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Displaying records 701 to 710 of 750 records.
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701. Thermal Component Models for Electro-Thermal Analysis of Multichip Power Modules
Topic: Electronics & Telecommunications
Published: 10/24/2002
Authors: J J. Rodriguez, John V. Reichl, Zharadeen Rodriguez Parrilla, Allen R Hefner Jr, David W. Berning, M Velez-Reyes, Jih-Sheng Lai
Abstract: Thermal component models are developed for multi-chip IGBT power electronic modules (PEM) and associated high-power converter heatsinks. The models are implemented in SABER and are combined with the electro-thermal IGBT and diode models to simulate t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30113

702. Thermal Component Models for Electrothermal Network Simulation
Topic: Electronics & Telecommunications
Published: 12/31/1993
Authors: Allen R Hefner Jr, David L. Blackburn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23751

703. Thermal Component Models for Electrothermal Network Simulation
Topic: Electronics & Telecommunications
Published: 12/31/1994
Authors: Allen R Hefner Jr, David L. Blackburn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28551

704. Thermo-viscoelastic Analysis and Creep Testing of Ambient Cure Epoxy Adhesives Used in Construction Applications
Topic: Electronics & Telecommunications
Published: 7/30/2008
Authors: Joannie W Chin, Donald Lee Hunston, Aaron M Forster, Justin M Ocel, Jean Michel Hartmann, Paul Fuchs
Abstract: Epoxies are increasingly used in construction for structural applications and properties such as creep are very important. For this reason, the thermo-viscoelastic properties and creep response of two commercial, ambient cure structural epoxy adhesi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=861549

705. Third-Round Report of the SHA-3 Cryptographic Hash Algorithm Competition
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7896
Topic: Electronics & Telecommunications
Published: 11/15/2012
Authors: Shu-jen H Chang, Ray A Perlner, William Edward Burr, Meltem Sonmez Turan, John M Kelsey, Souradyuti Paul, Lawrence E Bassham
Abstract: The National Institute of Standards and Technology (NIST) opened a public competition on November 2, 2007 to develop a new cryptographic hash algorithm - SHA-3, which will augment the hash algorithms specified in the Federal Information Processing St ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912724

706. Time Domain Waveforms of a Line-Focus Transducer Probing Anisotropic Solids
Topic: Electronics & Telecommunications
Published: 1/1/1997
Authors: Nelson N. Hsu, Gerald V. Blessing, D Xiang
Abstract: We have developed a large lensless line-focus wideband ultrasonic transducer which can be used to probe solid materials through water. With conventional ultrasonic equipment the transducer can perform time and polarization resolved surface and body w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820017

707. Time Evolution of Ion Energy Distributions and Optical Emission in Pulsed Inductively Coupled Radio Frequency Plasmas
Topic: Electronics & Telecommunications
Published: 10/1/2000
Authors: Martin Misakian, Eric C Benck, Yicheng Wang
Abstract: This article reports the results of time-resolved measurements of ion energy distributions (IEDs), relative ion densities, as well as optical emissions and electrical characteristics in pulsed, inductively coupled plasmas for the simple gas mixture o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28915

708. Time and Polarization Resolved Ultrasonic Testing of Materials
Topic: Electronics & Telecommunications
Published: 1/1/1996
Authors: Gerald V. Blessing, D Xiang, Nelson N. Hsu
Abstract: We have developed a transducer which allows the benefits of Line Focus Beam (LFB) acoustic microscopy to be realized over large areas, using a conventional pulser-receiver. Experimental evidence is presented to show that the transducer is correctly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820040

709. Time-Resolved Line Focus Acoustic Microscopy of Composites
Topic: Electronics & Telecommunications
Published: 6/1/1999
Author: Nelson N. Hsu
Abstract: Acoustic microscopy has been used to measure material properties since the 1980s. The velocity of the leaky surface wave can be accurately determined from the V(z) curve which is formed by the interference between the leaky surface wave and specular ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821935

710. Time-Resolved Ultrasonic Body Wave Measurements of Material Anisotropy Using a Lensless Line-Focus Transducer
Topic: Electronics & Telecommunications
Published: 11/1/1998
Authors: Nelson N. Hsu, D Xiang, Gerald V. Blessing
Abstract: For plate-like sample geometries, a line-focus transducer can be used to detect back-reflected echoes through the thickness of the sample. The interaction of the convergent cylindrically focused probing wave with the material anisotropy produces mul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823262



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