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Topic Area: Information Technology
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Displaying records 61 to 70 of 876 records.
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61.
A Technical Overview of the Information Resource Dictionary System
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 85-3164
Topic: Information Technology
Published: 3/1/1985
Authors: Alan Howard Goldfine, P A Koening
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900053
62.
A Technical Overview of the Information Resource Dictionary System (Second Edition)
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 88-3700
Topic: Information Technology
Published: 2/1/1988
Authors: Alan Howard Goldfine, P Konig
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900528
63.
A Technique for measuring radial error motions of ultra-high-speed miniature
spindles used for micromachining
Topic: Information Technology
Published: 8/5/2011
Authors: Prashanth Anandan, Abhinandan Tulsian, M Alkan Donmez, Burak Ozdoganlar
Abstract: Ultra-high-speed (UHS) miniature spindles are widely used for mechanical micromachining processes, such as micromilling and microdrilling, as well as for precision machining processes. The accuracy of features created in those processes depends on th
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907686
64.
A Testability-Based Assertion Placement Tool for Object-Oriented Software,
Report Number: 98-735
Topic: Information Technology
Published: 1/1/1998
Authors: D Wallace, J Voas, M Schmid, M Schatz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900830
65.
A Time Synchronization Testbed to Define and Standardize Real-Time Model-Based Control Capabilities in Semiconductor Manufacturing
Topic: Information Technology
Published: 9/28/2009
Authors: Deepak Sharma, Dhananjay Anand, YaShian Li-Baboud, James Moyne
Abstract: Shrinking process tolerances due to decreasing device
sizes and increasing chip complexity in semiconductor
manufacturing are motivating efforts to improve methods for
real-time networked process control. Prior work shows that the
lack of precise
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903792
66.
A User Profile for Researchers Studying Objects: Implications for Computer Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5415
Topic: Information Technology
Published: 4/1/1994
Author: J A Moline
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900714
67.
A User Study: Informational Needs of Remote National Archives and Records Administration Customers
Series: Special Publication (NIST SP)
Report Number: 500-221
Topic: Information Technology
Published: 11/1/1994
Authors: J A Moline, S C. Otto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900468
68.
A VIRTUAL MACHINE TOOL FOR THE EVALUATION OF STANDARDIZED 5-AXIS PERFORMANCE TESTS
Topic: Information Technology
Published: 10/26/2012
Authors: Ronnie R Fesperman, Shawn P Moylan, M Alkan Donmez
Abstract: Standards committees are actively working to develop standard test methods for the performance evaluation of 5-axis machining centers through the direct and indirect measurement of simultaneous motions of all five axes [1-2]. However, the compound ef
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911899
69.
A comparison of methods for Non-rigid 3D shape retrieval
Topic: Information Technology
Published: 9/26/2012
Authors: Zhouhui Lian, Afzal A Godil
Abstract: Non-rigid 3D shape retrieval has become an active and important research topic in content-based 3D object retrieval. The aim
of this paper is to measure and compare the performance of state-of-the-art methods for non-rigid 3D shape retrieval. The pa
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911880
70.
ACE Website
Topic: Information Technology
Published: 9/1/2000
Author: John S Garofolo
Abstract: This paper demonstrates that, for large-scale tests, the match and non-match similarity scores have no specific underlying distribution function. The forms of these distribution functions require a nonparametric approach for the analysis of the fing
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150292