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Displaying records 11 to 15.
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11. Nanoscale interfacial friction and adhesion on supported versus suspended monolayer and multilayer graphene
Topic: Surface Physics
Published: 1/8/2013
Authors: Zhao Z. Deng, Nikolai Nikolayevich Klimov, Santiago Solares, Teng Li, Hua Xu, Rachel J. Cannara
Abstract: Using atomic force microscopy (AFM), we study the adhesive, frictional and elastic properties of supported and suspended graphene exfoliated onto pit-patterned silicon dioxide-on-silicon (SiO2/Si) substrates. In spite of the greater adhesive force b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911777

12. Observing the Quantization of Zero Mass Carriers in Graphene
Topic: Surface Physics
Published: 5/15/2009
Authors: Joseph A Stroscio, Gregory M. Rutter, D. L. Miller, K. Kubista, W. A. de Heer, Phillip N. First
Abstract: Application of a magnetic field to conductors causes the charge carriers to circulate in cyclotron orbits with quantized energies called Landau levels (LLs). These are equally spaced in normal metals and two-dimensional electron gases. In graphene, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901095

13. Optics contamination studies in support of high-throughput EUV lithography tools
Topic: Surface Physics
Published: 3/25/2011
Authors: Shannon Bradley Hill, Fardina Asikin, Lee J Richter, Steven E Grantham, Charles S Tarrio, Thomas B Lucatorto, Sergiy Yulin, Mark Schurmann, Viatcheslav Nesterenko, Torsten Feigl
Abstract: We report on optics contamination rates induced by exposure to broad-bandwidth, high-intensity EUV radiation peaked near 8 nm in a new beamline at the NIST synchrotron. The peak intensity of 50 mW/mm2 allows extension of previous investigations of c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908291

14. Real-time measurements of plasma photoresist modifications: The role of plasma vacuum ultraviolet radiation and ions
Topic: Surface Physics
Published: 5/23/2012
Authors: Weilnboeck Florian, Nirav Kumar, Gottlieb Oehrlein, Ting-Ying Chung, D Graves, Mingqi Li, Eric A. Hudson, Eric C Benck
Abstract: Plasma-induced roughness development of photoresist (PR) can be due to synergistic interactions of surface modifications introduced by ions, bulk material modifications by ultraviolet (UV)/vacuum ultraviolet (VUV) radiation, and increased temperature ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910071

15. Vibrationally-Resolved Sum-Frequency Generation With Broad Bandwidth Infrared Pulses
Topic: Surface Physics
Published: 10/15/1998
Authors: Lee J Richter, T Petralli-Mallow, John C. Stephenson
Abstract: We present a novel procedure for vibrationally-resolved sum-frequency generation (SFG) in which a broad-bandwidth IR pulse is mixed with a narrow-bandwidth visible pulse. The resultant SFG spectrum is dispersed with a spectrograph and detected in pa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831071



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