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Topic Area: Optics
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Displaying records 41 to 50 of 71 records.
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41. Introduction to special issue on single-photon technologies
Topic: Optics
Published: 3/10/2011
Authors: Alan L Migdall, Sergey V Polyakov, Jingyun Fan, Ivo Pietro Degiovanni, Jessica Cheung
Abstract: This special issue accompanies the 4th international conference on single-photon technologies held at the National Institute of Standards and Technology (NIST) Boulder in November 2009. This community has met every two years at national metrology ins ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907536

42. Iron Optical Constants and Reflectance Spectroscopy of Planetary Surfacers
Topic: Optics
Published: 3/1/2010
Authors: David Blewett, Nhan V Nguyen, Oleg A Kirillov, Samuel Lawrence
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907161

43. Molecular spectroscopy with frequency combs
Topic: Optics
Published: 3/1/2010
Author: Ian R Coddington
Abstract: Pulsed femtosecond frequency combs are rapidly developing as a powerful spectroscopic tool. As a spectroscopic source stabilized frequency combs potentially offer broad spectral coverage, near perfect frequency accuracy, low timing jitter and broadb ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904602

44. Mueller matrix bidirectional reflectance distribution function measurements and modeling of diffuse reflectance standards
Topic: Optics
Published: 4/20/2011
Authors: Thomas Avery Germer, Heather J Patrick
Abstract: We measure the Mueller matrix bidirectional reflectance distribution function (BRDF) of pressed and sintered powdered polytetrafluoroethylene (PTFE) reflectance standards for an incident angle of 75°. Rotationally averaged Mueller matrices from the m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909321

45. Mueller matrix ellipsometry of artificial non-periodic line edge roughness in presence of finite numerical aperture
Topic: Optics
Published: 4/20/2011
Authors: Thomas Avery Germer, Martin Foldyna, Brent Bergner
Abstract: We used azimuthally-resolved spectroscopic Mueller matrix ellipsometry to study a periodic silicon line structure with and without artificially-generated line edge roughness (LER). The unperturbed, reference grating profile was determined from multip ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908372

46. Multiple-time-scale blinking in InAs quantum dot single photon sources
Topic: Optics
Published: 4/16/2014
Authors: Marcelo Ishihara Davanco, C S Hellberg, Serkan Ates, Antonio Badolato, Kartik A Srinivasan
Abstract: We use photon correlation measurements to study blinking in single, epitaxially-grown selfassembled InAs quantum dots situated in circular Bragg grating and microdisk cavities. The normalized second-order correlation function g(2)(t) is studied ac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913943

47. Nonthermal continuum toward Sagittarius B2(N-LMH)
Topic: Optics
Published: 4/11/2007
Authors: J M Hollis, P R Jewell, A Remijan, Francis John Lovas
Abstract: An analysis of continuum antenna temperatures observed in theGBTspectrometer bandpasses is presented for observations toward Sgr B2(N-LMH). Since 2004, we have identified four new prebiotic molecules toward this source by means of rotational transiti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841044

48. Optimal Laser Scan Path for Localizing a Fluorescent Particle in Two or Three Dimensions
Topic: Optics
Published: 7/16/2012
Authors: Gregg M. Gallatin, Andrew J. Berglund
Abstract: Localizing a fluorescent particle by scanning a focused laser in its vicinity and analyzing the detected photon stream provides real-time information for a modern class of feedback control systems for particle tracking and trapping. We present a sim ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910609

49. Phase sensitive parametric optical metrology: Exploring the limits of 3-dimensional optical metrology
Topic: Optics
Published: 4/4/2012
Authors: Richard M Silver, Jing Qin, Bryan M Barnes, Hui Zhou, Ronald G Dixson, Francois R. Goasmat
Abstract: There has been much recent work in developing advanced optical metrology applications that use imaging optics for critical dimension measurements, defect detection and for potential use with in-die metrology applications. Sensitivity to nanometer sca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911039

50. Polarized Optical Scattering Signatures from Biological Materials
Topic: Optics
Published: 1/11/2010
Authors: W. E. Martin, E. Hesse, J. H. Hough, William Sparks, C. S. Cockell, Z. Ulanowski, Thomas Avery Germer, B. Kaye
Abstract: The polarization of laser light backscattered from biological samples has been measured over the wavelength range 350 to 850nm. Incident circular, linearly polarized, and unpolarized light produces significant spectrally prominent scattered polari ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906031



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