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Topic Area: Electronics
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Displaying records 691 to 700 of 722 records.
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691. Transient Heating Study of Microhotplates by Using a High-Speed Thermal Imaging System
Topic: Electronics & Telecommunications
Published: 3/1/2002
Authors: Muhammad Yaqub Afridi, David W. Berning, Allen R Hefner Jr, John S Suehle, Mona Elwakkad Zaghloul, Eric Kelley, Zharadeen Rodriguez Parrilla, Colleen E. Hood
Abstract: A high-speed thermal imaging system is used to investigate the dynamic thermal behavior of MEMS-based (MicroElectroMechanical Systems) microhotplate devices. These devices are suspended microstructures fabricated in CMOS technology and are used in va ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14143

692. Translational Kinetic-Energy Distributions of Positive Ions Produced in Townsend Discharges of SF6 at High Electric Field-To-Gas Density Ratios (E/N)
Topic: Electronics & Telecommunications
Published: 7/1/1997
Authors: MVVS. Rao, James K Olthoff, Richard J. Van Brunt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27455

693. Tunneling Stabilized Magnetic Force Microscopy of YBa^d2^Cu^d3^O^d7-{delta}^ Films on MgO at 76 K
Topic: Electronics & Telecommunications
Published: 11/1/1991
Authors: Paul Rice, John M Moreland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30529

694. Tunneling Stabilized Magnetic Force Microscopy: Prospects for Low Temperature Applications to Superconductors
Topic: Electronics & Telecommunications
Published: 3/1/1991
Authors: John M Moreland, Paul Rice
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30534

695. Tunneling Stabilized Magnetic-Force Microscopy
Topic: Electronics & Telecommunications
Published: 1/1/1993
Authors: John M Moreland, V. Gopalan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30517

696. Tunneling-Stabilized Magnetic Force Microscopy of Bit Tracks on a Hard Disk
Topic: Electronics & Telecommunications
Published: 5/1/1991
Authors: Paul Rice, John M Moreland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30531

697. Ultrasonic Continuous-Wave Beam-Power Measurements: 1978-1980 International Comparison
Topic: Electronics & Telecommunications
Published: 8/2/1999
Author: Steven Earl Fick
Abstract: Four half-wave resonant, air-backed, x-cut quartz disc transducers designed and fabricated at the National Bureau of Standards (NBS) were circulated among seven laboratories between February 1978 and June 1980. Participants were given detailed instru ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820118

698. Ultrasonic Measurement of the Dynamic Elastic Moduli of Small Metal Samples
Topic: Electronics & Telecommunications
Published: 1/1/1999
Authors: John A Slotwinski, Gerald V. Blessing
Abstract: Ultrasonic velocity measurements were used to determine the dynamic elastic moduli small metal samples to a 2[sigma] measurement uncertainty of less than one percent. The samples were cylindrical in shape, possessing nominal diameters of 12 mm, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820134

699. Ultrasonic Power Output Measurement by Pulsed Radiation Pressure
Topic: Electronics & Telecommunications
Published: 9/1/1996
Authors: Steven Earl Fick, Franklin R Breckenridge
Abstract: Direct measurements of time-averaged spatially integrated output power radiated into reflectionless water loads can be made with high accuracy using techniques which exploit the radiation pressure exerted by sound on all objects in its path. With an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820048

700. Ultrasonic Research and Applications in the NIST Manufacturing Engineering Laboratory
Topic: Electronics & Telecommunications
Published: 1/1/1999
Authors: Gerald V. Blessing, Steven Earl Fick, Nelson N. Hsu, John A Slotwinski, D Xiang
Abstract: The Ultrasonics Group in the NIST Manufacturing Engineering Laboratory performs research, develops standards, and offers calibration services in support of U.S. industry. Pulsed ultrasonic and acoustic emission techniques are pursued for application ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820103



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