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Topic Area: Optical Metrology
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Displaying records 21 to 30 of 112 records.
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21. An algorithm for finding clusters with a known distribution and its application to photon-number resolution using a superconducting transition-edge sensor
Topic: Optical Metrology
Published: 7/20/2012
Authors: Zachary H Levine, Thomas Gerrits, Alan L Migdall, Daniel Victor Samarov, Brice Robert Calkins, Adriana Eleni Lita, Sae Woo Nam
Abstract: Improving photon-number resolution of single-photon sensitive detectors is important for many applications, as is extending the range of such detectors. Here we seek improved resolution for a particular Superconducting Transition-Edge Sensor (TES) t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911195

22. Lunar Spectral Irradiance and radiance (LUSI): new instrumentation to characterize the Moon as a space-based radiometric standard
Series: Journal of Research (NIST JRES)
Report Number: 117.011
Topic: Optical Metrology
Published: 7/17/2012
Authors: Allan W. Smith, Steven Ray Lorentz, Raju Vsnu Datla, Thomas C. Stone
Abstract: The need to understand and monitor climate change has led to proposed radiometric accuracy requirements for space-based remote-sensing instruments that are very stringent and currently beyond the reach of many Earth orbiting instruments. A major ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903135

23. Frequency-stabilized cavity ring-down spectroscopy
Topic: Optical Metrology
Published: 3/21/2012
Authors: David A Long, A. Cygan, Roger D van Zee, Mitchio Okumura, C. E. Miller, D Lisak, Joseph Terence Hodges
Abstract: This Frontiers article describes frequency-stabilized cavity ring-down spectroscopy (FS-CRDS), an ultraprecise refinement of conventional cw-CRDS. We review the technique and highlight some recent studies which have utilized FS-CRDS to perform precis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910170

24. Extension of the NIST spectral power-responsivity calibration service to 2500 nm
Topic: Optical Metrology
Published: 3/2/2012
Authors: George P Eppeldauer, Howard W Yoon, Jinan Zeng, Thomas C Larason, Jeanne M Houston, Vladimir Khromchenko
Abstract: The National Institute of Standards and Technology (NIST) is working to extend the upper wavelength limit of the spectral power-responsivity calibration service from 1800 nm to 2500 nm. This extension is based on extended-InGaAs (EIGA) transfer- and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910010

25. Standardization of Broadband UV Measurements for 365 nm LED Sources
Series: Journal of Research (NIST JRES)
Report Number: 117.004
Topic: Optical Metrology
Published: 2/2/2012
Author: George P Eppeldauer
Abstract: Broadband UV measurements are analyzed when UV-A irradiance meters measure optical radiation from 365-nm sources. The CIE standardized rectangular-shape UV-A function can be realized only with large spectral mismatch errors. The spectral power-di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909003

26. A statistical study of de-embedding applied to eye diagram analysis
Topic: Optical Metrology
Published: 2/1/2012
Authors: Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
Abstract: We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907585

27. Nanometrology Using Through-Focus Scanning Optical Microscopy Method
Topic: Optical Metrology
Published: 12/21/2011
Authors: Ravikiran Attota, Richard M Silver
Abstract: We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905395

28. TSOM Method for Nanoelectronics Dimensional Metrology
Topic: Optical Metrology
Published: 11/18/2011
Author: Ravikiran Attota
Abstract: Through-focus scanning optical microscopy (TSOM) is a relatively new method that transforms conventional optical microscopes into truly three-dimensional metrology tools for nanoscale to microscale dimensional analysis. TSOM achieves this by acquirin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908623

29. Microwave generation with low residual phase noise from a femtosecond fiber laser with an intracavity electro-optic modulator
Topic: Optical Metrology
Published: 11/14/2011
Authors: William C Swann, Esther Baumann, Fabrizio Raphael Giorgetta, Nathan Reynolds Newbury
Abstract: Low phase-noise microwave generation has previously been demonstrated using self-referenced frequency combs to divide down a low noise optical reference. We demonstrate an approach based on a fs Er-fiber laser that avoids the complexity of self-refer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909568

30. Dual-comb-based characterization of rapidly tuned lasers
Topic: Optical Metrology
Published: 10/10/2011
Authors: Fabrizio Raphael Giorgetta, Esther Baumann, Ian R Coddington, William C Swann, Nathan Reynolds Newbury, Zeb W Barber, Peter Roos
Abstract: We demonstrate a technique to calibrate the instantaneous frequency versus time from a rapidly tuned cw laser. Our dual-comb-based spectrometer can measure optical waveforms tuned at 1500-THz/s rates over 5-THz bandwidths at high precision.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908712



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