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Displaying records 971 to 980 of 1000 records.
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971. The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5698
Topic: Manufacturing
Published: 2/1/1995
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820754

972. User Manual for the Interim Testing Artifact for CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5602
Topic: Manufacturing
Published: 2/1/1995
Authors: Amy Singer, J Land, Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, Gregory W Caskey, et al
Abstract: The Interim Testing Artifact (ITA) is designed to quickly test CMMs for performance problems so that they can be repaired before significant numbers of good parts are erroneously rejected (or bad parts accepted) by the CMM. Frequent testing using the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820767

973. A Metrology Approach to Unifying Rockwell C Hardness Scales
Topic: Manufacturing
Published: 1/1/1995
Authors: Jun-Feng Song, J Smith, Theodore Vincent Vorburger
Abstract: Current Rockwell C hardness scales (HRC) are unified by performance comparisons. Unless a reliable metrology approach is used for the direct verification of standard hardness machines and diamond indenters, the unified hardness scale may exhibit a sy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820772

974. Acquisition and Analysis Software for an Enhanced Bandwidth Phase Measuring Interferometer
Topic: Manufacturing
Published: 1/1/1995
Author: P Sullivan
Abstract: The aim of the project is to investigate the potential of expanding the instrument measurement bandwidth of a traditional phase measurement interferometer (PMI) system using a comparatively simple optical / software modification. This would offer the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820776

975. Automated Calibration of Scanning Probe Microscopy by Image Processing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5668
Topic: Manufacturing
Published: 1/1/1995
Author: J Jorgensen
Abstract: The continuing drive within high technology industries to push dimensional tolerances to still smaller values motivates the use of surface measuring techniques with better resolution. This requirement can be met by the scanning probe microscopy (SPM) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820743

976. Automated Manufacturing Research Facility: 1994 Annual Report
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5613
Topic: Manufacturing
Published: 1/1/1995
Authors: David C Stieren, James S. Albus
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820774

977. Calibration Uncertainties for Microform of Rockwell Hardness Indenters
Topic: Manufacturing
Published: 1/1/1995
Authors: F Rudder, Jun-Feng Song
Abstract: A microform calibration procedure has been developed at NIST to certify geometric conformity of Rockwell C hardness indenters. The interest in microform calibrations is to unify national and international comparisons of hardness tests. Using accepted ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820760

978. Computer Modeling of Heterodyne Interferometer Errors
Topic: Manufacturing
Published: 1/1/1995
Authors: Lowell P. Howard, Jack A Stone Jr.
Abstract: A computer model and methodology for modeling optical mixing errors in heterodyne interferometers is presented. The model is based on the Jones calculus and uses a matrix formalism to eliminate simplifications and reduce assumptions in the model. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820741

979. Damage Processes in Ceramics Resulting from Diamond Tool Indentation and Scratching in Various Environments
Topic: Manufacturing
Published: 1/1/1995
Authors: A Ruff, H Shin, Christopher J. Evans
Abstract: Studies have been carried out to determine the influence of different chemical environments and tool shapes on damage produced during diamond tool scratching and indenting of two advanced ceramics: chemical-vapor-deposited silicon carbide and a compo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820761

980. Design, Specification and Tolerancing of Micrometer - Tolerance Assembles
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5615
Topic: Manufacturing
Published: 1/1/1995
Author: Dennis A Swyt
Abstract: As increasing number of economically important products manufactured by U.S. companies are comprised of assemblies of macroscopic parts with microscopic tolerances, that is, parts from a few to hundreds of millimeters in size where the acceptable dev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820779



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