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941. The Measurement of the Pile-up Topography of Hardness Indentations
Topic: Manufacturing
Published: 4/1/1994
Authors: L Blunt, P Sullivan
Abstract: A number of indentations were made in 70:30 brass specimens. The resulting surface disturbance was analyzed using a stylus-based 3D topography measuring instrument. Numerical methods based on progressive truncation routines were developed in order to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820672

942. The Multi-Relationship Evaluation Design (MRED) Framework: Producing Evaluation Blueprints to Test Emerging, Advanced, and Intelligent Systems
Topic: Manufacturing
Published: 9/30/2010
Authors: Brian A Weiss, Linda C. Schmidt
Abstract: This paper introduces the Multi-Relationship Evaluation Design (MRED) framework whose objective is to take uncertain input data and automatically output comprehensive evaluation blueprints complete with targeted evaluation elements. MRED is unique in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906664

943. The Multi-Relationship Evaluation Design Framework: Creating Evaluation Blueprints to Assess Advanced and Intelligent Technologies
Topic: Manufacturing
Published: 10/29/2010
Authors: Brian A Weiss, Linda C. Schmidt
Abstract: Technological evolutions are constantly occurring across advanced and intelligent systems within a range of fields including those within the military, law enforcement, automobile, and manufacturing industries. Testing the performance of these techno ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906659

944. The NIST Advanced Measurement Laboratory: at the Leading Edge of Measurement Science and Technology
Topic: Manufacturing
Published: 8/1/2006
Authors: C Londono, John Russell Lawall, Michael T Postek, Jack A Stone Jr., John Richard Stoup
Abstract: The National Institute of Standards and Technology as the U.S. National Metrology Institute has the fundamental responsibility to continuously push the limits of measurement science (metrology) to promote U.S. innovation and industrial competitivenes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824616

945. The NIST Gage Block Calibration Software System User's Manual
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6387
Topic: Manufacturing
Published: 1/1/2000
Author: Jay H Zimmerman
Abstract: The NIST Gage Block Calibration Software System is a complete calibration system with custom integrated software to calibrate and measurehigh-precision quality gage blocks as individual blocks or sets, both English and metric.  The calibration s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823120

946. The NIST Length Scale Interferometer
Topic: Manufacturing
Published: 5/1/1999
Authors: John S Beers, William B. Penzes
Abstract: The National Institute of Standards and Technology (NIST) interferometer for measuring graduated length scales has been in use since 1965. It was developed in response to the redefinition of the meter in 1960 from the prototype platinum-iridium bar t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820924

947. The NIST Length Scale Interferometer
Series: Journal of Research (NIST JRES)
Topic: Manufacturing
Published: 7/23/1999
Authors: John S Beers, William B. Penzes
Abstract: The National Institute of Standards and Technology (NIST) interferometer for measuring graduated length scales has been in use since 1965. It was developed in response to the redefinition of the meter in 1960 from the prototype platinum-iridium bar t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823093

948. The NIST/DOE Oak Ridge Centers for Manufacturing Technology Collaboration in Dimensional Metrology
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5482
Topic: Manufacturing
Published: 1/1/1994
Author: David C Stieren
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820715

949. The National Ballistics Imaging Comparison (NBIC) Project
Topic: Manufacturing
Published: 3/10/2012
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Susan M Ballou, Robert Meryln Thompson, James H Yen, Thomas B Renegar, Xiaoyu A Zheng, Richard M Silver, Martin Ols
Abstract: In response to the guidelines issued by the ASCLD/LAB-International (American Society of Crime Laboratory Directors/Laboratory Accreditation Board) to establish traceability and quality assurance in U.S. crime laboratories, a NIST/ATF joint project e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907871

950. The Neolithography Consortium
Topic: Manufacturing
Published: 6/1/2000
Author: James Edward Potzick
Abstract: The role of process simulation in microlithography is becoming an increasingly important part of process control as wafer feature sizes become smaller than the exposure wavelength, because the pattern transfer from photomask to wafer is nonlinear. An ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820976



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