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Topic Area: Optical Metrology
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Displaying records 81 to 90 of 136 records.
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81. Scalable multiplexed detector system for high-rate telecom-bandsingle-photon detection
Topic: Optical Metrology
Published: 11/25/2009
Authors: Sergey V Polyakov, Alan L Migdall, Giorgio Brida, Ivo P Degiovanni, Fabrizio Piacentini, V Schettini
Abstract: We present a photon-counting detection system at telecom wavelengths that overcomes the difficulties of photon-counting at high rates. Our detection system uses active multiplexing, an array of N detectors, and a 1-by-N optical switch with a control ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902508

82. Spectral irradiance responsivity calibration of InSb radiometers using the improved IR-SIRCUS at NIST
Topic: Optical Metrology
Published: 10/15/2009
Authors: Jinan Zeng, Howard W Yoon, George P Eppeldauer, Leonard M Hanssen, Joseph Paul Rice
Abstract: The spectral irradiance responsivity calibrations of InSb radiometers measured on the tunable-laser based Infrared Spectral Irradiance and Radiance Responsivity Calibration with Uniform Sources (IR-SIRCUS) facility are discussed. This work describes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903522

83. Development of an infrared optical scattering instrument from 1 um to 5 um
Topic: Optical Metrology
Published: 10/1/2009
Authors: Jinan Zeng, Leonard M Hanssen
Abstract: The wavelength coverage of the IR optical scattering instrument developed at the National Institute of Standards and Technology has been extended to cover the continuous range from 1 um to 5 um. Besides the previously available diode lasers at wavele ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903521

84. Photomask metrology using a 193 nm scatterfield microscope
Topic: Optical Metrology
Published: 9/30/2009
Authors: Richard Quintanilha, Bryan M Barnes, Martin Y Sohn, Lowell P. Howard, Richard M Silver, James Edward Potzick, Michael T. Stocker
Abstract: The current photomask linewidth Standard Reference Material (SRM) supplied by the National Institute of Standards and Technology (NIST), SRM 2059, is the fifth generation of such standards for mask metrology. The calibration of this mask has been ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903929

85. NIST s Integrated Colony Enumerator (NICE)
Topic: Optical Metrology
Published: 8/11/2009
Authors: Matthew Lawrence Clarke, Jeeseong Hwang
Abstract: Enumeration of bacterial colonies in an agar plate is simple in concept, but automated colony counting is difficult due to variations in colony color, size, shape, contrast, and density, as well as colony overlap. Furthermore, in applications where ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903103

86. The-Final-State Symmetry of Na 1s Core-shell Excitons in NaCl and NaF
Topic: Optical Metrology
Published: 7/8/2009
Authors: Eric L Shirley, K. P. Nagle, G T Seidler, T. T. Fister, J. A. Bradley, F. C. Brown
Abstract: We report measurements of the Na 1s contribution to the nonresonant inelastic x-ray scattering (NRIXS) from NaCl and NaF. Prior x-ray absorption studies have observed two pre-edge excitons in both materials. The momentum transfer-dependence (q-depe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901581

87. Measurement Standards for Optically Active Coatings to Improve Shipboard Tank Preservation
Topic: Optical Metrology
Published: 6/18/2009
Authors: Maria E Nadal, Carl C Miller, Richard Harold, Paul Gossen
Abstract: The cost of corrosion control to the Department of Defense (DOD) is estimated to be $20B/yr. Eliminating coating defects during the coating application job is the key to extending coating service life. Fluorescent coatings containing additives that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902657

88. CCPR-S1 Supplementary Comparison for Spectral Radiance in the range of 220 nm to 2500 nm
Topic: Optical Metrology
Published: 6/2/2009
Authors: Boris Khlevnoy, Victor Sapritsky, Bernard Rougie, Charles E Gibson, Howard W Yoon, Arnold A. Gaertner, Dieter Taubert, Juergen Hartmann
Abstract: In 1997, the Consultative Committee for Photometry and Radiometry (CCPR) initiated a supplementary comparison of spectral radiance in the wavelength range from 220 nm to 2500 nm (CCPR S1) using tungsten -strip filament lamps as transfer standards. Fi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900253

89. Measurement of the ultraviolet-induced fluorescence yield from integrating spheres
Topic: Optical Metrology
Published: 6/2/2009
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
Abstract: We report theory and measurements of a simple and absolute technique for the determination of the total emitted spectral fluorescence yield inside an integrating sphere from the sphere coating under irradiation with a monochromatic beam. This techniq ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842602

90. DMD diffraction measurements to support design of projectors for test and evaluation of multispectral and hyperspectral imaging sensors
Topic: Optical Metrology
Published: 6/1/2009
Authors: Joseph Paul Rice, Jorge Enrique Neira, Michael Kehoe, Rand Swanson
Abstract: We describe our use of Digital Micromirror Devices (DMDs) for the performance testing, characterization, calibration, and system-level data product validation of multispectral and hyperspectral imaging sensors. We have developed a visible Hyperspectr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901172



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