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Displaying records 981 to 990 of 1000 records.
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981. Re-Evaluation of the Accuracy of NIST Photomask Linewidth Standards
Topic: Manufacturing
Published: 5/1/1995
Author: James Edward Potzick
Abstract: Every artifact measurement standard has some uncertainty associated with its calibration, and the NIST Photomask Linewidth Standards are no exception. This uncertainty is caused by a combination of those factors which influence the calibration measur ...

982. Light Scattered by Sinusoidal Surfaces: Illumination Windows and Harmonics in Standards
Topic: Manufacturing
Published: 3/1/1995
Authors: Egon Marx, T Lettieri, Theodore Vincent Vorburger
Abstract: Sinusoidal surfaces can be used as material standards to help calibrate instruments that measure the angular distribution of the intensity of light scattered by arbitrary surfaces, because the power in the diffraction peaks varies over several orders ...

983. A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer
Topic: Manufacturing
Published: 2/1/1995
Authors: P Sullivan, Christopher J. Evans
Abstract: In a phase measuring interferometer (PMI), the interference pattern is focused on a charge coupled device (CCD) detector array and data points are sampled at the corresponding locations. In most commercially available systems, a zoom lens forms part ...

984. Microform Calibrations in Surface Metrology
Topic: Manufacturing
Published: 2/1/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, A Hartman, Brian R Scace, J Smith
Abstract: Microform calibrations include the measurement of complex profile forms and position errors of micrometer scale in combination with the measurement of deviations from a specified profile and surface texture of profile segments. Tolerances on the prof ...

985. The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5698
Topic: Manufacturing
Published: 2/1/1995
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...

986. User Manual for the Interim Testing Artifact for CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5602
Topic: Manufacturing
Published: 2/1/1995
Authors: Amy Singer, J Land, Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, Gregory W Caskey, et al
Abstract: The Interim Testing Artifact (ITA) is designed to quickly test CMMs for performance problems so that they can be repaired before significant numbers of good parts are erroneously rejected (or bad parts accepted) by the CMM. Frequent testing using the ...

987. A Metrology Approach to Unifying Rockwell C Hardness Scales
Topic: Manufacturing
Published: 1/1/1995
Authors: Jun-Feng Song, J Smith, Theodore Vincent Vorburger
Abstract: Current Rockwell C hardness scales (HRC) are unified by performance comparisons. Unless a reliable metrology approach is used for the direct verification of standard hardness machines and diamond indenters, the unified hardness scale may exhibit a sy ...

988. Acquisition and Analysis Software for an Enhanced Bandwidth Phase Measuring Interferometer
Topic: Manufacturing
Published: 1/1/1995
Author: P Sullivan
Abstract: The aim of the project is to investigate the potential of expanding the instrument measurement bandwidth of a traditional phase measurement interferometer (PMI) system using a comparatively simple optical / software modification. This would offer the ...

989. Automated Calibration of Scanning Probe Microscopy by Image Processing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5668
Topic: Manufacturing
Published: 1/1/1995
Author: J Jorgensen
Abstract: The continuing drive within high technology industries to push dimensional tolerances to still smaller values motivates the use of surface measuring techniques with better resolution. This requirement can be met by the scanning probe microscopy (SPM) ...

990. Automated Manufacturing Research Facility: 1994 Annual Report
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5613
Topic: Manufacturing
Published: 1/1/1995
Authors: David C Stieren, James S. Albus
Abstract: Abstract not available.

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