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Displaying records 631 to 640 of 735 records.
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631. Status of the DARPA WBST High Power Electronics Program in SiC Device Development and Technology Transition
Topic: Electronics & Telecommunications
Published: 3/19/2007
Authors: Allen R Hefner Jr, Sharon Beermann-Curtin
Abstract: The emergence of High-Voltage, High-Frequency (HV-HF) Silicon-Carbide (SiC) power devices is expected to revolutionize industriall and military power generation, transmission and distribution systems. The DARPA Wide Bandgap Semiconductor Technology ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32598

632. Stochastic Properties of Partial-Discharge Phenomena: A Review
Topic: Electronics & Telecommunications
Published: 11/1/1991
Author: Richard J. Van Brunt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28540

633. Strain rate effect on single PPTA fiber tensile behaviour
Topic: Electronics & Telecommunications
Published: 7/28/2013
Authors: Jae Hyun Kim, Nathanael A Heckert, Stefan D Leigh, Walter G McDonough, Kirk D Rice, Gale Antrus Holmes
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913925

634. Strain-Induced Grain Growth during Rapid Thermal Cycling of Aluminum Interconnects
Topic: Electronics & Telecommunications
Published: 1/1/2007
Authors: Robert R Keller, Roy Howard Geiss, Nicholas Barbosa, Andrew J Slifka, David Thomas Read
Abstract: We demonstrate by use of automated electron backscatter diffraction (EBSD) the rapid growth of grains in non-passivated, sputtered Al-1Si interconnects during 200 Hz thermal cycling induced by alternating electric current. Mean grain diameters were o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50338

635. Strong Casimir force reduction by metallic surface nanostructuring
Topic: Electronics & Telecommunications
Published: 9/27/2013
Authors: Francesco Intravaia, Stefan T. Koev, Il Woong Jung, Albert A. Talin, Paul S Davids, Ricardo Decca, Vladimir A Aksyuk, Diego A. R. Dalvit, Daniel Lopez
Abstract: The Casimir force is a quantum-mechanical interaction arising from vacuum fluctuations of the electromagnetic (EM) field and is technologically significant in micro- and nanomechanical systems. Despite rapid progress in nanophotonics, the goal of e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910133

636. Structural and Electrical Characterization of Flip Chip Laminated omega-functionalized thiols
Topic: Electronics & Telecommunications
Published: 4/15/2010
Authors: Mariona Coll Bau, Oana Jurchescu, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907067

637. Studies of Ion Bombardment in High Density Plasmas Containing CF^d4^
Topic: Electronics & Telecommunications
Published: 7/1/1999
Authors: James K Olthoff, Yicheng Wang
Abstract: We report ion energy distributions, relative ion intensities, and absolute total ion current densities at the grounded electrode of an inductively coupled Gaseous Electronics Conference radio-frequency reference cell for discharges generated in pure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6462

638. Studies of Ion Kinetic-Energy Distributions in the Gaseous Electronics Conference RF Reference Cell
Series: Journal of Research (NIST JRES)
Topic: Electronics & Telecommunications
Published: 7/1/1995
Authors: James K Olthoff, Richard J. Van Brunt, S. B. Radovanov
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=22332

639. Sulfur Hexafluoride and the Electric Power Industry
Topic: Electronics & Telecommunications
Published: 9/1/1997
Authors: Loucas G. Christophorou, James K Olthoff, Richard J. Van Brunt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29211

640. Summary of Mechanical Metrology Measurement Services Customer Feedback FY 2000 to FY 2002
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7048
Topic: Electronics & Telecommunications
Published: 9/1/2003
Author: Donald G Eitzen
Abstract: This internal report summarizes the responses obtained from customers who received feedback cards which were enclosed with each calibration report produced by the Manufacturing Metrology Division (822). These calibration reports provided measure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822083



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