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Displaying records 991 to 1000.
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991. Simulation and Prediction of Hardness Performance of Rockwell Diamond Indenters Using Finite Element Analysis
Topic: Manufacturing
Published: 7/1/2002
Authors: Li Ma, Samuel Rea Low III, Hui Zhou, Jun-Feng Song, R Dewit
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821771

992. Simulation of Optical Microscope Images for Photomask Feature Size Measurements
Topic: Manufacturing
Published: 1/1/2005
Authors: Egon Marx, James Edward Potzick
Abstract: Features on photomasks used in the semiconductor industry have steadily decreased in size to fit more elements on a wafer.  When the size becomes smaller than the wavelength of the light used in a microscope, simulation becomes an important part ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822252

993. Simulation of Optical Microscope Images for Photomask Feature Size Measurements
Topic: Manufacturing
Published: 7/3/2005
Authors: Egon Marx, James Edward Potzick
Abstract: Features on photomasks used in the semiconductor industry have steadily decreased in size to fit more elements on a wafer. When the size becomes smaller than the wavelength of the light used in a microscope, simulation becomes an important part of th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822388

994. Simulation-based Manufacturing Interoperability Standards and Testing
Topic: Manufacturing
Published: 1/7/2009
Authors: Guodong Shao, Swee Kong Leong, Charles R. McLean
Abstract: Software applications for manufacturing systems developed using software from different vendors typically cannot work together. Develop¬ment of custom integrations of manufacturing software incurs costs and delays that hurt industry productivity and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901344

995. Single Crystal Critical Dimension Reference Materials (SCCDRM): Process Optimization for the Next Generation of Standards
Topic: Manufacturing
Published: 4/5/2007
Authors: Ronald G Dixson, William F Guthrie, Michael W Cresswell, Richard A Allen, Ndubuisi George Orji
Abstract: Critical dimension atomic force microscopes (CD-AFMs) are rapidly gaining acceptance in semiconductor manufacturing metrology.  These instruments offer non-destructive three dimensional imaging of structures and can provide a valuable complement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823219

996. Single-Integral-Equation Method for Scattering by Dielectric Cylinders
Topic: Manufacturing
Published: 7/1/2001
Author: Egon Marx
Abstract: Electromagnetic scattering of an incident plane monochromatic wave by dielectric or finitely conducting infinite cylinders of arbitrary shape, possibly in the presence of a substrate, can be reduced to the solution of scalar Helmholtz equations in tw ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822444

997. Single-Integral-Equation Method for Three-Dimensional Scattering
Topic: Manufacturing
Published: 7/1/2001
Author: Egon Marx
Abstract: The fields scattered by a homogeneous dielectric or finitely conducting object can be obtained from two tangential vector fields, the components of the electric and magnetic fields, on the interface. We have adapted the single-integral-equation metho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822445

998. Sliding Mode Control for Active Vibration Isolation of a Long Range Scanning Tunneling Microscope
Topic: Manufacturing
Published: 10/29/2004
Authors: K J Lan, James H Yen, John A Kramar
Abstract: An active vibration isolation (AVI) system has been designed and implemented for the Molecular Measuring Machine (M3) at the National Institute of Standards and Technology (NIST). NIST is investigating active vibration isolation as an approach to imp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822380

999. Solving the Robot-World/Hand-Eye Calibration Problem Using the Kronecker Product
Topic: Manufacturing
Published: 6/24/2013
Author: Mili Indra Shah
Abstract: This paper constructs a closed-form solution to the robot-world/hand-eye calibration paper using the Kronecker product. In other words, it constructs the optimal X and Y to solve AX = YB. Additionally, this paper provides errors metrics that will mea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910225

1000. Some Considerations for a Measurement Strategy for Circular Features
Topic: Manufacturing
Published: 1/1/1994
Authors: Howard H. Harary, C Buchard, P L heritier, J Dufraigne, P Chollet
Abstract: The careful study of manufactured parts is a prerequisite for their intelligent inspection. For this study, we conducted a survey of the processes for making holes by manufacturing a set of test parts using ten different machining processes. The hole ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820683



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