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Displaying records 321 to 322.
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321. Verification of an EMC facility retro fit using time domain and field uniformity measurements
Topic: Electronics & Telecommunications
Published: 7/8/2007
Authors: Dennis G. Camell, Michael Taylor, Robert T. Johnk, Benjamin Davis
Abstract: This paper summarizes a joint NIST Industry measurement effort. Time domain and field uniformity measurements are used to verify a retro-fit of RF absorber in an EMC Compliance Chamber from 30 MHz to 6 GHz. Time gating and dense frequency packing of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32649

322. Workshop on Micromechanics Measurement Technologies for Fiber-Polymer Interfaces
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6102
Topic: Electronics & Telecommunications
Published: 5/1/1997
Authors: Walter G McDonough, Richard~undefined~undefined~undefined~undefined~undefined Parnas, Gale Antrus Holmes, Donald Lee Hunston
Abstract: The Polymers Division hosted the Workshop on Micromechanics Measurement Technologies for Fiber-Polymer Interfaces, jointly sponsored by NIST and the Textile Research Institute of Princeton, NJ, on May 28-30, 1997. Fifty researchers from industry, ac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851382



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