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Displaying records 31 to 40 of 41 records.
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31. Sensitivity Comparison of Mx and Frequency Modulated Bell-Bloom Cs Magnetometers in a Micro-Fabricated Cell
Topic: Optical Physics
Published: 2/1/2010
Authors: Ricardo Jimenez Martinez, William C. Griffith, Ying-ju Wang, Svenja A Knappe, John E Kitching, Ken Smith, Mark Prouty
Abstract: We compare the sensitivity performance of two optically pumped atomic magnetometers based on the Mx and frequency-modulated Bell-Bloom configurations. The Cs magnetometers are implemented using a millimeter-scale microfabricated vapor cell in a confi ...

32. Progress Toward Corrugated Feed Horn Arrays in Silicon
Topic: Optical Physics
Published: 12/16/2009
Authors: Joseph Wright Britton, Ki W. Yoon, James A Beall, Daniel Thomas Becker, Hsiao-Mei Cho, Gene C Hilton, Michael D. Niemack, Kent D Irwin
Abstract: We are developing monolithic arrays of corrugated feed horns fabricated in silicon for dual-polarization single mode operation at 90, 145 and 220 GHz. The arrays consist of hundreds of platelet feed horns assembled from gold coated stacks of micromac ...

33. Quasi-phasematched Second Harmonic Generation in GaAs Microdisks
Topic: Optical Physics
Published: 11/15/2009
Authors: Paulina S Kuo, W Fang, Glenn Scott Solomon
Abstract: We discuss design and tuning of second-harmonic generation in GaAs microdisks. Quasi-phasematching can be achieved in the microdisk geometry without external domain inversions, but efficient nonlinear optical mixing requires that all waves be resonan ...

34. Uncooled, Millimeter-Scale Atomic Magnetometers with Femtotesla Sensitivity
Topic: Optical Physics
Published: 10/26/2009
Authors: John E Kitching, Svenja A Knappe, William C. Griffith, Jan Preusser, V Gerginov, Peter D. Schwindt, Vishal Shah, Ricardo Jimenez Martinez
Abstract: We summarize recent results at NIST to develop high-performance yet highly miniaturized magnetic sensors based on atomic vapors confined in microfabricated alkali vapor cells. These sensors currently achieve sensitivities in the range of a few tens o ...

35. Origin of Universal Optical Conductivity and Optical Stacking Sequence Identification in Multilayer Graphene
Topic: Optical Physics
Published: 8/6/2009
Authors: Hongki Min, Allan H. MacDonald
Abstract: We predict that the optical conductivity of normal graphene multilayers is close to {sigma}^duni^=({pi}/2) e^u2^/h per layer over a broad range of frequencies. The origin of this behavior is an emergent chiral symmetry which is present in normal N-l ...

36. Supercontinuum Sources for Metrology
Topic: Optical Physics
Published: 6/2/2009
Authors: John Taylor Woodward IV, Allan W. Smith, Colleen Alana Jenkins, Chungsan Lin, Steven W Brown, Keith R Lykke
Abstract: Supercontinuum (SC) sources are novel laser-based sources that generate a broad, white-light continuum in single mode photonic crystal fibers. Currently, up to 6 W of optical power is available, spanning the spectral range from 460 nm to 2500 nm. A ...

37. A deep-UV optical frequency comb at 205 nm
Topic: Optical Physics
Published: 5/25/2009
Authors: Scott A Diddams, E Peters, P Fendel, S Reinhardt, T W Hansch, T Udem
Abstract: By frequency quadrupling a picosecond pulse train from a Ti:sapphire laser at 820 nm we generate a frequency comb at 205 nm with nearly bandwidth-limited pulses. The nonlinear frequency conversion is accomplished by two successive frequency doubling ...

38. Scatterfield Optical Imaging for sub-10 nm Dimensional Metrology
Topic: Optical Physics
Published: 1/1/2009
Author: Richard M Silver
Abstract: Recent developments in optical microscopy promise to advance optical metrology and imaging to unprecedented levels through theoretical and experimental development of a new measurement technique called "scatterfield optical imaging". ". Current met ...

39. Computational Parameters in Simulation of Microscope Images
Topic: Optical Physics
Published: 11/28/2008
Authors: Egon Marx, James Edward Potzick
Abstract: The simulation of microscope images computed from scattered fields determined using integral equations depend on a number of parameters that are not related to the scatterer or to the microscope but are choices made for the computation method. The ...

40. Integral Equations for 3-D Scattering: Finite Strip on a Substrate
Topic: Optical Physics
Published: 11/28/2008
Author: Egon Marx
Abstract: Singular integral equations that determine the exact fields scattered by a dielectric or conducting finite strip on a substrate are presented. The computation of the image of such a scatterer from these fields by Fourier optics methods is also shown ...

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