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Atomic Force Microscopy (AFM) Information at NIST

(the links below are a compilation of programs and projects, news/events, and other pages tagged with this term)

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NIST Captures Chemical Composition with Nanoscale Resolution (02/20/2013)

Not-So-Precious: Stripping Gold From AFM Probes Allows Better Measurement of Picoscale Forces (06/27/2012)

Optical Methods for 3-D Nanostructure Metrology (05/09/2013)

Optoelectrical Characterization of Nanostructured Photovoltaic Materials and Devices (07/10/2012)

Researchers Develop Versatile Optomechanical Sensors for Atomic Force Microscopy (10/31/2012)

Researchers Introduce New Method for Imaging Defects in Magnetic Nanodevices (09/12/2012)

Researchers Validate Simplified Lateral Force Calibration Technique for Atomic Force Microscopy (03/28/2012)

Scanning Probe Microscopy Measurements and Standards (03/15/2013)

Selected Publications on Dimensional Metrology - 20-Degree Celsius Paper (10/28/2011)

Selected Publications on Dimensional Metrology - Gage Blocks (10/28/2011)

Selected Publications on Dimensional Metrology - Measurement Assurance (10/28/2011)

Selected Publications on Dimensional Metrology - Other Calibrations (10/28/2011)

Selected Publications on Dimensional Metrology - Uncertainty and Statistics (10/28/2011)

Slip Sliding Our Way: At the Nanoscale, Graphite Can Turn Friction Upside Down (10/17/2012)

Staff Directory (04/25/2013)

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