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Displaying records 941 to 950 of 1000 records.
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941. Uncertainty Procedure for NIST Surface Finish and Microform Calibration
Topic: Manufacturing
Published: 1/1/1996
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: An uncertainty procedure is used for reporting the NIST surface finish and microform calibration uncertainties. The combined standard uncertainty is a combination of the uncertainty from the geometric non-uniformity of the measured surface, and the u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820822

942. Using a Potentiostat to Model In-Process Electromechanical Dressing
Topic: Manufacturing
Published: 1/1/1996
Authors: Robert S. Polvani, A Fraker, Christopher J. Evans
Abstract: In-process electrochemical dressing insures true, sharp, stable wheels for efficient ceramic grinding. To better implement electrochemical dressing, we couple laboratory studies based on a potentiostat with shop floor grinding runs. To do this, a cal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820804

943. Wavelength-Shift Interferometry: Using a Dither to Improve Accuracy
Topic: Manufacturing
Published: 1/1/1996
Authors: Jack A Stone Jr., Alois Stejskal, Lowell P. Howard
Abstract: A dither in path length can dramatically improve the accuracy of wavelength-shift methods used for absolute distance interferometry. Here we report how a dither improves the accuracy of absolute distance measurement by two orders of magnitude, reduci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820825

944. Visualization of Surface Figure Using Zernike Polynomials
Topic: Manufacturing
Published: 12/1/1995
Authors: Christopher J. Evans, R E. Parks, P Sullivan, John S Taylor
Abstract: Commercial software in modern interferometers used in optical testing frequently fit the wave-front or surface-figure error to Zernike polynomials; typically 37 coefficients are provided. We provide visual representations of these data in a form that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820739

945. Stylus Technique for Direct Verification of Rockwell Diamond Indenters
Topic: Manufacturing
Published: 11/23/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, J Smith
Abstract: Based on a stylus technique, a microform calibration system was developed at NIST for the direct verification of Rockwell diamond indenters. The least-squares radius and profile deviations, cone angle and cone flank straightness, and the holder axis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820771

946. Blind Estimation of Tip Geometry from Noisy Images
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5752
Topic: Manufacturing
Published: 11/2/1995
Author: John S Villarrubia
Abstract: Broadening of image features due to non-vanishing tip size is a well-known imaging artifact in scanned probe microscopy (SPM) topographs. This need not be a serious limitation for some types of metrology (e.g. pitch or height), but it is significant ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820828

947. Fabrication Issues for the Prototype NIST SRM 2090A SEM Magnification Calibration Standard
Topic: Manufacturing
Published: 11/1/1995
Authors: B Newell, Michael T Postek, J VanDerZiel
Abstract: A new National Institute of Standards and Technology scanning electron microscope magnification calibration standard has been fabricated and distributed in production prototype form. The SRM 2090A samples contain structures ranging in pitch from 3000 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820750

948. Test of a Slow Off-Axis Parabola at it
Topic: Manufacturing
Published: 11/1/1995
Authors: R E. Parks, Christopher J. Evans, Lianzhen Shao
Abstract: We describe the interferometric testing of a slow (f/16 at the center of curvature) off-axis parabola, intended for use in an x-ray spectrometer, that uses a spherical wave front matched to the mean radius of the asphere. We find the figure error in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820753

949. 1/N Feynman Machines as a Path to Ultraminiaturization
Topic: Manufacturing
Published: 9/1/1995
Author: E Clayton Teague
Abstract: The possibility of implementing Feynman''s proposal for achieving ultraminiaturization by an iterative process of three-dimensional machines making ever-smaller three-dimensional machines is considered in the nature of a thought experiment. A large a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820781

950. Application of the Prototype NIST SRM 2090a SEM Magnification Standard in a Manufacturing Environment
Topic: Manufacturing
Published: 9/1/1995
Authors: B Newell, Michael T Postek, J VanDerZiel
Abstract: The first NIST-traceable SEM magnification calibration standard designed to meet the particular needs of the micromanufacturing industry has been fabricated and characterized in production prototype form. The SRM 2090A samples contain structures rang ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820799



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