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Semiconductors Portal

Programs and Projects
Thin Film Electronics

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and … more

Metrology and Synthesis of 3D Nanostructures

Nanostructures are a critical component of innovations in electronics, energy conservation, renewable energy, biomedical research, and health … more

Acceleration, Vibration, and Acoustics

The Acceleration, Vibration, and Acoustics (AVA) Project advances the measurement science, develops standards, and provides calibration services … more

Nanoelectronic Device Metrology

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable innovation and advanced … more

CMOS Device and Reliability

  The CMOS Device and Reliability Project aims to develop new metrology tools for characterizing high-performance complementary … more

Micro- and Nanoelectromechanical Systems

Microelectromechanical systems (MEMS) are integrated devices with critical applications in sensing, timing, signal processing, and biomedical … more

Instruments
Scanning Auger Microprobe

A JEOL model 7830F field emission source, scanning Auger microscope. more

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Contact

General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070