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Displaying records 981 to 990 of 1000 records.
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981. Toward Smart Manufacturing Using Decision Guidance Analytics
Topic: Manufacturing
Published: 11/1/2014
Authors: Alexander Brodsky, Mohan Krishnamoorthy, Daniel A Menasce , Guodong Shao, Sudarsan Rachuri
Abstract: This paper is focused on decision analytics for smart manufacturing. We consider temporal manufacturing processes with stochastic throughput and inventories. We demonstrate the use of the recently proposed concept of the decision guidance analytics l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917235

982. Toward Traceability for At Line AFM Dimensional Metrology
Topic: Manufacturing
Published: 1/1/2002
Authors: Ronald G Dixson, Angela Guerry, Marylyn H. Bennett, Theodore Vincent Vorburger, Michael T Postek
Abstract: The in-line and at-line measurement tools for critical dimension (CD) metrology in semiconductor manufacturing are technologically advanced instruments that exhibit excellent measurement repeatability--below 1 nm in some cases. Accuracy, however, is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823148

983. Toward Traceability for At-line AFM Dimensional Metrology
Topic: Manufacturing
Published: 7/1/2003
Authors: Marylyn H. Bennett, Angela Guerry, Ronald G Dixson, Michael T Postek, Theodore Vincent Vorburger
Abstract: The in-line and at-line measurement tools for critical dimension (CD) metrology in semiconductor manufacturing are technologically advanced instruments that exhibit excellent measurement repeatability - below one nanometer in some cases. Accuracy, ho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821740

984. Toward a Unified Advanced CD-SEM Specification for Sub 0.18 Micrometer Technology
Topic: Manufacturing
Published: 6/1/1998
Authors: J Allgair, C Archie, W Banke, H Bogardus, J Griffith, H Marchman, Michael T Postek, L Saraf, J Schlesinger, B Singh, N. Sullivan, L Trimble, Andras Vladar, A Yanof
Abstract: The stringent critical dimension (CD) control requirements in cutting edge device facilities have placed significant demands on metrologists and upon the tools they use. We are developing a unified, advanced critical dimension scanning electron micro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823089

985. Toward the Ideal of Automating Production Optimization
Topic: Manufacturing
Published: 11/15/2013
Authors: John L Michaloski, Frederick M Proctor, Jorge Arinez, Jonatan Berglund
Abstract: The advent of improved factory data collection offers a prime opportunity to continuously study and optimize factory operations. Although manufacturing optimization tools can be considered mainstream technology, most U.S. manufacturers do not take fu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914707

986. Towards Accurate Feature Shape Metrology
Topic: Manufacturing
Published: 3/22/2008
Authors: Ndubuisi George Orji, Ronald G Dixson, B Bunday, J Allgair
Abstract: Over the last few years, the need for shape metrology for process control has increased. A key component of shape metrology is sidewall angle (SWA). However, few instruments measure SWA directly. The critical dimension atomic force microscope (CD-AFM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824629

987. Towards Information Networks to Support Composable Manufacturing
Topic: Manufacturing
Published: 10/15/2008
Authors: Mahesh Mani, Albert W Jones, Jun H. Shin, Ram D Sriram
Abstract: Rigid, supply-chain organizational structures are giving way to highly dynamic collaborative partnerships. These partnerships will develop rapidly by composing global manufacturing resources in response to open market opportunities; and, they will di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824733

988. Towards Mobile Manipulator Safety Standards
Topic: Manufacturing
Published: 10/24/2013
Authors: Jeremy A Marvel, Roger V Bostelman
Abstract: We present an overview of the current safety standards for industrial robots and automated guided vehicles (AGVs), and describe how they relate to the safety concerns of mobile manipulators (robot arms mounted on mobile bases) in modern manufacturing ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913947

989. Towards Standards for Integrated Gaming and Simulation for Incident Management
Topic: Manufacturing
Published: 7/1/2007
Authors: Sanjay Jain, Charles R. McLean, Yung-Tsun Tina Lee
Abstract: Simulation and gaming can support decision making through all phases of incident management including prevention, preparedness, response, recovery and mitigation. A number of gaming and simulation tools have been developed for the purpose but they g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822330

990. Towards a Domain-Specific Framework for Predictive Analytics in Manufacturing
Topic: Manufacturing
Published: 10/3/2014
Authors: David Jacques Antoine Lechevalier, Anantha Narayanan Narayanan, Sudarsan Rachuri
Abstract: Data analytics is proving to be very useful for achieving productivity gains in manufacturing. Predictive analytics (using advanced machine learning) is particularly valuable in manufacturing, as it leads to production improvement with respect to the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916274



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