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Topic Area: Manufacturing
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Displaying records 981 to 990 of 1000 records.
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981. Science based Information Metrology for Engineering Informatics
Topic: Manufacturing
Published: 9/1/2007
Author: Rachuri Rachuri
Abstract: Engineering informatics is the discipline of creating, codifying (structure and behavior that is syntax and semantics), exchanging (interactions and sharing), processing (decision making), storing and retrieving (archive and access) the digital objec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822745

982. Selecting Valid Correlation Areas for Automated Bullet Identification Systems Based on Striation Detection
Topic: Manufacturing
Published: 5/1/2011
Authors: Wei Chu, Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Richard M Silver
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905104

983. Self-Calibration and Error Compensation Using Reference Position Markers
Topic: Manufacturing
Published: 1/1/1999
Author: H Zou
Abstract: In this paper, reference position markers are proposed for self-calibration and error compensation. Self-calibration of x-y motion guides is discussed with a focus on the orthogonality calibration. An algorithm is developed using a closure method and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820956

984. Self-Calibration: Reversal, Redundancy, Error Separation, and "Absolute Testing"
Topic: Manufacturing
Published: 1/1/1996
Authors: Christopher J. Evans, R Hocken, William Tyler Estler
Abstract: Over the years many techniques have been developed for accurate measurement of part features without reference to an externally calibrated artifact. This paper presents a partial survey of such methods for dimensional metrology, their ranges of appli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820791

985. Self-Similarity Simplification Approaches for the Modeling and Analysis of Rockwell Hardness Indentation
Series: Journal of Research (NIST JRES)
Topic: Manufacturing
Published: 9/1/2003
Authors: Li Ma, J Zhou, A Lau, Samuel Rea Low III, R Dewit
Abstract: The indentation process of pressing a rockwell diamond indenter into inelastic material has been studied to provide a means for the analysis, simulation and prediction of Rockwell hardness tests. The geometrical characteristics of the spheroconical-s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822532

986. Semantic B2B-integration Using an Ontological Message Metamodel
Topic: Manufacturing
Published: 9/1/2010
Authors: Marko Vujasinovic, Nenad Ivezic, Edward J Barkmeyer, Zoran Marjanovic
Abstract: E-Business applications are often required to use different, incompatible, message sets to implement message interfaces for a business-to-business (B2B) communication. This makes communication with every new partner a new interoperability problem. In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906036

987. Semantic-Mediation for Standards-based B2B Interoperability
Topic: Manufacturing
Published: 6/15/2009
Authors: Marko Vujasinovic, Nenad Ivezic, Boonserm Kulvatunyou, Edward J Barkmeyer, Michele Missikoff, Francesco Taglino, Zoran Marjanovic, Igor Miletic
Abstract: The authors discuss a semantic-mediation architecture to advance traditional approaches for standards-based business-to-business (B2B) interoperability. The architecture is supported by the ATHENA Knowledge Representation and Semantics Mediation tool ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902693

988. Semiconductor Manufacturing Equipment Data Acquisition Simulation for Timing Performance Analysis
Topic: Manufacturing
Published: 9/22/2008
Authors: James Moyne, YaShian Li-Baboud, Xiao Zhu, Dhananjay Anand, Sulaiman Hussain
Abstract: The ability to acquire quality equipment and process data is pertinent for future real-time process control systems to maximize opportunities for semiconductor manufacturing yield enhancement and equipment efficiency. Clock synchronization for accur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33160

989. Sensors and Process Control in Gas Atomization
Topic: Manufacturing
Published: 1/1/1991
Authors: S Ridder, Steve Osella, P Espina, F Biancaniello
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821487

990. Separation and Metrology of Nanoparticles by Nanofluidic Size Exclusion
Topic: Manufacturing
Published: 8/11/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
Abstract: A nanofluidic approach to the separation and metrology of nanoparticles is demonstrated. Advantages of this approach include nanometer-scale resolution, nanometer-scale to submicrometer-scale range, mitigation of hydrodynamic and diffusional limitat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904215



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