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Topic Area: Optical Metrology

Displaying records 61 to 70 of 138 records.
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61. Introduction to special issue on single-photon technologies
Topic: Optical Metrology
Published: 3/10/2011
Authors: Alan L Migdall, Sergey V Polyakov, Jingyun Fan, Ivo Pietro Degiovanni, Jessica Cheung
Abstract: This special issue accompanies the 4th international conference on single-photon technologies held at the National Institute of Standards and Technology (NIST) Boulder in November 2009. This community has met every two years at national metrology ins ...

62. Experimental realization of a low-noise heralded single photon source
Topic: Optical Metrology
Published: 1/17/2011
Authors: Alan L Migdall, Sergey V Polyakov, Marco Genovese, Fabrizio Piacentini, I. Ruo Berchera, Ivo P Degiovanni, Giorgio Brida
Abstract: We present a heralded single-photon source with a much lower level of unwanted background photons in the output channel by using the herald photon to control a shutter in the heralded channel. The shutter is implemented using a simple field program ...

63. Far Infrared Absorption Measurements of Single Walled Carbon Nanotubes
Topic: Optical Metrology
Published: 1/17/2011
Authors: Shin G. Chou, Zeeshan Ahmed, Georgy Samsonidze, Jing Kong, Mildred Dresselhaus, David F Plusquellic
Abstract: Variable temperature high resolution far infrared absorption measurements were carried out for single walled carbon nanotubes samples with different diameter distributions. At a temperature where kBT is significantly lower than the phonon energy, th ...

64. Preliminary characterization study of a gold-coated concentrator for hemispherical longwave irradiance measurements
Topic: Optical Metrology
Published: 11/15/2010
Authors: Jinan Zeng, Leonard M Hanssen, Ibrahim Reda, Jonathan Scheuch
Abstract: We report the preliminary characterization results of a gold-coated concentrator used for longwave irradiance measurements[1]. Throughput measurements of the concentrator are conducted at 1.562 μm and 10.15 μm using two different approaches ...

65. High precision, broadband optical measurements with fiber laser frequency combs
Topic: Optical Metrology
Published: 11/2/2010
Authors: Nathan Reynolds Newbury, Ian R Coddington, Esther Baumann, Fabrizio Raphael Giorgetta, William C Swann, Alexander M. Zolot
Abstract: Optical frequency combs have been used extensively, and with remarkable success, to measure the absolute frequency of cw lasers. The use of frequency combs has also expanded to include applications such as precision ranging, component metrology, and ...

66. Fast high-resolution frequency agile spectroscopy of laser sources
Topic: Optical Metrology
Published: 10/24/2010
Authors: Fabrizio Raphael Giorgetta, Ian R Coddington, Esther Baumann, William C Swann, Nathan Reynolds Newbury
Abstract: Time-resolved, high-accuracy and high-resolution spectroscopy of frequency-agile cw lasers is critical to realizing their full potential for sensing, but is not possible with conventional spectroscopy methods. We demonstrate a dual comb-based spectro ...

67. Broadband coherent spectroscopy in the near infrared using dual coherent frequency combs
Topic: Optical Metrology
Published: 8/15/2010
Authors: Nathan Reynolds Newbury, Ian R Coddington, Esther Baumann, Fabrizio Raphael Giorgetta, William C Swann, Alexander M. Zolot
Abstract: Fiber-based frequency combs can provide broadband coherent light that enables new possibilities for high-accuracy, high-resolution broadband spectroscopy. We use a configuration with two coherently phase-locked combs; the output of one comb passes th ...

68. Supercontinuum fiber laser source for reflectance calibrations in remote sensing
Topic: Optical Metrology
Published: 8/1/2010
Authors: Clarence Joseph Zarobila, Heather J Patrick
Abstract: The Optical Technology Division of the NIST provides reference measurements of specular and diffuse reflectance of materials, including measurements that provide traceability for diffuser plaques that are used as onboard calibration standards in remo ...

69. Flatness measurements of thin, plane-parallel optics floated on a heavy liquid
Topic: Optical Metrology
Published: 6/23/2010
Authors: Ulf Griesmann, Quandou Wang, Eric C Benck, Jiyoung Chu, Jaewoong Sohn
Abstract: no abstract

70. A Simple Method to Improve Etching Uniformity when Making Phase Type CGHs on a Thick Glass Substrate
Topic: Optical Metrology
Published: 6/13/2010
Author: Quandou Wang
Abstract: A simple method to optimize the etching uniformity when making a Computer generated halogram on a thick optical glass substrate is described, which uses a Teflon ring to enclose the substrate during reactive-ion etching (RIE).

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