NIST logo

Publications Portal

You searched on:
Topic Area: Electronics
Telecommunications
Sorted by: title

Displaying records 701 to 710 of 747 records.
Resort by: Date / Title


701. Thermo-viscoelastic Analysis and Creep Testing of Ambient Cure Epoxy Adhesives Used in Construction Applications
Topic: Electronics & Telecommunications
Published: 7/30/2008
Authors: Joannie W Chin, Donald Lee Hunston, Aaron M Forster, Justin M Ocel, Jean Michel Hartmann, Paul Fuchs
Abstract: Epoxies are increasingly used in construction for structural applications and properties such as creep are very important. For this reason, the thermo-viscoelastic properties and creep response of two commercial, ambient cure structural epoxy adhesi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=861549

702. Third-Round Report of the SHA-3 Cryptographic Hash Algorithm Competition
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7896
Topic: Electronics & Telecommunications
Published: 11/15/2012
Authors: Shu-jen H Chang, Ray A Perlner, William E. (William E.) Burr, Meltem Sonmez Turan, John M Kelsey, Souradyuti Paul, Lawrence E Bassham
Abstract: The National Institute of Standards and Technology (NIST) opened a public competition on November 2, 2007 to develop a new cryptographic hash algorithm - SHA-3, which will augment the hash algorithms specified in the Federal Information Processing St ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912724

703. Time Domain Waveforms of a Line-Focus Transducer Probing Anisotropic Solids
Topic: Electronics & Telecommunications
Published: 1/1/1997
Authors: Nelson N. Hsu, Gerald V. Blessing, D Xiang
Abstract: We have developed a large lensless line-focus wideband ultrasonic transducer which can be used to probe solid materials through water. With conventional ultrasonic equipment the transducer can perform time and polarization resolved surface and body w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820017

704. Time Evolution of Ion Energy Distributions and Optical Emission in Pulsed Inductively Coupled Radio Frequency Plasmas
Topic: Electronics & Telecommunications
Published: 10/1/2000
Authors: Martin Misakian, Eric C Benck, Yicheng Wang
Abstract: This article reports the results of time-resolved measurements of ion energy distributions (IEDs), relative ion densities, as well as optical emissions and electrical characteristics in pulsed, inductively coupled plasmas for the simple gas mixture o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28915

705. Time and Polarization Resolved Ultrasonic Testing of Materials
Topic: Electronics & Telecommunications
Published: 1/1/1996
Authors: Gerald V. Blessing, D Xiang, Nelson N. Hsu
Abstract: We have developed a transducer which allows the benefits of Line Focus Beam (LFB) acoustic microscopy to be realized over large areas, using a conventional pulser-receiver. Experimental evidence is presented to show that the transducer is correctly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820040

706. Time-Resolved Line Focus Acoustic Microscopy of Composites
Topic: Electronics & Telecommunications
Published: 6/1/1999
Author: Nelson N. Hsu
Abstract: Acoustic microscopy has been used to measure material properties since the 1980s. The velocity of the leaky surface wave can be accurately determined from the V(z) curve which is formed by the interference between the leaky surface wave and specular ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821935

707. Time-Resolved Ultrasonic Body Wave Measurements of Material Anisotropy Using a Lensless Line-Focus Transducer
Topic: Electronics & Telecommunications
Published: 11/1/1998
Authors: Nelson N. Hsu, D Xiang, Gerald V. Blessing
Abstract: For plate-like sample geometries, a line-focus transducer can be used to detect back-reflected echoes through the thickness of the sample. The interaction of the convergent cylindrically focused probing wave with the material anisotropy produces mul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823262

708. Time-Resolved Ultrasonic Body Wave Measurements of Materials Anisotropy Using a Lensless Line-Focus Transducer
Topic: Electronics & Telecommunications
Published: 3/30/1999
Authors: Nelson N. Hsu, Gerald V. Blessing, D Xiang
Abstract: For plate-like sample geometries, a line-focus transducer can be used to detect back-reflected echoes through the thickness of the sample. The interaction of the convergent cylindrically focused probing wave with the material anisotropy produces mult ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820063

709. Time-and-Polarization-Resolved Acoustic Microscopy of Surface and Subsurface Cracks
Topic: Electronics & Telecommunications
Published: 12/1/1999
Authors: D Xiang, Gerald V. Blessing, Nelson N. Hsu
Abstract: Time-and-polarization-resolved acoustic microscopy with an improved-spatial-resolution line-focus transducer of simply reduced active element width is applied to characterize surface and subsurface cracks. From acoustic images obtained from scanning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821932

710. Time-resolved Balmer-alpha Emission from Fast Hydrogen Atoms in Low Pressure, Radio-Frequency Discharges in Hydrogen
Topic: Electronics & Telecommunications
Published: 5/1/1995
Authors: S. B. Radovanov, Krzysztof Dzierzega, J R Roberts, James K Olthoff
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2388



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series