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You searched on: Topic Area: Manufacturing

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Displaying records 941 to 950 of 1000 records.
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941. Establishing a Worldwide Unified Rockwell Hardness Scale With Metrology Traceability
Topic: Manufacturing
Published: 1/1/1997
Authors: Jun-Feng Song, Samuel Rea Low III, David J Pitchure, A Germak, S Desogus, T Polzin, H Yang, H Ishida, G Barbato
Abstract: Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. It is now possible to establish standard grade Rockwell diamond indenters characterized by high geometry un ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820876

942. Experimental Results of Blind Reconstruction of STM Tips
Topic: Manufacturing
Published: 1/1/1997
Authors: Carsten P. Jensen, Richard M Silver, John S Villarrubia
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820896

943. Fabrication of Calibration Standards by Nanostructuring Procedures Using Scanning Tunneling Microscope (STM)
Topic: Manufacturing
Published: 1/1/1997
Authors: R Koning, L Koenders
Abstract: To improve the achievable uncertainty of high resolution microscopes (Scanning Probe or Scanning Electron) attempts have been made to manufacture calibration standard on the basis of a new principle. It has been intended to couple nanostructures prod ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820848

944. Finish and Figure Metrology for Soft X-ray Optics
Topic: Manufacturing
Published: 1/1/1997
Author: T Mcwaid
Abstract: The performance of high quality optics relies heavily on their geometrical properties of surface finish and figure. The surface finish consists of the short spatial-wavelength departures from perfect smoothness and leads to scattering of the incident ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820854

945. Finish and Figure Metrology for Soft X­ray Optics
Topic: Manufacturing
Published: 1/1/1997
Authors: Theodore Vincent Vorburger, Christopher J. Evans, V W. Tsai, Joseph Fu, E. C. Williams, Ronald G Dixson, P Sullivan, T. McWaid
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901981

946. Hybrid Optical-Electrical Overlay Test Structure
Topic: Manufacturing
Published: 1/1/1997
Authors: Michael W. Cresswell, Robert Allen, L Linholm, William F Guthrie, William B. Penzes, A Gurnell
Abstract: This paper describes the exploratory use of electrical test structures to enable the calibration of optical overlay instruments of the type used to monitor semiconductor-device fabrication processes. Such optical instruments are known to be vulnerabl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820834

947. Industrial Uses of STM and AFM
Topic: Manufacturing
Published: 1/1/1997
Authors: Theodore Vincent Vorburger, John A Dagata, G. Wilkening, K Iizuka
Abstract: We review the field of STM and AFM as applied to industrial problems, and we classify the applications into four classes: research with potential benefit to industry, research performed by industry, applications off-line in manufacturing, and applica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820882

948. Integral Equations for Scattering by a Particle in a Layer
Topic: Manufacturing
Published: 1/1/1997
Author: Egon Marx
Abstract: The single integral equation method is applied to the scattering of electromagnetic waves by particles in a layer on top of a substrate. A second layer on top of the first one can have indentations.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820851

949. Measurement Comparison of Stylus Radii
Topic: Manufacturing
Published: 1/1/1997
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Three methods were used for measuring the radii of the same stylus of our stylus instrument. The measurement results were compared and showed good agreement. Using razor blade tracing, the stylus radius was measured as r=1.60um with an expanded uncer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820877

950. New NIST-Certified Small Scale Pitch Standard
Topic: Manufacturing
Published: 1/1/1997
Author: James Edward Potzick
Abstract: The National Institute of Standards and Technology is developing a dimensional pitch standard covering the range 1 ?m to 10 mm, intended for the calibration of microscope magnification and dimensional metrology instrument scales. While NIST has long ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820869



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