NIST logo

Publications Portal

You searched on:
Topic Area: Environment/Climate

Displaying records 301 to 310 of 446 records.
Resort by: Date / Title

301. NIST/NOAA NS&T/EPA EMAP Intercomparison Exercise Program for Organic Contaminants in the Marine Environment: Description and Results of 1998 Organic Intercomparison Exercises Mussel Tissue IX and Marine Sediment VIII
Topic: Environment/Climate
Published: 6/1/1999
Authors: Michele M Schantz, Reenie May Parris, Stephen A Wise

302. Size Effect for Specific Energy in Grinding of Silicon Nitride
Topic: Environment/Climate
Published: 4/1/1999
Authors: T W. Hwang, Christopher J. Evans, S Malkin
Abstract: An investigation is reported of the ?size effect? for specific energy in grinding of silicon nitride. Experimental measurements over a wide range of operating parameters using two different grit size diamond wheels show an increase in specific energy ...

303. Analysis of Urban Particulate Standard Reference Materials for the Determination of Chlorinated Organic Contaminants and Additional Chemical and Physical Properties
Topic: Environment/Climate
Published: 2/1/1999
Authors: Dianne L Poster, Michele M Schantz, Stephen A Wise, M. G. Vangel

304. NIST's support of rapid prototyping standards
Topic: Environment/Climate
Published: 2/1/1999
Author: Kevin K Jurrens
Abstract: Recent activities and interactions with industry have suggested to the National Institute of Standards and Technology (NIST) that formal standards for rapid prototyping could stimulate the growth and advancement of the technologies involved. Standard ...

305. Acoustic Emission Monitoring of High Speed Grinding of Silicon Nitride
Topic: Environment/Climate
Published: 1/1/1999
Authors: T W. Hwang, Eric Paul Whitenton, Nelson N. Hsu, Gerald V. Blessing, Christopher J. Evans
Abstract: Acoustic emission monitoring of a machining process offers real-time sensory input which could provide tool condition and part quality information that is critical to effective process control. But the choice of sensor, its placement, and how to proc ...

306. High Speed Grinding of Silicon Nitride with Electroplated Diamond Wheels, II. Wheel Topography and Grinding Mechanisms
Topic: Environment/Climate
Published: 1/1/1999
Authors: T W. Hwang, S Malkin, Christopher J. Evans
Abstract: This is the second in a series of two papers concerned with high speed grinding of silicon nitride with electroplated diamond wheels. In a companion paper, it was shown that grinding of silicon nitride is accompanied by dulling of the abrasive grains ...

307. Machining 1999
Topic: Environment/Climate
Published: 1/1/1999
Authors: Matthew A. Davies, S Smith

308. Measuring the Geometric Errors of a Hexapod Machine Tool
Topic: Environment/Climate
Published: 1/1/1999
Author: Johannes A Soons
Abstract: This paper describes procedures to measure the geometric errors of parallel kinematic machines with a Gough configuration. The procedures are applied to estimate and compensate the errors of a prototype hexapod milling machine.

309. On the bifurcation from continuous to segmented chip formation in metal cutting
Topic: Environment/Climate
Published: 1/1/1999
Authors: Timothy J Burns, Christopher J. Evans, Matthew A. Davies

310. Structured, textured or engineered surfaces
Topic: Environment/Climate
Published: 1/1/1999
Authors: Christopher J. Evans, James B Bryan
Abstract: Fine scale periodic structures offer designers additional freedom to create novel functions or combinations of functions. This emerging field of structured surfaces is poorly defined. This paper attempts to define structured surfaces, and then to p ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series