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941. Standardized Performance Testing Metrics for Optical Coordinate Measurement Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7883
Topic: Manufacturing
Published: 5/9/2013
Author: Steven David Phillips
Abstract: Optical probing technology on coordinate measuring machines (CMMs) operates significantly differently from discrete point probing associated with tactile probing CMMs hence manufacturers of this technology seek to use different testing artifacts for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912341

942. Standards for Bullets and Casings
Topic: Manufacturing
Published: 11/1/2002
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert A. Clary, Eric P Whitenton, Li Ma, Susan M Ballou
Abstract: The National Institute of Standards and Technology is developing reference standards through its Office of Law Enforcement Standards with funding provided by the National Institute of Justice. The standard reference materials are used by crime labora ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822418

943. Standards for Coordinate Measuring Machines,
Topic: Manufacturing
Published: 1/1/1994
Authors: Steven David Phillips, Bruce R. Borchardt, Gregory W Caskey, David E Ward, Daniel S Sawyer, P Snoots, K Harrell
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820699

944. Standards for Optical Imaging Systems in Forensic Laboratories
Topic: Manufacturing
Published: 8/1/2002
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert A. Clary, Eric P Whitenton, Li Ma, Susan M Ballou
Abstract: NIST RM (Reverence Material) 8240/2350 standard bullet and casing project is currently ongoing to support the National Integrated Ballistics Information Network (NIBIN) in the US. The original bullet signatures were traced on six master bullets from ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821966

945. Standards-Based Semantic Middleware
Topic: Manufacturing
Published: 7/1/2007
Authors: Nenad Ivezic, Boonserm Kulvatunyou, Marko Vujasinovic, Pat Snack, Zuran Marjanovic, Hyunbo Cho
Abstract: We describe a novel semantics-based architecture for standards-based approaches to interoperable applications. The paper includes our experiences in prototyping the proposed architecture and demonstrating the resulting semantic middleware capability ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822738

946. Static Structural Analysis of a Reconfigurable Rigid Platform Supported by Elastic Legs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5885
Topic: Manufacturing
Published: 1/1/1996
Author: F Rudder
Abstract: This report describes a static structural analysis of a rigid planar platform supported by elastic legs. The platform deformations are computed relative to a specified platform position and orientation. The analysis considers deformation due to stati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820815

947. Static and Dynamic Stability Performance Measurements of the Home Lift, Position and Rehabilitation (HLPR) Chair/Forklift
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7667
Topic: Manufacturing
Published: 3/3/2010
Authors: Joshua Johnson, Roger V Bostelman
Abstract: The Home Lift, Position and Rehabilitation (HLPR) Chair, developed at the National Institute of Standards and Technology (NIST), has unique capabilities and a unique shape as compared to conventional wheelchairs and powered chairs. The evaluation of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902750

948. Statistical Measure for the Sharpness of the SEM Image
Topic: Manufacturing
Published: 7/1/1997
Authors: Nien F Zhang, Michael T Postek, Robert D. Larrabee
Abstract: Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. Testing and proving that the instrument is performing at a satisfactory level of sharpness is an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820884

949. Statistical Models for Estimating the Measurement of Pitch in Metrology Instruments
Topic: Manufacturing
Published: 1/1/1996
Authors: Nien F Zhang, Michael T Postek, Robert D. Larrabee
Abstract: The measurement of pitch in metrology instruments is through to be a benign self-compensating function. In the course of issuing the new scanning electron microscope standard SRM 2090, a new algorithm for the measurement of pitch was developed. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820885

950. Step Height Metrology for Data Storage Applications
Topic: Manufacturing
Published: 11/1/1999
Authors: R Koning, Ronald G Dixson, Joseph Fu, Thomas B Renegar, Theodore Vincent Vorburger, V W. Tsai, Michael T Postek
Abstract: The measurements of bump heights and pit depth on compact discs (CD) with atomic force microscopes (AFMs) are quite different from the measurement of step heights on step height calibration standards.  Both the bumps and the pits show much large ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823118