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Displaying records 711 to 720 of 744 records.
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711. Transient Analysis of a Line-focus Transducer Probing a Liquid/Solid Interface
Topic: Electronics & Telecommunications
Published: 1/1/1995
Authors: Nelson N. Hsu, Gerald V. Blessing, Steven Earl Fick, D Xiang
Abstract: The use of a line-focus transducer operating in pulse-echo mode to probe a liquid/solid interface is a new technique which has many engineering applications. To provide a theoretical basis for multi-echo analysis and interpretation, we use numerical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820041

712. Transient Green's Tensor for a Layered Solid Half-Space With Different Interface Conditions
Series: Journal of Research (NIST JRES)
Topic: Electronics & Telecommunications
Published: 9/1/2002
Authors: S C Ren, Nelson N. Hsu, Donald G Eitzen
Abstract: Pulsed ultrasonic techniques can be and have been used to examine the interface conditions of a bonded structure. To provide a theoretical base for such testing techniques we model the structure as a layer on top of a half-space, both of different e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823307

713. Transient Heating Study of Microhotplates by Using a High-Speed Thermal Imaging System
Topic: Electronics & Telecommunications
Published: 3/1/2002
Authors: Muhammad Yaqub Afridi, David W. Berning, Allen R Hefner Jr, John S Suehle, Mona Elwakkad Zaghloul, Eric Kelley, Zharadeen Rodriguez Parrilla, Colleen E. Hood
Abstract: A high-speed thermal imaging system is used to investigate the dynamic thermal behavior of MEMS-based (MicroElectroMechanical Systems) microhotplate devices. These devices are suspended microstructures fabricated in CMOS technology and are used in va ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14143

714. Translational Kinetic-Energy Distributions of Positive Ions Produced in Townsend Discharges of SF6 at High Electric Field-To-Gas Density Ratios (E/N)
Topic: Electronics & Telecommunications
Published: 7/1/1997
Authors: MVVS. Rao, James K Olthoff, Richard J. Van Brunt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27455

715. Tunneling Stabilized Magnetic Force Microscopy of YBa^d2^Cu^d3^O^d7-{delta}^ Films on MgO at 76 K
Topic: Electronics & Telecommunications
Published: 11/1/1991
Authors: Paul Rice, John M Moreland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30529

716. Tunneling Stabilized Magnetic Force Microscopy: Prospects for Low Temperature Applications to Superconductors
Topic: Electronics & Telecommunications
Published: 3/1/1991
Authors: John M Moreland, Paul Rice
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30534

717. Tunneling Stabilized Magnetic-Force Microscopy
Topic: Electronics & Telecommunications
Published: 1/1/1993
Authors: John M Moreland, V. Gopalan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30517

718. Tunneling-Stabilized Magnetic Force Microscopy of Bit Tracks on a Hard Disk
Topic: Electronics & Telecommunications
Published: 5/1/1991
Authors: Paul Rice, John M Moreland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30531

719. Ultrasonic Continuous-Wave Beam-Power Measurements: 1978-1980 International Comparison
Topic: Electronics & Telecommunications
Published: 8/2/1999
Author: Steven Earl Fick
Abstract: Four half-wave resonant, air-backed, x-cut quartz disc transducers designed and fabricated at the National Bureau of Standards (NBS) were circulated among seven laboratories between February 1978 and June 1980. Participants were given detailed instru ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820118

720. Ultrasonic Measurement of the Dynamic Elastic Moduli of Small Metal Samples
Topic: Electronics & Telecommunications
Published: 1/1/1999
Authors: John A Slotwinski, Gerald V. Blessing
Abstract: Ultrasonic velocity measurements were used to determine the dynamic elastic moduli small metal samples to a 2[sigma] measurement uncertainty of less than one percent. The samples were cylindrical in shape, possessing nominal diameters of 12 mm, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820134



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