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Semiconductors Portal

Programs and Projects
Advanced Magnetic and Quantum Materials

Quantum coherent materials have become important in magnetic sensors as well as information processing technology. For magnetic sensors, … more

Nanoscale Stress Measurements and Standards

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Semiconductor Metrology for Energy Conversion

Optical Materials Metrology 21st century optoelectronics emphasizes energy technologies, and modern security issues have heightened needs for … more

Nanostructure Fabrication and Metrology

Single photons are the fundamental particles for all optical measurements. Single photon detectors made from avalanche photodiodes or … more

Theory of the optical properties of materials

The overarching objective of this project is reliably calculating the bulk optical properties of materials, such as complex index of refraction, … more

Comparison and Uncertainty Evaluation of Methods for Asphere Metrology

The goal of this project is a rigorous uncertainty assessment of generic methods for measuring aspheres. The evaluated methods include zonal and … more

Instruments
Scanning Auger Microprobe

A JEOL model 7830F field emission source, scanning Auger microscope. more

Contact

General Information:
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inquiries@nist.gov

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