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41. ASME Journal of Computing and Information Science in Engineering (JCISE)
Topic: Manufacturing
Published: 6/14/2013
Author: Vijay Srinivasan
Abstract: For over a decade this journal has supported and advanced the research and applications at the intersection of information science and mechanical engineering. In that process it has established itself as a premier outlet for cutting edge research in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914067

42. CHARACTERIZING ENERGY CONSUMPTION OF THE INJECTION MOLDING PROCESS
Topic: Manufacturing
Published: 6/14/2013
Authors: Jatinder Madan, Mahesh Mani, Kevin W Lyons
Abstract: Presently available systems for sustainability assessment do not fully account for aspects related to a product‰s manufacturing. In an effort to make more sustainable decisions, today‰s industry seeks reliable methods to assess and compare sustainabi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912839

43. Inferring Intention Through State Representations in Cooperative Human-Robot Environments
Topic: Manufacturing
Published: 6/7/2013
Authors: Craig I Schlenoff, Anthony Pietromartire, Zeid Kootbally, Stephen B. Balakirsky, Thomas Rollin Kramer, Sebti Foufou
Abstract: In this paper, we describe a novel approach for inferring intention during cooperative human-robot activities through the representation and ordering of state information. State relationships are represented by a combination of spatial relationships ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912328

44. Development of a Methodology to Determine Risk of Counterfeit Use
Topic: Manufacturing
Published: 6/5/2013
Authors: Mark Schaffer, Yaw S Obeng
Abstract: Counterfeit components have become a multi-million dollar, yet undesirable, part of the electronics industry. The profitability of the counterfeit industry rests in large part on its ability to recognize supply constraints and quickly respond, effect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914105

45. Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals
Topic: Manufacturing
Published: 6/1/2013
Authors: Chukwudi Azubuike Okoro, Pavel Kabos, Jan Obrzut, Klaus Hummler, Yaw S Obeng
Abstract: In this work, radio frequency (RF) signal is demonstrated as an effective metrology tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity of TSV da ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912850

46. Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis
Topic: Manufacturing
Published: 5/28/2013
Authors: Chukwudi Azubuike Okoro, Yaw S Obeng, Jan Obrzut, Pavel Kabos, Klaus Hummler
Abstract: In this work, we used radio frequency (RF) based measurement technique is used as a prognostic tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913332

47. Proposed ,NIST Ballistics Identification System (NBIS)Š Based on 3D Topography Measurements on Correlation Cells
Topic: Manufacturing
Published: 5/17/2013
Author: Jun-Feng Song
Abstract: The invented ,NIST Ballistics Identification System (NBIS)Š using three-dimensional (3D) topography measurements on correlation cells can promote high accuracy and fast ballistics identifications [1]. The use of paired correlation cells can identify ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910868

48. Guide to Industrial Control Systems (ICS) Security
Report Number: 800-82r1
Topic: Manufacturing
Published: 5/14/2013
Authors: Keith A Stouffer, Joseph A Falco, Karen Ann Scarfone
Abstract: This document provides guidance on how to secure Industrial Control Systems (ICS), including Supervisory Control and Data Acquisition (SCADA) systems, Distributed Control Systems (DCS), and other control system configurations such as Programmable ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913905

49. Writing Guidelines to Develop an Memorandum of Understanding for Interoperable Automated Fingerprint Identification Systems
Series: Special Publication (NIST SP)
Report Number: 1156
Topic: Manufacturing
Published: 5/14/2013
Authors: Susan M Ballou, Michael D Garris, Anthony Clay, Joi Dickerson, Peter T Higgins, Lisa Jackson, Joe Morrissey, Beth Owens, Joe Polski, Janet Hoin, Leo Norton, Melissa K Taylor
Abstract: This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the id ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913325

50. CMSD - A Manufacturing Simulation Integration Standard: Overview and Case Studies
Topic: Manufacturing
Published: 5/10/2013
Authors: Yung-Tsun Tina Lee, Frank H Riddick, Bjorn J. Johansson
Abstract: Standard representations for information entities common to manufacturing simulation could help reduce the costs associated with simulation model construction and data exchange between simulation and other manufacturing applications. This would make ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908209



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