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Displaying records 961 to 970 of 1000 records.
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961. Three steps towards metrological traceability for ballistics signature measurements
Topic: Manufacturing
Published: 2/1/2010
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Thomas B Renegar, Xiaoyu A Zheng, Li Ma, James H Yen, Martin Ols
Abstract: The National Institute of Standards and Technology (NIST) in collaboration with the Bureau of Alcohol, Tobacco, Firearms, and Explosives (ATF) has developed the Standard Reference Material (SRM) 2460 bullets and 2461 casings. NIST and ATF are propos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901492

962. Three-dimensional Scanning Optical Tweezers
Topic: Manufacturing
Published: 12/5/2005
Authors: Thomas W LeBrun, T W. Hwang, I Y Park, Jun-Feng Song, Yong-Gu Lee, Nicholas G Dagalakis, Cedric Victor Lucien Gagnon, Arvind Kumar Balijepalli
Abstract: There are several new tools for manipulating microscopic objects. Among them, optical tweezers (OT) has two distinguishing advantages. Firstly, OT can easily release an object without the need of a complicated detaching scheme. Secondly, it is antici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822371

963. Through-focus scanning optical microscope imaging method for nano-scale dimensional analysis
Topic: Manufacturing
Published: 9/1/2008
Authors: Ravikiran Attota, Richard M Silver
Abstract: We present a novel optical technique that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope, by analyzing two-dimensional through-focus scanning optical microscope (TSOM) images constructed us ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824668

964. Tip Characterization for Dimensional Nanometrology
Topic: Manufacturing
Published: 1/1/1999
Author: John S Villarrubia
Abstract: Technological trends are increasingly requiring dimensional metrology at size scales below a micrometer. Scanning probe microscopy has unique advantages in this size regime, but width and roughness measurements must be corrected for imaging artifacts ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822459

965. Tip Characterization for Dimensional Nanometrology
Topic: Manufacturing
Published: 1/1/2004
Author: John S Villarrubia
Abstract: Abstract: Technological trends are increasingly requiring dimensional metrology at size scales below a micrometer. Scanning probe microscopy has unique advantages in this size regime, but width and roughness measurements must be corrected for imagin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822539

966. Tip Characterization for Scanned Probe Microscope Width Metrology
Topic: Manufacturing
Published: 3/1/1998
Authors: Samuel Dongmo, John S Villarrubia, Samuel N Jones, Thomas B Renegar, Michael T Postek, Jun-Feng Song
Abstract: Determination of the tip shape is an important prerequisite for converting the various scanning probe microscopies form imaging tools into dimensional metrology tools with sufficient accuracy to meet the critical dimension measurement requirements of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823092

967. Tip and Surface Reconstruction in Scanned Probe Microscopy
Topic: Manufacturing
Published: 1/1/1997
Author: John S Villarrubia
Abstract: The non-vanishing size of tips in scanned probe microscopes (e.g., atomic force microscope or scanning tunneling microscope) results in imaging errors. Correction of these errors requires estimation of the tip shape (tip reconstruction) followed by e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820881

968. Tolerancing Form Deviations for NIST Standard Reference Material (SRM) 2809 Rockwell Diamond Indenters
Topic: Manufacturing
Published: 1/1/2007
Authors: Jun-Feng Song, Samuel Rea Low III, Li Ma
Abstract: The National Institute of Standards and technology (NIST) plans to develop Standard Reference Material (SRM) 2809 Rockwell Diamond Indenter to support Rockwell hardness standardization.  Most tolerances of the SRM indenters are adopted from thos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823240

969. Tolerancing Form Deviations for Rockwell Diamond Indenters
Topic: Manufacturing
Published: 9/1/2002
Authors: Jun-Feng Song, Samuel Rea Low III, Li Ma
Abstract: The spherical tip of Rockwell diamond indenters tends to be manufactured either a flat- or sharp-shaped surface because of the anisotropy property of the diamond. This can cause significant differences in the hardness readings. In order to control th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821752

970. Topography Measurements and Applications
Topic: Manufacturing
Published: 1/1/2006
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Based on auto- and cross-correlation functions (ACF and CCF), a new surface parameter called profile (or topography) difference, Ds, has been developed for quantifying differences between 2D profiles or between 3D topographies with a single number. & ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823205



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