NIST logo

Publications Portal

You searched on:
Topic Area: Manufacturing

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 911 to 920 of 1000 records.
Resort by: Date / Title


911. Telepresence: A New Paradigm for Industrial and Scientific Collaboration
Topic: Manufacturing
Published: 6/1/1999
Authors: Michael T Postek, Marylyn H. Bennett, N J Zaluzec
Abstract: The successful development of a collaboratory for Telepresence Microscopy (TPM) provides an important new tool to promote technology transfer in the areas of measurement technology. NIST and Texas Instruments (TI), under the auspices of the National ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820945

912. Toward Nanometer Accuracy Measurements
Topic: Manufacturing
Published: 6/1/1999
Authors: John A Kramar, E Amatucci, David E. Gilsinn, Jay Shi Jun, William B. Penzes, Fredric Scire, E Clayton Teague, John S Villarrubia
Abstract: We at NIST are building a metrology instrument called the Molecular Measuring Machine (MMM) with the goal of performing 2D point-to-point measurements with one nanometer accuracy cover a 50 mm by 50 mm area. The instrument combines a scanning tunneli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820933

913. Two-Dimensional Calibration Artifact and Measurement Methodology
Topic: Manufacturing
Published: 6/1/1999
Authors: Richard M Silver, Theodore D Doiron, William B. Penzes, S Fox, Edward A Kornegay, S Rathjen, M Takac, D Owen
Abstract: In this paper, we describe our design and the manufacturing of a two-dimensional grid artifact of chrome on quartz on a 6 inch by 6 inch by .250 glass blank. The design has been agreed upon by a number of SEMI participants working on a two-dimensiona ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820948

914. High Accuracy High Speed Gaussian Filter in Surface Metrology
Topic: Manufacturing
Published: 5/31/1999
Authors: Y B Yuan, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Both (1+x^2)^(-n) and (sin x/x)^n functions are very close to the Gaussian distribution for large value of n. Based on these functions, two new algorithms are developed for designing high accuracy and high speed recursive type Gaussian digital filter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820955

915. Measurements and Predictions of Light Scattering by Coatings
Topic: Manufacturing
Published: 5/1/1999
Authors: Theodore Vincent Vorburger, Egon Marx, M E. McKnight, Maria E Nadal, P Y. Barnes, Alan K Thompson, Michael A Galler, Fern Y Hunt, Mark R VanLandingham
Abstract: We show comparisons between calculations and measurements of angle-resolved light scattering distributions from clear dielectric, isotropic coatings. The calculated distributions are derived from topography measurements performed with scanning white ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822523

916. The NIST Length Scale Interferometer
Topic: Manufacturing
Published: 5/1/1999
Authors: John S Beers, William B. Penzes
Abstract: The National Institute of Standards and Technology (NIST) interferometer for measuring graduated length scales has been in use since 1965. It was developed in response to the redefinition of the meter in 1960 from the prototype platinum-iridium bar t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820924

917. Improving Kinematic Touch Trigger Probe Performance
Topic: Manufacturing
Published: 4/1/1999
Authors: Steven David Phillips, William Tyler Estler
Abstract: Kinematic touch trigger probes are widely used on CMMs. This article gives CMM users advice on how to minimize the systematic errors associated with this class of probes.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820943

918. Noise Averaging and Measurement Resolution (or A Little Noise is a Good Thing)
Topic: Manufacturing
Published: 4/1/1999
Author: James Edward Potzick
Abstract: When a continuous quantity is measured with a digital instrument or digitized for further processing, a measurement uncertainty component is incurred from quantization of the continuous variable. This uncertainty can be reduced by oversampling and a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823107

919. A Strategy for Faster Blind Reconstruction of Tip Geometry for Scanned Probe Microscopy
Topic: Manufacturing
Published: 3/1/1999
Author: John S Villarrubia
Abstract: In scanned probe microscopy, it is necessary to know the tip's geometry in order to correct image distortions due to its finite size. Heretofore, methods have focused upon determining the tip geometry by erosion of a tip characterizer of known geomet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822529

920. Detector Strategy for the Scanning Electron Microscope Inspection and Metrology of Semiconductor Wafers
Topic: Manufacturing
Published: 3/1/1999
Authors: O C Wells, Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821794



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series