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Topic Area: Optics
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Displaying records 11 to 20 of 71 records.
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11. Common Reference Channels for Metrological Comparability
Topic: Optics
Published: 12/20/2010
Authors: Ruediger Kessel, Tim Hewison
Abstract: In this article we discuss the effect of the choice of reference during calibration on later use of the calibrated results, and how a reference should be chosen to support later use of the data. Starting from the concept of metrological comparability ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907541

12. Defining Common Reference Channels for Geostationary Infrared Imagers
Topic: Optics
Published: 12/31/2010
Authors: Tim Hewison, Ruediger Kessel
Abstract: This article follows up the theoretical considerations presented above with an example applied to the infrared channels of geostationary imagers. The uncertainties, u(deltaLr), introduced by the process of spectral conversion to Common Reference Chan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907785

13. Demonstration of Superluminal Images
Topic: Optics
Published: 6/19/2012
Authors: Ryan Thomas Glasser, Ulrich Vogl, Paul D Lett
Abstract: Optical pulse propagation with group velocities larger than the speed of light in vacuum, c, or negative, have been demonstrated theoretically and experimentally in a variety of systems [1‹5]. The anomalous dispersion required for generating ,fastŠ l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910700

14. Developing an Uncertainty Analysis for Optical Scatterometry
Topic: Optics
Published: 8/3/2009
Authors: Thomas Avery Germer, Heather J Patrick, Richard M Silver, Benjamin Bunday
Abstract: This article describes how an uncertainty analysis may be performed on a scatterometry measurement. A method is outlined for propagating uncertainties through a least-squares regression. The method includes the propagation of the measurement noise as ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901617

15. Differential matrices for depolarizing media
Topic: Optics
Published: 3/1/2012
Author: Thomas Avery Germer
Abstract: The evolution of a Stokes vector through depolarizing media is considered. A general form for the differential matrix is derived that is appropriate in the presence of depolarization, and is parameterized in a manner that ensures that it yields, upon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909647

16. Direct Experimental Observation of the Goos Hanchen Shift
Topic: Optics
Published: 4/9/2008
Authors: H G L Schwefel, W Kohler, Z Lu, Jingyun Fan, L Wang
Abstract: We report a precise direct measurement of the Goos-Hanchen (GH) shift after one reflection off a dielectric interface coated with periodic metal stripes. The spacial displacement of the shift is determined by image analysis. A maximal absolute shift ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842439

17. Dual-comb based measurement of frequency agile lasers.
Topic: Optics
Published: 5/1/2011
Authors: Ian R Coddington, Fabrizio Raphael Giorgetta, Esther Baumann, William C Swann, Nathan Reynolds Newbury
Abstract: Properly stabilized, frequency combs form high accuracy references across much of the optical spectrum. Here we employ dual frequency combs to harness this accuracy for fast and high resolution measurements of swept CW sources.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907442

18. Effect of Bandwidth and Numerical Aperture in Optical Scatterometry
Topic: Optics
Published: 3/1/2010
Authors: Thomas Avery Germer, Heather J Patrick
Abstract: We consider the effects of finite spectral bandwidth and numerical aperture in scatterometry measurements and discuss efficient integration methods based upon Gaussian quadrature in one dimension (for spectral bandwidth averaging) and two dimensions ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905013

19. Effect of Line Width Roughness on Optical Scatterometry Measurements
Topic: Optics
Published: 4/6/2009
Authors: Brent C. Bergner, Thomas Avery Germer, Thomas Suleski
Abstract: Line width roughness (LWR) has been identified as a potential source of uncertainty in scatterometry measurements, and characterizing its effect is required to improve the method s accuracy and to make measurements traceable. In this work, we extend ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901895

20. Effect of Surface Modes on Photon Propagation through Dielectric Bandgaps
Topic: Optics
Published: 10/28/2009
Authors: Natalia Malkova, Sergey V Polyakov, Alan L Migdall, Garnett W Bryant
Abstract: We investigate the Hartman saturation effect of photons traveling through barriers created by bandgaps of multilayer stacks. In particular, we investigate theoretically the recently observed jumps in photon transversal times due to adding a single l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902593



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