NIST logo

Publications Portal

You searched on:
Topic Area: Manufacturing
Sorted by: title

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 991 to 1000.
Resort by: Date / Title

991. Simulation-based Manufacturing Interoperability Standards and Testing
Topic: Manufacturing
Published: 1/7/2009
Authors: Guodong Shao, Swee Kong Leong, Charles R. McLean
Abstract: Software applications for manufacturing systems developed using software from different vendors typically cannot work together. Develop¬ment of custom integrations of manufacturing software incurs costs and delays that hurt industry productivity and ...

992. Single Crystal Critical Dimension Reference Materials (SCCDRM): Process Optimization for the Next Generation of Standards
Topic: Manufacturing
Published: 4/5/2007
Authors: Ronald G Dixson, William F Guthrie, Michael W Cresswell, Richard A Allen, Ndubuisi George Orji
Abstract: Critical dimension atomic force microscopes (CD-AFMs) are rapidly gaining acceptance in semiconductor manufacturing metrology.  These instruments offer non-destructive three dimensional imaging of structures and can provide a valuable complement ...

993. Single-Integral-Equation Method for Scattering by Dielectric Cylinders
Topic: Manufacturing
Published: 7/1/2001
Author: Egon Marx
Abstract: Electromagnetic scattering of an incident plane monochromatic wave by dielectric or finitely conducting infinite cylinders of arbitrary shape, possibly in the presence of a substrate, can be reduced to the solution of scalar Helmholtz equations in tw ...

994. Single-Integral-Equation Method for Three-Dimensional Scattering
Topic: Manufacturing
Published: 7/1/2001
Author: Egon Marx
Abstract: The fields scattered by a homogeneous dielectric or finitely conducting object can be obtained from two tangential vector fields, the components of the electric and magnetic fields, on the interface. We have adapted the single-integral-equation metho ...

995. Sliding Mode Control for Active Vibration Isolation of a Long Range Scanning Tunneling Microscope
Topic: Manufacturing
Published: 10/29/2004
Authors: K J Lan, James H Yen, John A Kramar
Abstract: An active vibration isolation (AVI) system has been designed and implemented for the Molecular Measuring Machine (M3) at the National Institute of Standards and Technology (NIST). NIST is investigating active vibration isolation as an approach to imp ...

996. Solving the Robot-World/Hand-Eye Calibration Problem Using the Kronecker Product
Topic: Manufacturing
Published: 6/24/2013
Author: Mili Indra Shah
Abstract: This paper constructs a closed-form solution to the robot-world/hand-eye calibration paper using the Kronecker product. In other words, it constructs the optimal X and Y to solve AX = YB. Additionally, this paper provides errors metrics that will mea ...

997. Some Considerations for a Measurement Strategy for Circular Features
Topic: Manufacturing
Published: 1/1/1994
Authors: Howard H. Harary, C Buchard, P L heritier, J Dufraigne, P Chollet
Abstract: The careful study of manufactured parts is a prerequisite for their intelligent inspection. For this study, we conducted a survey of the processes for making holes by manufacturing a set of test parts using ten different machining processes. The hole ...

998. Some Developments at NIST on Traceability in Dimensional Measurements
Topic: Manufacturing
Published: 10/1/2001
Authors: Dennis A Swyt, Steven David Phillips, J Palmateer
Abstract: This paper reports to the international community on recent developments in technical ;policies, programs, and capabilities at the U.S. National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These d ...

999. Some Interactions of Information and Control in Integrated Automation Systems
Topic: Manufacturing
Published: 6/1/1989
Author: Edward J Barkmeyer
Abstract: The ready availability of inexpensive and standard communications hardware in the late 1980's, coupled with sufficient standardization of intermediate-layer protocols to make reliable machine-to-machine communications thorough any combination of ...

1000. Sources of Error in Absolute Distance Interferometry
Topic: Manufacturing
Published: 1/1/1999
Authors: Jack A Stone Jr, Alois Stejskal, Lowell P. Howard
Abstract: In this paper we describe the status of our research on the use of diode lasers for absolute distance interferometry, and we discuss the major sources of uncertainty that limit the accuracy of this technique for distance measurement. We have primaril ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series