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Topic Area: Manufacturing
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51. A Layered Approach to Semantic Similarity Analysis of XML Schemas
Topic: Manufacturing
Published: 4/7/2008
Authors: Jaewook Kim, Boonserm Kulvatunyou, Nenad Ivezic, Albert W Jones
Abstract: One of the most critical steps to integrating heterogeneous e-Business applications using different XML schemas is schema mapping, which is known to be costly and error-prone. Past schema mapping research has not fully utilized semantic information i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824640

52. A Literature Review of Sensor Ontologies for Manufacturing Applications
Topic: Manufacturing
Published: 10/23/2013
Authors: Craig I Schlenoff, Tsai Hong Hong, Roger D. Eastman
Abstract: The purpose of this paper is to review existing sensor and sensor network ontologies to understand whether they can be reused as a basis for a manufacturing perception sensor ontology, or if the existing ontologies hold lessons for the development of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914024

53. A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer
Topic: Manufacturing
Published: 2/1/1995
Authors: P Sullivan, Christopher J. Evans
Abstract: In a phase measuring interferometer (PMI), the interference pattern is focused on a charge coupled device (CCD) detector array and data points are sampled at the corresponding locations. In most commercially available systems, a zoom lens forms part ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820778

54. A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer - Theoretical Aspects
Topic: Manufacturing
Published: 1/1/1994
Authors: P Sullivan, Christopher J. Evans
Abstract: In a phase measuring interferometer (PMI), the interference pattern is focused on a charge coupled device (CCD) detector array and data points are sampled at the corresponding locations. In most commercially available systems, a zoom lens forms part ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820718

55. A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer-Practical Implementation
Topic: Manufacturing
Published: 10/1/1994
Authors: P Sullivan, Christopher J. Evans
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820719

56. A Method to Characterize Overlay Tool Misalignments and Distortions
Topic: Manufacturing
Published: 7/1/1997
Authors: Richard M Silver, James Edward Potzick, Fredric Scire, Christopher J. Evans, Michael L McGlauflin, Edward A Kornegay, Robert D. Larrabee
Abstract: A new optical alignment artifact under development at NIST is described. This structure, referred to as a stepped microcone, is designed to assist users and manufacturers of overlay metrology tools in the reduction of tool-induced measurement errors. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820873

57. A Methodology for Systematic Generation and Evaluation of Alternative Operation Plans
Topic: Manufacturing
Published: 1/1/1994
Authors: Satyandra K. Gupta, William Regli, D Nau, Li Zhang
Abstract: This chapter describes a methodology for analyzing some of the manufacturability aspects of machined parts during the design stage of the product development cycle, so that problems related to machining can be recognized and corrected while the produ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821982

58. A Metric for the Comparison of Surface Topographies of Standard Reference Material (SRM) Bullets and Casings
Topic: Manufacturing
Published: 10/1/2005
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Li Ma, John M Libert, Susan M Ballou
Abstract: Based on the maximum cross-correlation function, CCFmax, a new parameter called signature difference, Ds, is developed for verifying the similarity of the 2D and 3D ballistics signatures of the standard bullets and of the prototype standard casings. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822360

59. A Metrology Approach to Unifying Rockwell C Hardness Scales
Topic: Manufacturing
Published: 1/1/1995
Authors: Jun-Feng Song, J Smith, Theodore Vincent Vorburger
Abstract: Current Rockwell C hardness scales (HRC) are unified by performance comparisons. Unless a reliable metrology approach is used for the direct verification of standard hardness machines and diamond indenters, the unified hardness scale may exhibit a sy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820772

60. A Model Driven Standards Process
Topic: Manufacturing
Published: 4/1/2005
Author: Arthur Griesser
Abstract: Explains how and why UML models fit into a robust formal standardization process based on the best practices of software development.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31913



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