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41. A General Quantitative Method to Validate Instrument Calibration Techniques
Topic: Manufacturing
Published: 11/1/1999
Author: Steven David Phillips
Abstract: In this paper a method to validate proposed calibration procedures for coordinate measuring machines (CMMs) is presented. Conceptually, the validation procedure is based on a computer generated population of CMMs assumed to include any real CMM that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820940

42. A Glowing Future for Lab on a Chip Testing Standards
Topic: Manufacturing
Published: 6/28/2012
Author: Samuel M Stavis
Abstract: Testing standards are more fundamental from a metrological perspective and less controversial from an industrial perspective than product standards, representing a path of less resistance towards the standardization and commercialization of lab on a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910438

43. A High Accuracy Micrometer for Diameter Measurements of Cylindrical Standards
Topic: Manufacturing
Published: 1/1/1994
Authors: John Richard Stoup, Theodore D Doiron
Abstract: NIST has developed a new instrument to measure cylindrical standards including thread wires and plain plug gages. The instrument uses a laser interferometer system which is coupled with an air bearing linear motion slide and precise contact geometry ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820717

44. A Humidity Generator for Temperatures to 200 °C and Pressures to 1.6 MPa
Topic: Manufacturing
Published: 11/30/2012
Authors: D Vega-Maza, W Wyatt Miller, Dean C Ripple, Gregory E Scace
Abstract: We have constructed a new humidity generator that produces gas streams of known moisture content at temperatures from 85 °C to 200 °C, absolute pressures from 0.2 MPa to 1.6 MPa, and relative humidities from 10 % to 90 %. The generator produces a moi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905234

45. A Laser Tracker Calibration System
Topic: Manufacturing
Published: 1/1/2002
Authors: Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Charles Fronczek, William Tyler Estler
Abstract: We describe a laser tracker calibration system developed for frameless coordinate metrology systems. The system employs a laser rail to provide an 'in situ' calibrated length standard that is used to test a tracker in several different configurations ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821749

46. A Literature Review of Sensor Ontologies for Manufacturing Applications
Topic: Manufacturing
Published: 10/23/2013
Authors: Craig I Schlenoff, Tsai Hong Hong, Roger D. Eastman
Abstract: The purpose of this paper is to review existing sensor and sensor network ontologies to understand whether they can be reused as a basis for a manufacturing perception sensor ontology, or if the existing ontologies hold lessons for the development of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914024

47. A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer
Topic: Manufacturing
Published: 2/1/1995
Authors: P Sullivan, Christopher J. Evans
Abstract: In a phase measuring interferometer (PMI), the interference pattern is focused on a charge coupled device (CCD) detector array and data points are sampled at the corresponding locations. In most commercially available systems, a zoom lens forms part ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820778

48. A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer - Theoretical Aspects
Topic: Manufacturing
Published: 1/1/1994
Authors: P Sullivan, Christopher J. Evans
Abstract: In a phase measuring interferometer (PMI), the interference pattern is focused on a charge coupled device (CCD) detector array and data points are sampled at the corresponding locations. In most commercially available systems, a zoom lens forms part ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820718

49. A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer-Practical Implementation
Topic: Manufacturing
Published: 10/1/1994
Authors: P Sullivan, Christopher J. Evans
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820719

50. A Method to Characterize Overlay Tool Misalignments and Distortions
Topic: Manufacturing
Published: 7/1/1997
Authors: Richard M Silver, James Edward Potzick, Fredric Scire, Christopher J. Evans, Michael L McGlauflin, Edward A Kornegay, Robert D. Larrabee
Abstract: A new optical alignment artifact under development at NIST is described. This structure, referred to as a stepped microcone, is designed to assist users and manufacturers of overlay metrology tools in the reduction of tool-induced measurement errors. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820873



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