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Displaying records 981 to 990 of 1000 records.
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981. Space-Scale Analysis of Line Edge Roughness on 193 nm Lithography Test Structures
Topic: Manufacturing
Published: 10/1/2003
Authors: Ndubuisi George Orji, Jayaraman Raja, Theodore Vincent Vorburger, Xiaohong Gu
Abstract: Line edge roughness (LER) is a potential showstopper for the semiconductor industry. As the width of patterned line structures decreases, LER is becoming a non-negligible contributor to resist critical dimension (CD) variation. The International Te ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823166

982. Special Issue on Collaborative Engineering
Topic: Manufacturing
Published: 6/1/2006
Authors: Ram D Sriram, Simon Szykman, D Durham
Abstract: Design of complex engineering systems is increasingly becoming a collaborative task among designers or design teams that are physically, geographically, and temporally distributed. The complexity of modern products means that a single designer or des ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822614

983. Stability Analysis of Interrupted Cutting With Finite Time in the Cut
Topic: Manufacturing
Published: 1/1/2001
Authors: P V Bayly, J E Halley, Matthew A. Davies, Jon Robert Pratt
Abstract: The stability of interrupted cutting is examined for the case in which the tool is in contact with the work piece for a small, but finite, fraction of the tooth-passing period. A model of a single degree-of-freedom tool excited by intermittent, rege ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821864

984. Standard Deviation or Standard Deviation of the Mean - How to Report Statistical Variation in Surface Calibrations?
Topic: Manufacturing
Published: 10/1/2004
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Both the standard deviation and the standard deviation of the mean might be used for reporting the statistical variation in the surface calibration reports. In practice, however, if the calibration laboratories or standard agencies could not provide ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822235

985. Standard Grade Rockwell Diamond Indenters - A Key to a Worldwide Unified Rockwell Hardness Scale
Topic: Manufacturing
Published: 1/1/1996
Authors: Jun-Feng Song, Samuel Rea Low III, David J Pitchure, Theodore Vincent Vorburger
Abstract: Since the 1980's, the European Community (EC) has established a unified Rockwell C hardness (HRC) scale by averaging several national scales, which come from each country''s national hardness machines and diamond indenters. These indenter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820820

986. Standard Grade Rockwell Diamond Indenters - A Key to a Worldwide Unified Rockwell Hardness Scale (in Japanese)
Topic: Manufacturing
Published: 1/1/1996
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Since the 1980''s, the European Community (EC) has established a unified Rockwell C hardness (HRC) scale by averaging several national scales, which come from each country''s national hardness machines and diamond indenters. These ind ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820997

987. Standard Test Procedures and Metrics Development for Automated Guided Vehicle Safety Standards
Topic: Manufacturing
Published: 5/23/2012
Authors: Roger V Bostelman, William P Shackleford, Geraldine S Cheok, Richard J Norcross
Abstract: The National Institute of Standards and Technology's Intelligent Systems Division has been researching automated guided vehicle (AGV) control based on advanced two-dimensional (2D) imaging sensors that detect dynamic, standard test pieces represent ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910774

988. Standardized Data Exchange of CAD Models with Design Intent
Topic: Manufacturing
Published: 9/1/2007
Authors: Junhwan Kim, Mike Pratt, Raj G Iyer, Ram D Sriram
Abstract: Modern CAD systems generate feature-based product shape models with parameterization and constraints. Until recently, standards for CAD data exchange among different CAD systems were restricted to the exchange of pure shape information. These standa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822750

989. Standardized Performance Testing Metrics for Optical Coordinate Measurement Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7883
Topic: Manufacturing
Published: 5/9/2013
Author: Steven David Phillips
Abstract: Optical probing technology on coordinate measuring machines (CMMs) operates significantly differently from discrete point probing associated with tactile probing CMMs hence manufacturers of this technology seek to use different testing artifacts for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912341

990. Standards for Bullets and Casings
Topic: Manufacturing
Published: 11/1/2002
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert A. Clary, Eric Paul Whitenton, Li Ma, Susan M Ballou
Abstract: The National Institute of Standards and Technology is developing reference standards through its Office of Law Enforcement Standards with funding provided by the National Institute of Justice. The standard reference materials are used by crime labora ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822418



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