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41. A Flexure Balance With Adjustable Restoring Torque for Nanonewton Force Measurement
Topic: Manufacturing
Published: 1/1/2002
Authors: Jon Robert Pratt, David B Newell, John A Kramar
Abstract: The NIST electrostatic force balance compares mechanical probe forces to an SI realization of force derived from measurements of the capacitance gradient and voltage in an electronic null balance. As we approach the nanonewton regime, the finite stif ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822422

42. A Frequency Stabilized Laser Array for Use in Displacement Metrology
Topic: Manufacturing
Published: 2/17/2000
Authors: J Pedulla, R Deslattes, John Russell Lawall
Abstract: We have developed a frequency stabilized laser system to supply light to measure atomic-scale displacements of a stage moved in real time. Each laser in the array provides enough power (~1 mW) for four Michelson interferometers whose accuracy require ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822455

43. A General Quantitative Method to Validate Instrument Calibration Techniques
Topic: Manufacturing
Published: 11/1/1999
Author: Steven David Phillips
Abstract: In this paper a method to validate proposed calibration procedures for coordinate measuring machines (CMMs) is presented. Conceptually, the validation procedure is based on a computer generated population of CMMs assumed to include any real CMM that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820940

44. A Glowing Future for Lab on a Chip Testing Standards
Topic: Manufacturing
Published: 6/28/2012
Author: Samuel M Stavis
Abstract: Testing standards are more fundamental from a metrological perspective and less controversial from an industrial perspective than product standards, representing a path of less resistance towards the standardization and commercialization of lab on a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910438

45. A High Accuracy Micrometer for Diameter Measurements of Cylindrical Standards
Topic: Manufacturing
Published: 1/1/1994
Authors: John Richard Stoup, Theodore D Doiron
Abstract: NIST has developed a new instrument to measure cylindrical standards including thread wires and plain plug gages. The instrument uses a laser interferometer system which is coupled with an air bearing linear motion slide and precise contact geometry ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820717

46. A Humidity Generator for Temperatures to 200 °C and Pressures to 1.6 MPa
Topic: Manufacturing
Published: 11/30/2012
Authors: D Vega-Maza, W Wyatt Miller, Dean C Ripple, Gregory E Scace
Abstract: We have constructed a new humidity generator that produces gas streams of known moisture content at temperatures from 85 °C to 200 °C, absolute pressures from 0.2 MPa to 1.6 MPa, and relative humidities from 10 % to 90 %. The generator produces a moi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905234

47. A Laser Tracker Calibration System
Topic: Manufacturing
Published: 1/1/2002
Authors: Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Charles Fronczek, William Tyler Estler
Abstract: We describe a laser tracker calibration system developed for frameless coordinate metrology systems. The system employs a laser rail to provide an 'in situ' calibrated length standard that is used to test a tracker in several different configurations ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821749

48. A Layered Approach to Semantic Similarity Analysis of XML Schemas
Topic: Manufacturing
Published: 4/7/2008
Authors: Jaewook Kim, Boonserm Kulvatunyou, Nenad Ivezic, Albert W Jones
Abstract: One of the most critical steps to integrating heterogeneous e-Business applications using different XML schemas is schema mapping, which is known to be costly and error-prone. Past schema mapping research has not fully utilized semantic information i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824640

49. A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer
Topic: Manufacturing
Published: 2/1/1995
Authors: P Sullivan, Christopher J. Evans
Abstract: In a phase measuring interferometer (PMI), the interference pattern is focused on a charge coupled device (CCD) detector array and data points are sampled at the corresponding locations. In most commercially available systems, a zoom lens forms part ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820778

50. A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer - Theoretical Aspects
Topic: Manufacturing
Published: 1/1/1994
Authors: P Sullivan, Christopher J. Evans
Abstract: In a phase measuring interferometer (PMI), the interference pattern is focused on a charge coupled device (CCD) detector array and data points are sampled at the corresponding locations. In most commercially available systems, a zoom lens forms part ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820718