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61. A New Method to Measure the Distance Between Graduation Lines on Graduated Scales
Topic: Manufacturing
Published: 12/1/1999
Authors: William B. Penzes, Robert Allen, Michael W. Cresswell, L Linholm, E Clayton Teague
Abstract: Line scales are used throughout industry for a variety of applications. The most common is the stage micrometer, a small graduated glass scale for the calibration of optical instruments such as microscopes. However, stage micrometers are generally no ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820939

62. A New Way of Handling Dimensional Meaurement Results for Integrated Circuit Technology
Topic: Manufacturing
Published: 6/1/2003
Authors: Andras Vladar, John S Villarrubia, Michael T Postek
Abstract: The international guidelines for correct expression of measurement results and errors call for a through assessment of the errors, their origin and behavior. The various dimensional measurement methods have different types of errors, different signa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823159

63. A New Workshop Summary Report: Industrial Applications of Scanned Probe Microscopy
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5550
Topic: Manufacturing
Published: 1/1/1994
Authors: John A Dagata, A Diebold, C Shih, R Colton
Abstract: An Industrial Applications of Scanned Probe Microscopy (SPM) workshop was held at NIST Gaithersburg on March 24-25 1994. The meeting, co-sponsored by NIST, SEMATECH, ASTM E42.14, and the American Vacuum Society, was attended by over one hundred SPM u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820677

64. A Novel Artifact for Testing Large Coordinate Measuring Machines
Topic: Manufacturing
Published: 1/1/2000
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, David E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820971

65. A Novel Artifact for Testing Large Coordinate Measuring Machines
Topic: Manufacturing
Published: 1/1/2001
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, D E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824606

66. A Novel CMM Interim Testing Artifact
Topic: Manufacturing
Published: 1/1/1994
Authors: Steven David Phillips, Bruce R. Borchardt, Gregory W Caskey, David E Ward, Bryon S. Faust, Daniel S Sawyer
Abstract: NIST is currently developing equipment and techniques to rapidly access the performance of Coordinate Measuring machines (CMMs). This will allow the frequent testing of CMMs to insure that they measure parts accurately. A novel interim testing artifa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820700

67. A Novel Parameter Proposed for 2D and 3D Topography Measurements and Comparisons
Topic: Manufacturing
Published: 9/1/2007
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Based on the cross-correlation function (CCF), a new parameter called profile difference, Ds (or topography difference for 3D), is developed for measurement and comparison of 2D profiles and 3D topographies.  When Ds = 0, the two compared profil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823236

68. A Pilot Implementation of the Core Manufacturing Simulation Data Information Model
Topic: Manufacturing
Published: 7/1/2007
Authors: Yung-Tsun Tina Lee, Swee Kong Leong, Frank H Riddick, Marcus Johansson, Bjorn J. Johansson
Abstract: Interoperability between manufacturing software applications and simulation is currently extremely limited, and it has been recognized that there is a great need for methods to improve interoperability. The Core Manufacturing Simulation Data (CMSD) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822736

69. A Prototype IEEE 1451.4 Smart Transducer Interface for Sensors and Actuators
Topic: Manufacturing
Published: 8/19/2011
Authors: Yuyin Song, David Michael Westbrook, Kang B Lee
Abstract: Analog transducers (sensors or actuators) are widely used in industry. The Institute of Electrical and Electronics Engineers (IEEE) 1451.4 standard defines a mixed-mode communication protocol and the Transducer Electronic Data Sheet (TEDS) formats fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908970

70. A Quantitative Study of Nanoparticle Release from Nanocoatings Exposed to UV Radiation
Topic: Manufacturing
Published: 4/7/2014
Authors: Li Piin Sung, Deborah L Stanley, Justin M Gorham, Savelas A Rabb, Xiaohong Gu, Lee Lijian Yu, Tinh Nguyen
Abstract: Nanoparticles are increasingly used in polymer coatings (i.e., nanocoatings) to improve multiple properties of traditional coatings such as mechanical, electrical, gas barrier, and UV resistance. These high performance nanocoatings are often used in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915497



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