NIST logo

Publications Portal

You searched on:
Topic Area: Optical Metrology
Sorted by: date

Displaying records 21 to 30 of 117 records.
Resort by: Date / Title


21. Measuring Single-Walled Carbon Nanotube Length Distributions from Diffusional Trajectories
Topic: Optical Metrology
Published: 8/27/2012
Authors: Jason Streit, Sergei M Bachilo, Anton V Naumov, Constantine Y. Khripin, Ming Zheng, R Bruce Weisman
Abstract: A new method is demonstrated for measuring the length distributions of dispersed single-walled carbon nanotube (SWCNT) samples by analyzing diffusional motions of many individual nanotubes in parallel. In this method, termed Length Analysis by Na ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911770

22. A modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafers
Topic: Optical Metrology
Published: 8/17/2012
Authors: Jungjae Park, Lingfeng Chen, Quandou Wang, Ulf Griesmann
Abstract: We describe a method to simultaneously measure thickness variation and refractive index homogeneity of 300 mm diameter silicon wafers using a wavelength shifting Fizeau interferometer operating at 1550 nm. Only three measurements are required, corres ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911565

23. A compact and robust method for full Stokes spectropolarimetry
Topic: Optical Metrology
Published: 8/1/2012
Authors: William Sparks, Thomas Avery Germer, John MacKenty, Frans Snik
Abstract: We present an approach to spectropolarimetry which requires neither moving parts nor time dependent modulation, and which o ers the prospect of achieving high sensitivity. The concept, which is one of those generically known as channeled polarimetry, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911231

24. An algorithm for finding clusters with a known distribution and its application to photon-number resolution using a superconducting transition-edge sensor
Topic: Optical Metrology
Published: 7/20/2012
Authors: Zachary H Levine, Thomas Gerrits, Alan L Migdall, Daniel Victor Samarov, Brice R. Calkins, Adriana Eleni Lita, Sae Woo Nam
Abstract: Improving photon-number resolution of single-photon sensitive detectors is important for many applications, as is extending the range of such detectors. Here we seek improved resolution for a particular Superconducting Transition-Edge Sensor (TES) t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911195

25. Lunar Spectral Irradiance and radiance (LUSI): new instrumentation to characterize the Moon as a space-based radiometric standard
Series: Journal of Research (NIST JRES)
Report Number: 117.011
Topic: Optical Metrology
Published: 7/17/2012
Authors: Allan W. Smith, Steven Ray Lorentz, Raju Vsnu Datla, Thomas C. Stone
Abstract: The need to understand and monitor climate change has led to proposed radiometric accuracy requirements for space-based remote-sensing instruments that are very stringent and currently beyond the reach of many Earth orbiting instruments. A major ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903135

26. Frequency-stabilized cavity ring-down spectroscopy
Topic: Optical Metrology
Published: 3/21/2012
Authors: David A Long, A. Cygan, Roger D van Zee, Mitchio Okumura, C. E. Miller, D Lisak, Joseph Terence Hodges
Abstract: This Frontiers article describes frequency-stabilized cavity ring-down spectroscopy (FS-CRDS), an ultraprecise refinement of conventional cw-CRDS. We review the technique and highlight some recent studies which have utilized FS-CRDS to perform precis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910170

27. Extension of the NIST spectral power-responsivity calibration service to 2500 nm
Topic: Optical Metrology
Published: 3/2/2012
Authors: George P Eppeldauer, Howard W Yoon, Jinan Zeng, Thomas C Larason, Jeanne M Houston, Vladimir Khromchenko
Abstract: The National Institute of Standards and Technology (NIST) is working to extend the upper wavelength limit of the spectral power-responsivity calibration service from 1800 nm to 2500 nm. This extension is based on extended-InGaAs (EIGA) transfer- and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910010

28. Standardization of Broadband UV Measurements for 365 nm LED Sources
Series: Journal of Research (NIST JRES)
Report Number: 117.004
Topic: Optical Metrology
Published: 2/2/2012
Author: George P Eppeldauer
Abstract: Broadband UV measurements are analyzed when UV-A irradiance meters measure optical radiation from 365-nm sources. The CIE standardized rectangular-shape UV-A function can be realized only with large spectral mismatch errors. The spectral power-di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909003

29. A statistical study of de-embedding applied to eye diagram analysis
Topic: Optical Metrology
Published: 2/1/2012
Authors: Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
Abstract: We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907585

30. Nanometrology Using Through-Focus Scanning Optical Microscopy Method
Topic: Optical Metrology
Published: 12/21/2011
Authors: Ravikiran Attota, Richard M Silver
Abstract: We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905395



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series