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Displaying records 991 to 1000.
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991. Standards for Coordinate Measuring Machines,
Topic: Manufacturing
Published: 1/1/1994
Authors: Steven David Phillips, Bruce R. Borchardt, Gregory W Caskey, David E Ward, Daniel S Sawyer, P Snoots, K Harrell
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820699

992. Standards for Optical Imaging Systems in Forensic Laboratories
Topic: Manufacturing
Published: 8/1/2002
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert A. Clary, Eric Paul Whitenton, Li Ma, Susan M Ballou
Abstract: NIST RM (Reverence Material) 8240/2350 standard bullet and casing project is currently ongoing to support the National Integrated Ballistics Information Network (NIBIN) in the US. The original bullet signatures were traced on six master bullets from ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821966

993. Standards-Based Semantic Middleware
Topic: Manufacturing
Published: 7/1/2007
Authors: Nenad Ivezic, Boonserm Kulvatunyou, Marko Vujasinovic, Pat Snack, Zuran Marjanovic, Hyunbo Cho
Abstract: We describe a novel semantics-based architecture for standards-based approaches to interoperable applications. The paper includes our experiences in prototyping the proposed architecture and demonstrating the resulting semantic middleware capability ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822738

994. Static Structural Analysis of a Reconfigurable Rigid Platform Supported by Elastic Legs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5885
Topic: Manufacturing
Published: 1/1/1996
Author: F Rudder
Abstract: This report describes a static structural analysis of a rigid planar platform supported by elastic legs. The platform deformations are computed relative to a specified platform position and orientation. The analysis considers deformation due to stati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820815

995. Static and Dynamic Stability Performance Measurements of the Home Lift, Position and Rehabilitation (HLPR) Chair/Forklift
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7667
Topic: Manufacturing
Published: 3/3/2010
Authors: Joshua Johnson, Roger V Bostelman
Abstract: The Home Lift, Position and Rehabilitation (HLPR) Chair, developed at the National Institute of Standards and Technology (NIST), has unique capabilities and a unique shape as compared to conventional wheelchairs and powered chairs. The evaluation of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902750

996. Statistical Measure for the Sharpness of the SEM Image
Topic: Manufacturing
Published: 7/1/1997
Authors: Nien F Zhang, Michael T Postek, Robert D. Larrabee
Abstract: Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. Testing and proving that the instrument is performing at a satisfactory level of sharpness is an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820884

997. Statistical Models for Estimating the Measurement of Pitch in Metrology Instruments
Topic: Manufacturing
Published: 1/1/1996
Authors: Nien F Zhang, Michael T Postek, Robert D. Larrabee
Abstract: The measurement of pitch in metrology instruments is through to be a benign self-compensating function. In the course of issuing the new scanning electron microscope standard SRM 2090, a new algorithm for the measurement of pitch was developed. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820885

998. Step Height Metrology for Data Storage Applications
Topic: Manufacturing
Published: 11/1/1999
Authors: R Koning, Ronald G Dixson, Joseph Fu, Thomas B Renegar, Theodore Vincent Vorburger, V W. Tsai, Michael T Postek
Abstract: The measurements of bump heights and pit depth on compact discs (CD) with atomic force microscopes (AFMs) are quite different from the measurement of step heights on step height calibration standards.  Both the bumps and the pits show much large ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823118

999. Step-height Metrology for Data Storage Applications
Topic: Manufacturing
Published: 11/1/1999
Authors: R Koning, Ronald G Dixson, Joseph Fu, Thomas B Renegar, Theodore Vincent Vorburger, V W. Tsai, Michael T Postek
Abstract: The measurement of bump heights and pit depth on compact discs (CD) with atomic force microscopes (AFMs) is quite different from the measurement of step heights on step height calibration standards. Both the bumps and the pits show much larger transi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820931

1000. Stitching of Equatorial Profiles for Extended Spatial Range Assessment
Topic: Manufacturing
Published: 8/1/1996
Authors: P Sullivan, R E. Parks, Lianzhen Shao
Abstract: This paper describes a method for stitching multiple overlapping interferometric measurements of the equator of a high quality sphere to produce a single profile representing the roundness of the ball. The resulting optical profile measurement is com ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820826



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