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Displaying records 631 to 640 of 739 records.
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631. Statistical Analysis of 4 MN Force Range Key Comparison
Report Number: 823017
Topic: Electronics & Telecommunications
Published: 11/27/2007
Author: Thomas William Bartel
Abstract: The factors contributing to the uncertainty are discussed for the measurements that were conducted for the 2 MN and 4MN force values of the very high force CIPM key comparison. Details of the statistical analysis by the pilot institute, NIST, are pro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823017

632. Statistical Error Analysis of Time and Polarization Resolved Ultrasonic Measurements
Topic: Electronics & Telecommunications
Published: 1/1/1997
Authors: D Xiang, Gerald V. Blessing, Nelson N. Hsu
Abstract: The time and polarization resolved ultrasonic technique which we previously developed has been demon-strated to simultaneously provide measurements of the wave velocity in the coupling liquid, and the leaky surface wave and leaky longitudinal wave ve ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820073

633. Status of High-Voltage, High-Frequency Silicon-Carbide Power Devices
Topic: Electronics & Telecommunications
Published: 3/22/2006
Author: Allen R Hefner Jr
Abstract: The emergence of High-Voltage, High-Frequency (HV-HF) Silicon-Carbide (SiC) power devices is expected to revolutionize commercial and military power distribution and conversion systems. The DARPA Wide Bandgap Semiconductor Technology (WBST) High Powe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32207

634. Status of Reference Waveform Standards Development at NIST
Topic: Electronics & Telecommunications
Published: 6/1/1982
Authors: J R Andrews, N. S. Nahman, Barry A. Bell
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31150

635. Status of the DARPA WBST High Power Electronics Program in SiC Device Development and Technology Transition
Topic: Electronics & Telecommunications
Published: 3/19/2007
Authors: Allen R Hefner Jr, Sharon Beermann-Curtin
Abstract: The emergence of High-Voltage, High-Frequency (HV-HF) Silicon-Carbide (SiC) power devices is expected to revolutionize industriall and military power generation, transmission and distribution systems. The DARPA Wide Bandgap Semiconductor Technology ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32598

636. Stochastic Properties of Partial-Discharge Phenomena: A Review
Topic: Electronics & Telecommunications
Published: 11/1/1991
Author: Richard J. Van Brunt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28540

637. Strain rate effect on single PPTA fiber tensile behaviour
Topic: Electronics & Telecommunications
Published: 7/28/2013
Authors: Jae Hyun Kim, Nathanael A Heckert, Stefan D Leigh, Walter G McDonough, Kirk D Rice, Gale Antrus Holmes
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913925

638. Strain-Induced Grain Growth during Rapid Thermal Cycling of Aluminum Interconnects
Topic: Electronics & Telecommunications
Published: 1/1/2007
Authors: Robert R Keller, Roy Howard Geiss, Nicholas Barbosa, Andrew J Slifka, David Thomas Read
Abstract: We demonstrate by use of automated electron backscatter diffraction (EBSD) the rapid growth of grains in non-passivated, sputtered Al-1Si interconnects during 200 Hz thermal cycling induced by alternating electric current. Mean grain diameters were o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50338

639. Strong Casimir force reduction by metallic surface nanostructuring
Topic: Electronics & Telecommunications
Published: 9/27/2013
Authors: Francesco Intravaia, Stefan T. Koev, Il Woong Jung, Albert A. Talin, Paul S Davids, Ricardo Decca, Vladimir A Aksyuk, Diego A. R. Dalvit, Daniel Lopez
Abstract: The Casimir force is a quantum-mechanical interaction arising from vacuum fluctuations of the electromagnetic (EM) field and is technologically significant in micro- and nanomechanical systems. Despite rapid progress in nanophotonics, the goal of e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910133

640. Structural and Electrical Characterization of Flip Chip Laminated omega-functionalized thiols
Topic: Electronics & Telecommunications
Published: 4/15/2010
Authors: Mariona Coll Bau, Oana Jurchescu, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907067



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