Characterization, Nanometrology, and Nanoscale Measurements Events | |
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(showing 1 - 5 of 5)
Frontiers of In Situ Transmission Electron Microscopy
Start Date: 04/11/2013 The significance and versatility of in situ transmission electron micros more
Frontiers of Characterization and Metrology for Nanoelectronics
Start Date: 03/25/2013 The 2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly titled Characterization and … more
Mid-Atlantic Microbeam Analysis Society 2012 Symposium
Start Date: 09/14/2012 A one-half day symposium on the advances to the field in the last 20 years that would have been of great interest to our colleague and friend … more
Cathodoluminescence Workshop 2011
Start Date: 10/24/2011 CL 2011 will bring together international expertise in the application of CL techniques to a wide variety of materials. CL techniques enable … more
Nanomechanical Measurements Workshop
Start Date: 06/16/2009 This workshop will provide a forum for nanomechanical tool manufacturers, users, and NIST researchers to identify nanomechanical calibration and … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |