Characterization, Nanometrology, and Nanoscale Measurements News | |
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NIST Center for Nanoscale Science and Technology Featured on National Public Radio Affiliate WAMU
Release Date: 04/03/2013 The NIST Center for Nanoscale Science and Technology (CNST) was featured on the Friday, March 22 edition of Metro Connection , a weekly radio … more
Nanoscale Edge Variations Observed with Record-breaking Resolution in Magnetic Nanodevices
Release Date: 03/27/2013 Ferromagnetic resonance force microscopy image of the precession of an edge mode in a 500 nm diameter permalloy disk. The disk appears … more
NIST Captures Chemical Composition with Nanoscale Resolution
Release Date: 02/12/2013 Researchers at the National Institute of Standards and Technology (NIST) and the University of Maryland have demonstrated that a new spectroscopy … more
New Platform Developed to Measure and Exploit Optomechanical Interactions
Release Date: 12/12/2012 A pair of nanobeams is held side-by-side and separated by a nanoscale gap, with more
Key Property of Graphene Sustained Over Wide Ranges of Density and Energy
Release Date: 11/14/2012 A collaboration led by researchers from the NIST Center for Nanoscale Science and Technology has shown for the first time that charge … more
Researchers Observe, Control, and Optimize the Growth of Individual Carbon Nanotubes
Release Date: 10/31/2012
Researchers Develop Versatile Optomechanical Sensors for Atomic Force Microscopy
Release Date: 10/24/2012 < more
Slip Sliding Our Way: At the Nanoscale, Graphite Can Turn Friction Upside Down
Release Date: 10/16/2012 If you ease up on a pencil, does it slide more easily? Sure. But maybe not if the tip is sharpened down to nanoscale dimensions. A team of … more
Researchers Determine Critical Factors for Improving Performance of a Solar Fuel Catalyst
Release Date: 10/03/2012 False-color scanning electron micrographs of cross-sectioned hematite films grown by sputter deposition and then annealed at two different … more
A Fast and Sensitive Nanophotonic Motion Sensor Developed for Silicon Microdevices
Release Date: 09/19/2012 False-color scanning electron micrograph of a nanophotonic motion sensor. Vertical motion of the silicon nitride ring (pink) changes an evanescent … more
Researchers Introduce New Method for Imaging Defects in Magnetic Nanodevices
Release Date: 09/12/2012 Top: Scanning electron micrograph of an array of magnetic nanodisks with a oval-shaped “defect” structure at center. … more
NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
Release Date: 09/05/2012 A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer … more
Researchers Determine the Optimum Path for Tracking Fluorescent Nanoparticles Using a Laser
Release Date: 08/29/2012 NIST Center for Nanoscale Science and Technology researchers Gregg Gallatin and Andrew Berglund (now at Quantifind in Palo Alto, CA) … more
CNST Releases the Summer 2012 Edition of The CNST News
Release Date: 08/08/2012 The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the summer 2012 edition of The CNST News. This … more
Researchers Track Nanoparticle Dynamics in Three Dimensions
Release Date: 08/01/2012 Researchers from the NIST Center for Nanoscale Science and Technology have used three-dimensional single-particle tracking to measure the dynamic … more |
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