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Semiconductors Portal

Programs and Projects
Theory of the optical properties of materials

The overarching objective of this project is reliably calculating the bulk optical properties of materials, such as complex index of refraction, … more

CMOS Device and Reliability

  The CMOS Device and Reliability Project aims to develop new metrology tools for characterizing high-performance complementary … more

Metrology and Synthesis of 3D Nanostructures

We synthesize semiconductor nanostructures to serve both as test structures for measurement techniques and as building blocks for novel metrology … more

Smart Grid Interoperability Testbed Facility

NIST is charged by the 2007 Energy Independence and Security Act (EISA) with facilitation of interoperability standards to enable successful … more

Power Conditioning Systems for Renewables, Storage, and Microgrids

This project develops the measurement science necessary to support the widespread use of advanced power electronics to provided new … more

Thin Film Electronics

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and … more

Instruments
Scanning Auger Microprobe

A JEOL model 7830F field emission source, scanning Auger microscope. more

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Contact

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inquiries@nist.gov

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