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Topic Area: Optics
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Displaying records 1 to 10 of 79 records.
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1. A circular dielectric grating for vertical extraction of single quantum dot emission
Topic: Optics
Published: 7/25/2011
Authors: Marcelo Ishihara Davanco, Matthew T. Rakher, Dieter Schuh, Antonio Badolato, Kartik A Srinivasan
Abstract: We demonstrate a suspended circular grating composed of partially etched annular trenches in a thin GaAs membrane, designed for e±cient and moderately broadband ( approx. 5 nm) extraction of emission from single InAs quantum dots. Simulations indic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908236

2. A compact and robust method for full Stokes spectropolarimetry
Topic: Optics
Published: 8/1/2012
Authors: William Sparks, Thomas Avery Germer, John MacKenty, Frans Snik
Abstract: We present an approach to spectropolarimetry which requires neither moving parts nor time dependent modulation, and which o ers the prospect of achieving high sensitivity. The concept, which is one of those generically known as channeled polarimetry, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911231

3. A synchrotron beamline for extreme-ultraviolet photoresist testing
Topic: Optics
Published: 9/30/2011
Authors: Charles S Tarrio, Steven E Grantham, Shannon Bradley Hill, Nadir S. Faradzhev, Lee J Richter, Chester Knurek, Thomas B Lucatorto
Abstract: Before being used in an extreme-ultraviolet (EUV) scanner, photoresists must first be evaluated for sensitivity and tested to ensure that they will not contaminate the scanner optics. The new NIST facility described here provides data on the contami ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908231

4. Absolute interferometric tests of spherical surfaces based on rotational and translational shears
Topic: Optics
Published: 9/13/2012
Authors: Johannes A Soons, Ulf Griesmann
Abstract: Traceability of interferometric form measurements requires characterization of the reference wavefront. We investigate absolute tests for spherical surfaces where the form errors of both reference and test surface are estimated by minimizing the diff ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911749

5. Absolute pulse energy measurements of soft x-rays at the Linac Coherent Light Source
Topic: Optics
Published: 8/25/2014
Authors: Uwe Arp, Alexander Sorokin, Ulf Jastrow, Pavle Jurani?, Svea Kreis, Mathias Richter, Yiping Feng, Dennis Nordlund, Kai Tiedtke, Philip Heimann, Bob Nagler, Hae Ja Lee, Stephanie Mack, Marco Cammarata, Oleg Krupin, Marc Messerschmidt, Michael Holmes , Michael Rowen, William Schlotter, Stefan Moeller, Joshua Turner
Abstract: This paper reports novel measurements of x-ray optical radiation on an absolute scale from a recently developed source of radiation generated in the soft x-ray regime of a free electron laser. We give a brief description of the physics behind the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916074

6. Alignment of Fiducial Marks in a Tomographic Tilt Series with an Unknown Rotation Axis
Topic: Optics
Published: 4/1/2007
Authors: Zachary H Levine, Peter Volkovitsky, Howard Hung
Abstract: Alignment for tomography using a transmission electron microscopy frequently uses colloidal gold particles as fiducial reference marks. Typically, there is an implicit assumption that the tilt axis of the tomographic series is orthogonal to the beam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906668

7. All-angle negative refraction and active flat lensing of ultraviolet light
Topic: Optics
Published: 5/22/2013
Authors: Ting Xu, Amit Kumar Agrawal, Maxim Abashin, Kenneth John Chau, Henri J Lezec
Abstract: The ability of a left-handed medium to sustain backwards electromagnetic waves leads to counter-intuitive phenomena such as negative refraction. We report the experimental implementation of a three-dimensional negative-index metamaterial operating at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911161

8. An algorithm for finding clusters with a known distribution and its application to photon-number resolution using a superconducting transition-edge sensor
Topic: Optics
Published: 7/20/2012
Authors: Zachary H Levine, Thomas Gerrits, Alan L Migdall, Daniel Victor Samarov, Brice R. Calkins, Adriana Eleni Lita, Sae Woo Nam
Abstract: Improving photon-number resolution of single-photon sensitive detectors is important for many applications, as is extending the range of such detectors. Here we seek improved resolution for a particular Superconducting Transition-Edge Sensor (TES) t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911195

9. Analytic determination of optimal projector lens design requirements for pixilated projectors used to test pixilated imaging sensors
Topic: Optics
Published: 7/25/2013
Author: Joseph Paul Rice
Abstract: A model is described for the problem of optimally projecting a pixellated light source onto a pixellated imaging sensor, in the context that the projected source is used for performance testing of the sensor. The model can be used, for example, to co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913651

10. Angle-dependent infrared reflectance measurements in support of VIIRS
Topic: Optics
Published: 8/14/2008
Authors: Simon Grant Kaplan, Leonard M Hanssen, Enrique J. Iglesias
Abstract: We have developed a goniometric reflectometer using a Fourier-transform infrared (FTIR) spectrometer source for polarized reflectance measurements from 1 um to 20 um wavelength at angles of incidence from 10° to 80°, with an incident beam geometry of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842529



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