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You searched on: Topic Area: Optical Metrology Sorted by: title

Displaying records 31 to 40 of 67 records.
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31. Low-Cost, High-Throughput, Automated Counting of Bacterial Colonies
Topic: Optical Metrology
Published: 1/5/2010
Authors: Matthew Lawrence Clarke, Robert L Burton, A. Nayo Hill, Maritoni Abatayo Litorja, Moon H. Nahm, Jeeseong Hwang
Abstract: Research involving bacterial pathogens often requires enumeration of bacteria colonies. Here we present a low-cost, high-throughput colony counting system consisting of colony counting software and a consumer-grade digital camera or document scanner ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904106

32. Lunar Spectral Irradiance and radiance (LUSI): new instrumentation to characterize the Moon as a space-based radiometric standard
Series: Journal of Research (NIST JRES)
Report Number: 117.011
Topic: Optical Metrology
Published: 7/17/2012
Authors: Allan W. Smith, Steven Ray Lorentz, Raju Vsnu Datla, Thomas C. Stone
Abstract: The need to understand and monitor climate change has led to proposed radiometric accuracy requirements for space-based remote-sensing instruments that are very stringent and currently beyond the reach of many Earth orbiting instruments. A major ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903135

33. MEMS optomechanical accelerometry standards
Topic: Optical Metrology
Published: 7/8/2015
Authors: Felipe Guzman, Yiliang Bao, Jason John Gorman, John Russell Lawall, Jacob M Taylor, Thomas W LeBrun
Abstract: Current acceleration primary standards reach relative uncertainties of the order of 0.001 and consist of complex test facilities, typically operated at National Metrology Institutes. Our research focuses on the development of silicon mechanical os ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918899

34. Measurement of the Gold-Gold Bond Rupture Force at 4 K in a Single-Atom Chain Using Photon-Momentum-Based Force Calibration
Topic: Optical Metrology
Published: 12/22/2014
Authors: Douglas T Smith, Jon Robert Pratt
Abstract: We present instrumentation and methodology for simultaneously measuring force and displacement at the atomic scale at 4 K. The technique, which uses a macroscopic cantilever as a force sensor and high-resolution, high-stability fiber-optic interfero ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909684

35. Measuring Single-Walled Carbon Nanotube Length Distributions from Diffusional Trajectories
Topic: Optical Metrology
Published: 8/27/2012
Authors: Jason Streit, Sergei M Bachilo, Anton V Naumov, Constantine Y. Khripin, Ming Zheng, R Bruce Weisman
Abstract: A new method is demonstrated for measuring the length distributions of dispersed single-walled carbon nanotube (SWCNT) samples by analyzing diffusional motions of many individual nanotubes in parallel. In this method, termed Length Analysis by Na ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911770

36. Metrologia
Topic: Optical Metrology
Published: 7/8/2011
Authors: Uwe Arp, Zhigang Li, Ping-Shine Shaw, Mathias Richter, Roman Klein, Wolfgang Paustian, Reiner Thornagel
Abstract: We report on a successful bilateral inter-comparison between the Physikalisch-Technische Bundesanstalt (PTB) and the National Institute of Standards and Technology (NIST). In both laboratories deuterium lamps were calibrated using the calculability o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907243

37. Microwave generation with low residual phase noise from a femtosecond fiber laser with an intracavity electro-optic modulator
Topic: Optical Metrology
Published: 11/14/2011
Authors: William C Swann, Esther Baumann, Fabrizio Raphael Giorgetta, Nathan Reynolds Newbury
Abstract: Low phase-noise microwave generation has previously been demonstrated using self-referenced frequency combs to divide down a low noise optical reference. We demonstrate an approach based on a fs Er-fiber laser that avoids the complexity of self-refer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909568

38. Mode reconstruction of a light field by multi-photon statistics
Topic: Optical Metrology
Published: 7/15/2013
Authors: Elizabeth A. Goldschmidt, Fabrizio Piacentini, I. Ruo Berchera, Sergey V Polyakov, Silke Peters, Stefan Kuck, Giorgio Brida, Ivo Pietro Degiovanni, Alan L Migdall, Marco Genovese
Abstract: Knowing the underlying number and structure of occupied modes of a light field plays a crucial role in minimizing loss and decoherence of quantum information. Typically, full characterization of the mode structure involves a series of several separ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913292

39. Monitoring Photothermally Excited Nanoparticles via Multimodal Microscopy
Topic: Optical Metrology
Published: 5/19/2010
Authors: Matthew Lawrence Clarke, Shin G. Chou, Jeeseong Hwang
Abstract: Generation of heat using optically excited nanoparticles can be beneficial or detrimental depending on the application. Therefore, clinically applicable studies are being pursued in an effort to achieve safe practices of nanoparticle-induced hyperth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905276

40. Mueller matrix ellipsometry of artificial non-periodic line edge roughness in presence of finite numerical aperture
Topic: Optical Metrology
Published: 4/20/2011
Authors: Thomas Avery Germer, Martin Foldyna, Brent Bergner
Abstract: We used azimuthally-resolved spectroscopic Mueller matrix ellipsometry to study a periodic silicon line structure with and without artificially-generated line edge roughness (LER). The unperturbed, reference grating profile was determined from multip ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908372



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