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Topic Area: Optical Metrology

Displaying records 91 to 100 of 134 records.
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91. Time and Frequency-Domain Spectroscopy with Dual Frequency Combs
Topic: Optical Metrology
Published: 5/28/2009
Authors: Nathan Reynolds Newbury, Ian R Coddington, William C Swann
Abstract: High-resolution spectroscopic measurements of the amplitude and phase spectra from a gas sample can be acquired by use of dual frequency combs. Here we discuss the corresponding gas signature in the time domain.

92. Absolute Ranging Using Frequency Combs
Topic: Optical Metrology
Published: 5/25/2009
Authors: William C Swann, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We present a technique for measuring absolute range that uses two mismatched frequency combs to measure distance over 1.5 m range with 10 nm level statistical uncertainty.

93. Vibration immune fiber-laser frequency comb based on a polarization-maintaining figure-eight laser
Topic: Optical Metrology
Published: 5/20/2009
Authors: Fabrizio Raphael Giorgetta, Esther Baumann, Jeffrey W. Nicholson, William C Swann, Ian R Coddington, Nathan Reynolds Newbury
Abstract: A frequency comb is phase-locked to a cw laser with an electro-optic-modulator providing 1.6 MHz feedback bandwidth. Residual phase noise is as low as -94 dBc/Hz, and the comb remained locked under mechanical vibration of up to 1.9 g.

94. Quantum radiometry
Topic: Optical Metrology
Published: 5/2/2009
Authors: Sergey V Polyakov, Alan L Migdall
Abstract: We review radiometric techniques that take advantage of photon counting and stem from the quantum laws of nature. We present a brief history of metrological experiments and review the current state of experimental quantum radiometry.

95. Characterization of Metal-Oxide Nanofilm Morphologies and Composition by Terahertz Transmission Spectroscopy
Topic: Optical Metrology
Published: 3/30/2009
Authors: Edwin J Heilweil, James E Maslar, William Andrew Kimes, Nabil Bassim, Peter K. Schenck
Abstract: An all-optical terahertz absorption technique for non-destructive characterization of nanometer-scale metal-oxide thin films grown on silicon substrates is described. Example measurements of laser and atomic layer-deposited films of HfO2, TiO3, Al2O ...

96. Polarization-sensitive linear optical sampling for characterization of polarization-multiplexed QPSK
Topic: Optical Metrology
Published: 3/20/2009
Authors: Paul A Williams, Tasshi Dennis, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We describe polarization-sensitive phase-referenced linear optical sampling for measuring polarization, amplitude, and phase of a high speed optical waveform. With a single measurement, we simultaneously measure both orthogonal polarization channels ...

97. High-performance, vibration-immune, fiber-laser frequency comb
Topic: Optical Metrology
Published: 3/1/2009
Authors: Esther Baumann, Fabrizio Raphael Giorgetta, Jeffrey W. Nicholson, William C Swann, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We demonstrate an environmentally robust optical frequency comb based on a polarization-maintaining, allfiber, figure-eight laser. The comb is phase locked to a cavity-stabilized cw laser by use of an intracavity electro-optic phase modulator yieldin ...

98. Choosing the right detector for laser power and energy measurements
Topic: Optical Metrology
Published: 10/1/2008
Author: Marla L Dowell
Abstract: You may not realize the importance of good laser metrology and its many pitfalls until you realize how much of today‰s commonplace conveniences ‹ from long distance communications to LASIK (laser-assisted in situ keratomileusis) to state-of ...

Topic: Optical Metrology
Published: 10/1/2008
Authors: Yuqin Zong, Yoshihiro Ohno
Abstract: The measurement of high-power light emitting diodes (LEDs) has been difficult because they are highly sensitive to thermal operating conditions, and there has been a lack of common methods that can be used by both LED manufactures and users to acquir ...

Topic: Optical Metrology
Published: 10/1/2008
Authors: Jiangen PAN, Haiping SHEN, Yuqin Zong, Yoshihiro Ohno
Abstract: The mismatch of spectral responsivity to the CIE V(lambda) function, i. e., the f1‰ index, is the most critical characteristic of photometers and tristimulus colorimeters. The f1‰ value varies with measurement conditions, which is often omi ...

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