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Topic Area: Manufacturing
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61. A Model for Step Height, Edge Slope and Linewidth Measurements Using AFM
Topic: Manufacturing
Published: 1/1/2003
Authors: Xuezeng Zhao, Theodore Vincent Vorburger, Joseph Fu, Jun-Feng Song, C V Nguyen
Abstract: Nano-scale linewidth measurements are performed in semiconductor manufacturing and in the data storage industry and will become increasingly important in micro-mechanical engineering. With the development of manufacturing technology in recent years, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821974

62. A Model of Deformable Rings for Interpretation of Wireless Capsule Endoscopic Videos
Topic: Manufacturing
Published: 11/1/2006
Authors: Piotr Szczypinski, Ram D Sriram, Parupudi Sriram, Nageshwar Reddy
Abstract: Wireless Capsule Endoscopy (WCE) provides a means to obtain a detailed video of the small intestine, not feasible with other endoscopic techniques. A single session with WCE may produce nearly 8 hours of video, which may take around one to two hours ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822640

63. A Model of the Brain for Robot Control Part 1: Defining Notation
Topic: Manufacturing
Published: 6/1/1979
Author: James S. Albus
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820383

64. A Model of the Brain for Robot Control Part 2: A Neurologial Model
Topic: Manufacturing
Published: 7/1/1979
Author: James S. Albus
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820384

65. A Model-Driven Approach for Building OWL DL and OWL Full Ontologies
Topic: Manufacturing
Published: 10/1/2006
Authors: S Brockmans, R Colomb, P Haase, E Kendall, Evan K Wallace, G Xie
Abstract: This paper presents an approach for visually modeling OWL DL and OWL Full ontologies based on the well-established visual modeling language UML. We discuss a metamodel for OWL based on the Meta-Object Facility, an associated UML profile as visual syn ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822636

66. A Modular System Architecture for Agile Assembly of Nano-Components using Optical Tweezers
Topic: Manufacturing
Published: 9/1/2005
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, et al
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822378

67. A Modular System Architecture for Agile Assembly of Nanocomponents using Optical Tweezers
Topic: Manufacturing
Published: 9/10/2005
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, Cedric Gagnon, Yong-Gu Lee, Nicholas G Dagalakis
Abstract: In order to realize the flexibility optical trapping offers as a nanoassembly tool, we need to develop natural and intuitiveinterfaces to assemble large quantities of nanocomponents quickly and cheaply. We propose a system to create such aninterface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822368

68. A Monte Carlo Model for SEM Linewidth Metrology
Topic: Manufacturing
Published: 5/1/1994
Authors: J R. Lowney, Michael T Postek, Andras Vladar
Abstract: A scanning electron microscope (SEM) can be used to measure the dimensions of the microlithographic features of integrated circuits. However, without a good model of the electron-beam / specimen interaction, accurate edge location cannot be obtained. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820689

69. A Multi-Criteria Web Services Composition Problem
Topic: Manufacturing
Published: 6/20/2007
Authors: Jeong Buhwan, Hyunbo Cho, Boonserm Kulvatunyou, Albert W Jones
Abstract: With its prevalence in enterprise applications integration, the service-oriented approach has been studied in various ways. The popularity, however, results in a number of different standards and implementations. The approach needs agreed-upon defini ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904334

70. A Multiscale Fabrication Approach to Microfluidic System Development
Topic: Manufacturing
Published: 1/1/2004
Authors: Tony L Schmitz, John A. Dagata, Brian S. Dutterer, W G Sawyer
Abstract: Microfluidic systems for analytical, medical, and sensing applications integrate optical or electrical readouts in low-cost, low-volume consumption systems. Embedding chemically functionalized templates with nanoscale topography within these devices ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821973



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