Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Manufacturing Sorted by: title

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 961 to 970 of 1000 records.
Resort by: Date / Title


961. Telepresence: A New Paradigm for Solving Contamination Problems
Topic: Manufacturing
Published: 1/1/1999
Authors: Michael T Postek, Marylyn H. Bennett, N J Zaluzec
Abstract: When a contamination event occurs in a semiconductor fab, a process engineer must act quickly to find the cause. It is cost-prohibitive to maintain a full compliment of analytical tools in a fab that would be necessary to identify very small particle ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820944

962. Test Optics Error Removal
Topic: Manufacturing
Published: 3/1/1996
Authors: Christopher J. Evans, R Kestner
Abstract: Wave-front or surface errors may be divided into rotationally symmetric and nonrotationally symmetric terms. It is shown that if either the test part or the reference surface in an interferometric test is rotated to N equally spaced positions about t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820792

963. Test Tool for Industrial Ethernet Network Performance
Topic: Manufacturing
Published: 6/5/2009
Authors: James D Gilsinn, Freemon Johnson
Abstract: The number of devices that implement Ethernet interfaces on the factory floor is growing at an exponential rate along with the adoption of industrial-grade Ethernet networks on the plant floor. In addition to the sheer number of devices using indust ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902598

964. Test of CD-SEM Shape-Sensitive Linewidth Measurement
Topic: Manufacturing
Published: 7/1/2004
Authors: John S Villarrubia, Andras Vladar, Michael T Postek
Abstract: In a model-based library (MBL) approach to scanning electron microscope (SEM) linewidth measurement, a library of simulation results for a range of lineshapes is searched for a match to the measured image of the unknown line. Compared to standard alg ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823157

965. Test of a Slow Off-Axis Parabola at it
Topic: Manufacturing
Published: 11/1/1995
Authors: R E. Parks, Christopher J. Evans, Lianzhen Shao
Abstract: We describe the interferometric testing of a slow (f/16 at the center of curvature) off-axis parabola, intended for use in an x-ray spectrometer, that uses a spherical wave front matched to the mean radius of the asphere. We find the figure error in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820753

966. Testing Displacement-Measuring Interferometer Systems
Topic: Manufacturing
Published: 1/1/1998
Authors: Jack A Stone Jr., Martin Schroeck, Michael T. Stocker
Abstract: We have made a study of one method for testing displacement-measuring interferometer systems, a modified back-to-back comparison, that automatically compensates for changes in the optical path length between the two interferometers.  Although th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823081

967. Testing Interoperability Standards - A Test Case Generation Methodology
Topic: Manufacturing
Published: 6/16/2010
Authors: Nenad Ivezic, Jungyub Woo
Abstract: Over many years, National Institute of Standards and Technology (NIST) built test beds to support interoperability standards development and their implementation within software applications. A general test framework has been proposed to enhance new ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905876

968. Testing System of IEEE 1451.5-802.11 Standard-based Wireless Sensors
Topic: Manufacturing
Published: Date unknown
Authors: Kang B Lee, Yuyin Song, Frederick M Proctor
Abstract: The hierarchical architecture of factory equipment networks consists of the factory level, cell level, and device level. The equipment at different levels of the factory networks may employ different network communication protocols. The challenges th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915619

969. Testing the Digital Thread in Support of Model-Based Manufacturing and Inspection
Topic: Manufacturing
Published: 3/8/2016
Authors: Thomas D Hedberg, Joshua Lubell, Lyle Fischer, Larry Maggiano, Allison Barnard Feeney
Abstract: A number of manufacturing companies have reported anecdotal evidence describing the benefits of Model-Based Enterprise (MBE). Based on this evidence, the entire industry has embraced a vision to deploy MBE. In our view, the best chance of realizing ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919497

970. The Advanced Angle Metrology System at NIST
Topic: Manufacturing
Published: 11/1/2003
Author: Jack A Stone Jr.
Abstract: At the National Institute of Standards and Technology, our best capability for angle measurement is our Advanced Automated Master Angle Calibration System (AAMACS). This instrument is based on a triple-stack of indexing tables, used in conjunction w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823171



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series