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Displaying records 711 to 720 of 749 records.
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711. Time-and-Polarization-Resolved Acoustic Microscopy of Surface and Subsurface Cracks
Topic: Electronics & Telecommunications
Published: 12/1/1999
Authors: D Xiang, Gerald V. Blessing, Nelson N. Hsu
Abstract: Time-and-polarization-resolved acoustic microscopy with an improved-spatial-resolution line-focus transducer of simply reduced active element width is applied to characterize surface and subsurface cracks. From acoustic images obtained from scanning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821932

712. Time-resolved Balmer-alpha Emission from Fast Hydrogen Atoms in Low Pressure, Radio-Frequency Discharges in Hydrogen
Topic: Electronics & Telecommunications
Published: 5/1/1995
Authors: S. B. Radovanov, Krzysztof Dzierzega, J R Roberts, James K Olthoff
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2388

713. Time-resolved Measurements of Ion Energy Distributions and Optical Emissions in Pulsed Radio-Frequency Discharges
Topic: Electronics & Telecommunications
Published: 3/1/2000
Authors: Yicheng Wang, Eric C Benck, Martin Misakian, M. Edamura, James K Olthoff
Abstract: In pulse-modulated inductively coupled plasmas generated in CF^d4^:Ar mixtures, a transition between a capacitive coupling mode (E mode) and an inductive coupling mode (H mode) was observed. For a pulsed plasma in a 50%CF^d4^:50%Ar volume mixture wi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9483

714. Total Electron Scattering Cross Section for Cl^d2^
Topic: Electronics & Telecommunications
Published: 1/1/1999
Authors: Gary D. Cooper, Jason E. Sanabia, J. H. Moore, James K Olthoff, Loucas G. Christophorou
Abstract: Absolute measurements of the total electron scattering cross section for chlorine, Cl2, are reported for electron energies ranging from .3 eV to 23 eV. The present data are in reasonable agreement with previous measurements of the cross sections for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2608

715. Traceability for Aerosol Electrometer in the fA Range
Topic: Electronics & Telecommunications
Published: 6/1/2013
Authors: Dean G Jarrett, Miles Owen
Abstract: Described here are the configurations and procedures used to provide traceability to electrical standards for an aerosol electrometer calibration in the range ± 20 fA to ± 40 fA. The technique used here simulated the condition of a current induced ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913213

716. Transient Analysis of a Line-focus Transducer Probing a Liquid/Solid Interface
Topic: Electronics & Telecommunications
Published: 1/1/1995
Authors: Nelson N. Hsu, Gerald V. Blessing, Steven Earl Fick, D Xiang
Abstract: The use of a line-focus transducer operating in pulse-echo mode to probe a liquid/solid interface is a new technique which has many engineering applications. To provide a theoretical basis for multi-echo analysis and interpretation, we use numerical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820041

717. Transient Green's Tensor for a Layered Solid Half-Space With Different Interface Conditions
Series: Journal of Research (NIST JRES)
Topic: Electronics & Telecommunications
Published: 9/1/2002
Authors: S C Ren, Nelson N. Hsu, Donald G Eitzen
Abstract: Pulsed ultrasonic techniques can be and have been used to examine the interface conditions of a bonded structure. To provide a theoretical base for such testing techniques we model the structure as a layer on top of a half-space, both of different e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823307

718. Transient Heating Study of Microhotplates by Using a High-Speed Thermal Imaging System
Topic: Electronics & Telecommunications
Published: 3/1/2002
Authors: Muhammad Yaqub Afridi, David W. Berning, Allen R Hefner Jr, John S Suehle, Mona Elwakkad Zaghloul, Eric Kelley, Zharadeen Rodriguez Parrilla, Colleen E. Hood
Abstract: A high-speed thermal imaging system is used to investigate the dynamic thermal behavior of MEMS-based (MicroElectroMechanical Systems) microhotplate devices. These devices are suspended microstructures fabricated in CMOS technology and are used in va ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14143

719. Translational Kinetic-Energy Distributions of Positive Ions Produced in Townsend Discharges of SF6 at High Electric Field-To-Gas Density Ratios (E/N)
Topic: Electronics & Telecommunications
Published: 7/1/1997
Authors: MVVS. Rao, James K Olthoff, Richard J. Van Brunt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27455

720. Tunneling Stabilized Magnetic Force Microscopy of YBa^d2^Cu^d3^O^d7-{delta}^ Films on MgO at 76 K
Topic: Electronics & Telecommunications
Published: 11/1/1991
Authors: Paul Rice, John M Moreland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30529



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