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941. The International Standard of Length
Topic: Manufacturing
Published: 1/1/1994
Author: Dennis A Swyt
Abstract: This chapter discusses the modern concept of traceability as it applies to CMM measurements of manufactured parts. It shows the means by which those dimensional measurements are functionally related to the international standard of length, the variou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820721

942. The Limits of Image-Based Optical Metrology
Topic: Manufacturing
Published: 3/1/2006
Authors: Richard M Silver, Bryan M Barnes, Ravikiran Attota, Jay Shi Jun, James J Filliben, Juan Soto, Michael T. Stocker, P Lipscomb, Egon Marx, Heather J Patrick, Ronald G Dixson, Robert D. Larrabee
Abstract: An overview of the challenges encountered in imaging device-sized features using optical techniques recently developed in our laboratories is presented in this paper.  We have developed a set of techniques we refer to as scatterfield microscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823206

943. The Measurement and Uncertainty of a Calibration Standard for the SEM
Topic: Manufacturing
Published: 3/1/1994
Authors: Joseph Fu, M Croarkin, Theodore Vincent Vorburger
Abstract: Standard Reference Material 484 is an artifact for calibration the magnification scale of a Scanning Electron Microscope (SEM) within the range of 1000X to 20000X. Seven issues, SRM-484, and SRM-484a to SRM-484f, have been certified between 1977 and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820682

944. The Measurement of the Pile-up Topography of Hardness Indentations
Topic: Manufacturing
Published: 4/1/1994
Authors: L Blunt, P Sullivan
Abstract: A number of indentations were made in 70:30 brass specimens. The resulting surface disturbance was analyzed using a stylus-based 3D topography measuring instrument. Numerical methods based on progressive truncation routines were developed in order to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820672

945. The Multi-Relationship Evaluation Design (MRED) Framework: Producing Evaluation Blueprints to Test Emerging, Advanced, and Intelligent Systems
Topic: Manufacturing
Published: 9/30/2010
Authors: Brian A Weiss, Linda C. Schmidt
Abstract: This paper introduces the Multi-Relationship Evaluation Design (MRED) framework whose objective is to take uncertain input data and automatically output comprehensive evaluation blueprints complete with targeted evaluation elements. MRED is unique in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906664

946. The Multi-Relationship Evaluation Design Framework: Creating Evaluation Blueprints to Assess Advanced and Intelligent Technologies
Topic: Manufacturing
Published: 10/29/2010
Authors: Brian A Weiss, Linda C. Schmidt
Abstract: Technological evolutions are constantly occurring across advanced and intelligent systems within a range of fields including those within the military, law enforcement, automobile, and manufacturing industries. Testing the performance of these techno ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906659

947. The NIST Advanced Measurement Laboratory: at the Leading Edge of Measurement Science and Technology
Topic: Manufacturing
Published: 8/1/2006
Authors: C Londono, John Russell Lawall, Michael T Postek, Jack A Stone Jr., John Richard Stoup
Abstract: The National Institute of Standards and Technology as the U.S. National Metrology Institute has the fundamental responsibility to continuously push the limits of measurement science (metrology) to promote U.S. innovation and industrial competitivenes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824616

948. The NIST Gage Block Calibration Software System User's Manual
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6387
Topic: Manufacturing
Published: 1/1/2000
Author: Jay H Zimmerman
Abstract: The NIST Gage Block Calibration Software System is a complete calibration system with custom integrated software to calibrate and measurehigh-precision quality gage blocks as individual blocks or sets, both English and metric.  The calibration s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823120

949. The NIST Length Scale Interferometer
Topic: Manufacturing
Published: 5/1/1999
Authors: John S Beers, William B. Penzes
Abstract: The National Institute of Standards and Technology (NIST) interferometer for measuring graduated length scales has been in use since 1965. It was developed in response to the redefinition of the meter in 1960 from the prototype platinum-iridium bar t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820924

950. The NIST Length Scale Interferometer
Series: Journal of Research (NIST JRES)
Topic: Manufacturing
Published: 7/23/1999
Authors: John S Beers, William B. Penzes
Abstract: The National Institute of Standards and Technology (NIST) interferometer for measuring graduated length scales has been in use since 1965. It was developed in response to the redefinition of the meter in 1960 from the prototype platinum-iridium bar t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823093



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