NIST logo

Publications Portal

You searched on:
Topic Area: Electronics
Telecommunications
Sorted by: title

Displaying records 631 to 640 of 745 records.
Resort by: Date / Title


631. Standard Reference Materials for Foods and Dietary Supplements
Topic: Electronics & Telecommunications
Published: 9/1/2007
Authors: Katherine E Sharpless, Jeanice M Brown Thomas, Steven J Christopher, Robert Russ Greenberg, Lane C Sander, Michele M Schantz, Michael James Welch, Stephen A Wise
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902875

632. Standard Reference Materials to Support U.S. Regulations for Nutrients and Contaminants in Food and Dietary Supplements
Topic: Electronics & Telecommunications
Published: 8/1/2004
Authors: Stephen A Wise, Katherine E Sharpless, Lane C Sander, Willie E May
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902787

633. Standards: Who Needs Them? An OLES initiative to identify standards needs in the responder community.
Series: OTHER
Topic: Electronics & Telecommunications
Published: 1/3/2012
Authors: William Guy Billotte, Jennifer Lyn Marshall, Sharon Nakich
Abstract: There is little understanding about who is interested in standards and which standards are being used in the responder community. Thus, the Law Enforcement Standards Office (OLES) implemented a small pilot to gather metrics and insights. OLES worked ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910380

634. State-of-the-Art Comparability of Corrected Emission Spectra-Part II: Peer-toPeer Assessment of Calibration Performance Using Spectral Fluorescence Standards
Topic: Electronics & Telecommunications
Published: 2/28/2012
Authors: Paul C DeRose, Joanne C Zwinkels, Bernd Ebert
Abstract: The tremendous growth of fluorescence applications in the life and material sciences has proceeded largely without sufficient concern for the reliability and uncertainties related to the characterization and performance validation of fluorescence ins ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907887

635. Statistical Analysis of 4 MN Force Range Key Comparison
Report Number: 823017
Topic: Electronics & Telecommunications
Published: 11/27/2007
Author: Thomas William Bartel
Abstract: The factors contributing to the uncertainty are discussed for the measurements that were conducted for the 2 MN and 4MN force values of the very high force CIPM key comparison. Details of the statistical analysis by the pilot institute, NIST, are pro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823017

636. Statistical Error Analysis of Time and Polarization Resolved Ultrasonic Measurements
Topic: Electronics & Telecommunications
Published: 1/1/1997
Authors: D Xiang, Gerald V. Blessing, Nelson N. Hsu
Abstract: The time and polarization resolved ultrasonic technique which we previously developed has been demon-strated to simultaneously provide measurements of the wave velocity in the coupling liquid, and the leaky surface wave and leaky longitudinal wave ve ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820073

637. Status of High-Voltage, High-Frequency Silicon-Carbide Power Devices
Topic: Electronics & Telecommunications
Published: 3/22/2006
Author: Allen R Hefner Jr
Abstract: The emergence of High-Voltage, High-Frequency (HV-HF) Silicon-Carbide (SiC) power devices is expected to revolutionize commercial and military power distribution and conversion systems. The DARPA Wide Bandgap Semiconductor Technology (WBST) High Powe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32207

638. Status of Reference Waveform Standards Development at NIST
Topic: Electronics & Telecommunications
Published: 6/1/1982
Authors: J R Andrews, N. S. Nahman, Barry A. Bell
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31150

639. Status of the DARPA WBST High Power Electronics Program in SiC Device Development and Technology Transition
Topic: Electronics & Telecommunications
Published: 3/19/2007
Authors: Allen R Hefner Jr, Sharon Beermann-Curtin
Abstract: The emergence of High-Voltage, High-Frequency (HV-HF) Silicon-Carbide (SiC) power devices is expected to revolutionize industriall and military power generation, transmission and distribution systems. The DARPA Wide Bandgap Semiconductor Technology ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32598

640. Stochastic Properties of Partial-Discharge Phenomena: A Review
Topic: Electronics & Telecommunications
Published: 11/1/1991
Author: Richard J. Van Brunt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28540



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series