamics and spin electronics develops new measurement techniques to characterize the high frequency … more

Synchrotron X-ray Measurement Method Development
Last Updated Date: 12/01/2014

Our goal is to develop state of-the-art synchrotron X-ray measurement technology, including instrumentation, methods, and analytical tools, to … more

Synchrotron X-ray Measurements
Last Updated Date: 12/01/2014

Our objective is to provide comprehensive descriptions of the structure of advanced materials and devices by performing synchrotron-based … more

Synchrotron Beamline Operations
Last Updated Date: 12/01/2014

Our objective is to ensure that the NIST beamlines U7A, X23A2, and X24A, located at the National Synchrotron Light Source (NSLS) at Brookhaven … more

Diffraction Metrology and Standards
Last Updated Date: 12/01/2014

Our objective is the development of Standard Reference Materials (SRMs) and quantitative, reproducible, and accurate measurement methods for … more

Measurement and Prediction of Local Structure
Last Updated Date: 12/01/2014

Our goal is to provide analytical tools that allow measurement and prediction of local structure to enable the development of ceramic materials … more

Scanning Probe Microscopy Measurements and Standards
Last Updated Date: 12/01/2014

Our goal is to develop standard reference materials and quantitative, reproducible, measurement methods and protocols for scanning probe … more

Nanoscale Stress Measurements and Standards
Last Updated Date: 12/01/2014

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Nanoparticle Measurements and Standards for Biomedical Applications and Health
Last Updated Date: 12/01/2014

Our goal is to develop certified reference materials, standard test methods, measurements, and critical data for the physicochemical … more

Thin Film and Interconnect Reliability
Last Updated Date: 12/01/2014

This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such … more

AFM-Based Nanomechanics
Last Updated Date: 12/01/2014

Local mechanical-property information is essential to evaluate emerging micro- and nanoscale materials, which many manufacturers would like to … more

Nanoscale Strength Measurements and Standards
Last Updated Date: 12/01/2014

To develop new mechanical test structures and methodologies based on microelectromechanical and nanoelectromechanical systems (MEMS and NEMS) … more

Tracking Nanoparticles as Optical Indicators of Device Dynamics
Last Updated Date: 10/21/2014

Nanofabricated and microfabricated devices, ranging from nanomotors propelled by ultrasound to microelectromechanical systems (MEMS), can move in … more

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