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Topic Area: Electronics
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Displaying records 641 to 650 of 739 records.
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641. Studies of Ion Bombardment in High Density Plasmas Containing CF^d4^
Topic: Electronics & Telecommunications
Published: 7/1/1999
Authors: James K Olthoff, Yicheng Wang
Abstract: We report ion energy distributions, relative ion intensities, and absolute total ion current densities at the grounded electrode of an inductively coupled Gaseous Electronics Conference radio-frequency reference cell for discharges generated in pure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6462

642. Studies of Ion Kinetic-Energy Distributions in the Gaseous Electronics Conference RF Reference Cell
Series: Journal of Research (NIST JRES)
Topic: Electronics & Telecommunications
Published: 7/1/1995
Authors: James K Olthoff, Richard J. Van Brunt, S. B. Radovanov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=22332

643. Sulfur Hexafluoride and the Electric Power Industry
Topic: Electronics & Telecommunications
Published: 9/1/1997
Authors: Loucas G. Christophorou, James K Olthoff, Richard J. Van Brunt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29211

644. Summary of Mechanical Metrology Measurement Services Customer Feedback FY 2000 to FY 2002
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7048
Topic: Electronics & Telecommunications
Published: 9/1/2003
Author: Donald G Eitzen
Abstract: This internal report summarizes the responses obtained from customers who received feedback cards which were enclosed with each calibration report produced by the Manufacturing Metrology Division (822). These calibration reports provided measure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822083

645. Summer Undergraduate Research Fellowships (SURF) at the National Institute of Standards and Technology
Topic: Electronics & Telecommunications
Published: 3/15/2011
Authors: Joseph J Kopanski, Richard L Steiner, Lisa Jean Fronczek, Christopher C White, Chiara F Ferraris
Abstract: We recruit students from underrepresented groups and at Colleges and Universities with limited on-campus opportunities for research experience. We strive to provide the highest quality and challenging undergraduate research experience by involving st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908434

646. Super-hydrophobic and/or Super-hydrophilic Surfaces Made by Plasma Process
Topic: Electronics & Telecommunications
Published: 5/8/2009
Authors: Lei Chen, Gerard Henein, James Alexander Liddle
Abstract: In this paper, a simple, fast, all-plasma surface modification (APSM) process, which can form super-hydrophobic and/or super-hydrophilic surfaces is introduced. The APSM process includes plasma-induced surface nano-pattern formation, substrate etchin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901919

647. Superparamagnetic Magnetic Force Microscopy Tips
Topic: Electronics & Telecommunications
Published: 4/1/1996
Authors: P F Hopkins, John M Moreland, S S Malhotra, S. H Liou
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30500

648. Surface Growth in Laser-Focused Atomic Deposition
Topic: Electronics & Telecommunications
Published: 7/15/1999
Authors: E Jurdik, T Rasing, K van, C Bradley, Jabez J McClelland
Abstract: We present calculations of surface growth in laser-focused nanostructure fabrication. We show that theoretical predictions of the structure profile s shape depend sensitively on the model used to describe the growth, and also on the parameters chose ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620511

649. Surface Modification of YBa^d2^Cu^d3^O^d7-{delta}^ Thin Films Using the Scanning Tunneling Microscope: Five Methods
Topic: Electronics & Telecommunications
Published: 1/1/1994
Authors: R. E. Thomson, John M Moreland, Alexana Roshko
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30504

650. Surface Potential Imaging for Magnetoresistive Head Development
Topic: Electronics & Telecommunications
Published: 9/1/1997
Authors: John M Moreland, Stephen E Russek, P F Hopkins
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30498



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