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You searched on: Topic Area: Optics Sorted by: title

Displaying records 11 to 20 of 71 records.
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11. Common Reference Channels for Metrological Comparability
Topic: Optics
Published: 12/20/2010
Authors: Ruediger Kessel, Tim Hewison
Abstract: In this article we discuss the effect of the choice of reference during calibration on later use of the calibrated results, and how a reference should be chosen to support later use of the data. Starting from the concept of metrological comparability ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907541

12. Compact X-ray and Extreme-Ultraviolet Light Sources
Topic: Optics
Published: 7/10/2015
Authors: Lahsen Assoufid, Uwe Arp, Patrick Naulleau, Sandra Biedron , William Graves
Abstract: Bringing the brightness and power of vast synchrotron and free-electron laser sources to the scale of the lab and clinic marks an important next frontier,and could transform the landscape of X-ray science and technology.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918616

13. Developing Microwave Photonic Temperature Sensors
Topic: Optics
Published: 7/9/2015
Authors: John S Quintavalle, Bernard J Filla, Gregory F Strouse, Zeeshan Ahmed
Abstract: In recent years there has been considerable interest in exploiting the temperature dependence of sapphire whispering gallery mode frequency to develop a mechanically stable, high accuracy temperature sensor. Disk-resonator-based devices have been dem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917548

14. Differential matrices for depolarizing media
Topic: Optics
Published: 3/1/2012
Author: Thomas Avery Germer
Abstract: The evolution of a Stokes vector through depolarizing media is considered. A general form for the differential matrix is derived that is appropriate in the presence of depolarization, and is parameterized in a manner that ensures that it yields, upon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909647

15. Diffraction limited focusing and directing of gap plasmons by a metal-dielectric-metal lens
Topic: Optics
Published: 8/24/2015
Authors: Brian Scott Dennis, David Czaplewski, Michael Haftel, Daniel Lopez, Girsh Blumberg, Vladimir A Aksyuk
Abstract: Passive optical elements can play key roles in photonic applications such as plasmonic integrated circuits. Here we experimentally demonstrate passive gap-plasmon focusing and directing in two-dimensions. This is accomplished using a high numerical-a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918737

16. Digital Phantoms Generated by Spectral and Spatial Light Modulators
Topic: Optics
Published: 10/21/2015
Authors: Bonghwan B. Chon, Fuyuki Tokumasu, Ji Y. Lee, David W Allen, Joseph Paul Rice, Jeeseong Hwang
Abstract: A hyperspectral image projector (HIP) based on liquid crystal on silicon (LCoS) spatial light modulators (SLMs) is explained and demonstrated to generate 3D spectral data cubes. The HIP- constructed data cubes are 3D images of the spatial distribu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918549

17. Dimensional Metrology of Lab on a Chip Internal Structures: a Comparison of Optical Coherence Tomography with Coherence Fluorescence Microscopy
Topic: Optics
Published: 4/8/2015
Authors: Darwin R Reyes-Hernandez, Michael W Halter, Jeeseong Hwang
Abstract: The characterization of internal structures in a polymeric device, specifically of a final product, will require a different set of metrology techniques than those traditionally use in the characterization of microelectronic devices. OCT is relati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912533

18. Effect of Surface Modes on Photon Propagation through Dielectric Bandgaps
Topic: Optics
Published: 10/28/2009
Authors: Natalia Malkova, Sergey V Polyakov, Alan L Migdall, Garnett W Bryant
Abstract: We investigate the Hartman saturation effect of photons traveling through barriers created by bandgaps of multilayer stacks. In particular, we investigate theoretically the recently observed jumps in photon transversal times due to adding a single l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902593

19. Effective medium approximations for modeling optical reflectance from gratings with rough edges
Topic: Optics
Published: 5/1/2010
Authors: Brent C. Bergner, Thomas Avery Germer, Thomas Suleski
Abstract: Line edge roughness (LER) has been identified as a potential source of uncertainty in optical scatterometry measurements. Characterizing the effect of LER on optical scatterometry signals is required to assess measurement uncertainty. However, rigor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903990

20. Effects of Roughness on Scatterometry Signatures
Topic: Optics
Published: 5/26/2011
Authors: Martin Foldyna, Thomas Avery Germer, Brent Bergner
Abstract: We used azimuthally-resolved spectroscopic Mueller matrix ellipsometry to study a periodic silicon line structure with and without artificially-generated line edge roughness (LER). Grating profiles were determined from multiple azimuthal configuratio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908805



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