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991. Towards a Method for Harmonizing Information Standards
Topic: Manufacturing
Published: 8/19/2009
Authors: Xenia Fiorentini, Sudarsan Rachuri, Steven R. Ray, Ram D Sriram
Abstract: Designers and engineers use various engineering authoring tools, such as CAD, CAE, and PDM,, to generate information objects (engineering objects). On the business side, enterprise level business process modelers use various business authoring tools, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903057

992. Towards a Traceable Nanoscale Force Standard
Topic: Manufacturing
Published: 5/1/2001
Authors: Jon Robert Pratt, David B Newell, Edwin Ross Williams, Douglas T Smith, John A Kramar
Abstract: The National Institute of Standards and Technology has launched a five-year project to traceably link the International System of Units (SI) to forces between 10^u-8^N and 10^u-2^N. In this paper, we give a background and overview of this project, di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821765

993. Trace water vapor analysis in specialty gases: sensor and spectroscopic approaches
Topic: Manufacturing
Published: 7/1/2013
Authors: Kristine A Bertness, Mark W. Raynor, Kevin C Cossel, Florian B. Adler, Jun Ye
Abstract: The analysis of water vapor impurity is important in a number of specialty gas applications. However the main driver for the development and advancement of trace H^u2^O analysis techniques has been the microelectronics industry. The International ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911233

994. Traceability Calibration, & Measurement Uncertainty Issues Regarding Coordinate Measuring Machines and Other Complex Instruments
Topic: Manufacturing
Published: 6/1/2000
Author: Steven David Phillips
Abstract: The modern definition of traceability intimately links the concepts of calibration (i.e., connection to the SI unit) and measurement uncertainty. In a typical coordinate measuring machine (CMM) measurement problem the measurement under consideration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820969

995. Traceability for Ballistics Signature Measurements in Forensic Science
Topic: Manufacturing
Published: 12/1/2009
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Susan M Ballou, Li Ma, Thomas B Renegar, Xiaoyu A Zheng, Martin Ols
Abstract: The National Institute of Standards and Technology (NIST) in collaboration with the Bureau of Alcohol, Tobacco, Firearms, and Explosives (ATF) has developed the Standard Reference Material (SRM) 2460 Bullets and 2461 Casings. NIST has also developed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824703

996. Traceable Atomic Force Microscope Dimensional Metrology at NIST
Topic: Manufacturing
Published: 3/1/2006
Authors: Ronald G Dixson, Ndubuisi George Orji, Joseph Fu, Michael W Cresswell, Richard A Allen, William F Guthrie
Abstract: The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology.  There are two major instruments being used for traceable measurements at NIST.  The first is a cus ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823204

997. Traceable Calibration of Critical-Dimension Atomic Force Microscope Linewidth Measurements with Nanometer Uncertainty
Topic: Manufacturing
Published: 1/1/2005
Authors: Ronald G Dixson, Richard A Allen, William F Guthrie, Michael W Cresswell
Abstract: The use of critical dimension atomic force microscopes (CD-AFMs) in semiconductor manufacturing, both for process control and as a reference metrology tool, is increasing.  If the tip width is calibrated consistentlybetween measurements, a CD-AF ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823193

998. Traceable Pico-Meter Level Step Height Metrology
Topic: Manufacturing
Published: 12/1/2004
Authors: Ndubuisi George Orji, Ronald G Dixson, Joseph Fu, Theodore Vincent Vorburger
Abstract: The atomic force microscope (AFM) increasingly being used as a metrology tool in the semiconductor industry where the features measured are at the nanometer level and continue to decrease. Usually the height sensors of the AFM are calibrated using st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822142

999. Traceable Standards for Scanning Electron Microscopy
Topic: Manufacturing
Published: 1/1/1994
Author: Michael T Postek
Abstract: The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820996

1000. Tradeoffs in Building a Generic Supply Chain Simulation Capability
Topic: Manufacturing
Published: 10/15/2008
Author: Sanjay Jain
Abstract: Building a simulation model for any large complex sys-tem requires high expertise and effort. These requirements can be reduced through building generic simulation capability that includes artifacts for facilitating the development of the simulation ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824711



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