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Characterization, Nanometrology, and Nanoscale Measurements Events
Frontiers of Characterization and Metrology for Nanoelectronics
Start Date: 03/21/2017
The 2017 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) will be held at the Monterey Marriott … more
Structure and Dynamics from Random Observations
Start Date: 03/20/2014
Physicists are control freaks. At weddings, the bridal photo is taken under bright lights, with the happy couple holding still. Traditionally in … more
Frontiers of In Situ Transmission Electron Microscopy
Start Date: 04/11/2013
The significance and versatility of in situ transmission electron microscopy (TEM) has increased dramatically during the last 10 to 15 years. In … more