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Displaying records 941 to 950 of 1000 records.
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941. The Geometric Characterization of Rockwell Diamond Indenters
Topic: Manufacturing
Published: 1/1/1994
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, A Hartman, Brian R Scace, J Smith
Abstract: By using a stylus instrument, a series of calibration and check standards, and calibration and uncertainty calculation procedures, we have calibrated Rockwell diamond indenters with a traceability to fundamental measurements. The combined measurement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820714

942. The Guidelines for Expressing Measurement Uncertainties and the 4:1 Test Uncertainty Ratio
Topic: Manufacturing
Published: 1/1/1997
Author: Jun-Feng Song
Abstract: In 1988, MIL-STD-45662A adopted the 4:1 Test Uncertainty Ratio (TUR); this was later incorporated into the ANSI/NCSL Z540-1 standard in 1994. However, in 1992, the National Institute of Standards and Technology (NIST) began to adopt a new method for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820875

943. The Helium Ion Microscope: A New Tool for Nanotechnology and  Nanomanufacturing
Topic: Manufacturing
Published: 9/1/2007
Authors: Michael T Postek, Andras Vladar, John A Kramar, L A Stern, John Notte, Sean McVey
Abstract: Helium Ion Microscopy (HIM) is a new, potentially disruptive technology for nanotechnology and nanomanufacturing. This methodology presents a potentially revolutionary approach to imaging and measurements which has several potential advantages over t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823238

944. The Impact of Scenario Development on the Performance of Speech Translation Systems Prescribed by the SCORE Framework
Topic: Manufacturing
Published: 9/25/2009
Authors: Brian A Weiss, Craig I Schlenoff
Abstract: The Defense Advanced Research Projects Agency's (DARPA) Spoken Language Communication and Translation for Tactical Use (TRANSTAC) program is a focused advanced technology research and development program. The intent of the TRANSTAC program is to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903628

945. The Influence of Defects on the Morphology of Si (111) Etched in NHF
Topic: Manufacturing
Published: 1/1/2005
Authors: Hui Zhou, Joseph Fu, Richard M Silver
Abstract: We have implemented a kinetic Monte-Carlo (KMC) simulation to study the morphologies of Si (111) surfaces etched in NHF. Although our initial simulations reproduced the previous results from Hines, it failed to produce the morphologies observed in ou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823191

946. The International Standard of Length
Topic: Manufacturing
Published: 1/1/1994
Author: Dennis A Swyt
Abstract: This chapter discusses the modern concept of traceability as it applies to CMM measurements of manufactured parts. It shows the means by which those dimensional measurements are functionally related to the international standard of length, the variou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820721

947. The Limits of Image-Based Optical Metrology
Topic: Manufacturing
Published: 3/1/2006
Authors: Richard M Silver, Bryan M Barnes, Ravikiran Attota, Jay Shi Jun, James J Filliben, Juan Soto, Michael T. Stocker, P Lipscomb, Egon Marx, Heather J Patrick, Ronald G Dixson, Robert D. Larrabee
Abstract: An overview of the challenges encountered in imaging device-sized features using optical techniques recently developed in our laboratories is presented in this paper.  We have developed a set of techniques we refer to as scatterfield microscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823206

948. The Measurement and Uncertainty of a Calibration Standard for the SEM
Topic: Manufacturing
Published: 3/1/1994
Authors: Joseph Fu, M Croarkin, Theodore Vincent Vorburger
Abstract: Standard Reference Material 484 is an artifact for calibration the magnification scale of a Scanning Electron Microscope (SEM) within the range of 1000X to 20000X. Seven issues, SRM-484, and SRM-484a to SRM-484f, have been certified between 1977 and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820682

949. The Measurement of the Pile-up Topography of Hardness Indentations
Topic: Manufacturing
Published: 4/1/1994
Authors: L Blunt, P Sullivan
Abstract: A number of indentations were made in 70:30 brass specimens. The resulting surface disturbance was analyzed using a stylus-based 3D topography measuring instrument. Numerical methods based on progressive truncation routines were developed in order to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820672

950. The Multi-Relationship Evaluation Design (MRED) Framework: Producing Evaluation Blueprints to Test Emerging, Advanced, and Intelligent Systems
Topic: Manufacturing
Published: 9/30/2010
Authors: Brian A Weiss, Linda C. Schmidt
Abstract: This paper introduces the Multi-Relationship Evaluation Design (MRED) framework whose objective is to take uncertain input data and automatically output comprehensive evaluation blueprints complete with targeted evaluation elements. MRED is unique in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906664



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