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Publications Portal

You searched on: Topic Area: Information Technology Sorted by: title

Displaying records 61 to 70 of 735 records.
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61. Advancing Manufacturing Research Through Competitions
Topic: Information Technology
Published: 4/17/2009
Authors: Stephen B. Balakirsky, Rajmohan Madhavan
Abstract: Competitions provide a technique for building interest and collaboration in targeted research areas. This paper will present a new competition that aims to increase collaboration amongst Universities, automation end-users, and automation manufacturer ...

62. Advancing Security Automation and Standardization: Revised Technical Specifications Issued for the Security Content Automation Protocol (SCAP)
Series: ITL Bulletin
Topic: Information Technology
Published: 1/24/2012
Author: Shirley M. Radack
Abstract: This bulletin summarizes the information presented in NIST Special Publication (SP) 800-126 Rev. 2, The Technical Specification for the Security Content Automation Protocol (SCAP): SCAP Version 1.2. This publication was written by David Waltermire an ...

63. Aggregating CVSS Base Scores for Semantics-Rich Network Security Metrics
Topic: Information Technology
Published: 10/11/2012
Authors: Pengsu Cheng, Lingyu Wang, Sushil Jajodia, Anoop Singhal
Abstract: A network security metric is desirable in evaluating the effectiveness of security solutions in distributed systems. Aggregating CVSS scores of individual vulnerabilities provides a practical approach to network security metric. However, existing app ...

64. Air-Java: Networking for Smart Spaces
Topic: Information Technology
Published: 10/1/1999
Author: Kevin L Mills
Abstract: Increasingly people work and live on the move. To support this mobile lifestyle, especially as work becomes more intensely information-based, companies are producing various portable and embedded information devices. Concurrently, some interesting ...

65. An Additive Manufacturing Test Artifact
Series: Journal of Research (NIST JRES)
Report Number: 119.017
Topic: Information Technology
Published: 10/23/2014
Authors: Shawn P Moylan, John A. Slotwinski, A L Cooke, Kevin K Jurrens, M Alkan Donmez
Abstract: We propose a test artifact, intended for standardization, for the purpose of evaluating the performance of additive manufacturing (AM) systems. A thorough analysis of previously proposed AM test artifacts as well as experience with machining tes ...

66. An Analysis of ANSI ASC X12 and UN/EDIFACT Electronic Data Interchange (EDI) Standards
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5631
Topic: Information Technology
Published: 4/1/1995
Authors: R Aronoff, Karen M. Hsing

67. An Analytic Study of a Shared Device Among Independent Computing Systems
Series: Special Publication (NIST SP)
Report Number: 500-69
Topic: Information Technology
Published: 11/1/1980
Author: Alan Mink

68. An Empirical Comparison of Combinatorial and Random Testing
Topic: Information Technology
Published: 4/1/2014
Authors: Laleh Ghandehari, Jacek Czerwonka, Yu Lei, Soheil Shafiee, Raghu N Kacker, David R Kuhn
Abstract: Some conflicting results have been reported on the comparison between t-way combinatorial testing and random testing. In this paper, we report a new study that applies t-way and random testing to the Siemens suite. In particular, we investigate the s ...

69. An Empirical Study of a Vulnerability Metric Aggregation Method
Topic: Information Technology
Published: 8/18/2011
Authors: Su Zhang, Xinming Ou, Anoop Singhal, John Homer
Abstract: Quantifying security risk is an important and yet difficult task in enterprise network risk management, critical for proactive mission assurance. Even though metrics exist for individual vulnerabilities, there is currently no standard way of aggregat ...

70. An Experiment in Software Acceptance Testing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 86-3407
Topic: Information Technology
Published: 7/1/1986
Author: D Wallace

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
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