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Displaying records 21 to 30 of 318 records.
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21. A Test Method for Assessing Interfacial Shear Strength in Composites
Topic: Electronics & Telecommunications
Published: 5/1/2000
Authors: Gale Antrus Holmes, Donald Lee Hunston, Walter G McDonough, R C Peterson
Abstract: Two of the critical factors controlling the long-term performance and durability of composites in structural applications is the fiber-matrix interfacial shear strength (IFSS) and the durability of the fiber-matrix interface. The single fiber fragme ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851685

22. A Transient Response Error in Microwave Power Meters UsingThermistor Detectors
Topic: Electronics & Telecommunications
Published: 12/1/1986
Authors: Fred R. Clague, N T Larsen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30937

23. A four-pixel single-photon pulse-position array fabricated from WSi superconducting nanowire single- photon detectors
Topic: Electronics & Telecommunications
Published: 2/3/2014
Authors: Varun Boehm Verma, Robert Daniel Horansky, Francesco Marsili, Jeffrey Stern, Matthew Shaw, Adriana Eleni Lita, Richard P Mirin, Sae Woo Nam
Abstract: We demonstrate a scalable readout scheme for an infrared single-photon pulse-position camera consisting of WSi superconducting nanowire single-photon detectors. For an N {multiply} N array, only 2 {multiply} N wires are required to obtain the pos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914494

24. A quantitative study of the practical sensitivity limit of a terahertz absorption spectrometer.
Topic: Electronics & Telecommunications
Published: 3/18/2008
Authors: Jon E. Bjarnason, Charles Dietlein, Erich N Grossman
Abstract: In gas spectroscopy, chemicals can be identified by the set of frequencies at which their absorption lines occur. The concentration can be quantitatively estimated from the intensity of any of the absorption lines. The sensitivity of the spectrometer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32980

25. A statistical study of de-embedding applied to eye diagram analysis
Topic: Electronics & Telecommunications
Published: 2/1/2012
Authors: Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
Abstract: We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907585

26. Absorption, transmission, and scattering of expanded polystyrene at millimeter-wave and terahertz frequencies
Topic: Electronics & Telecommunications
Published: 3/17/2008
Authors: Charles Dietlein, Jon E. Bjarnason, Erich N Grossman, Zoya Popovic
Abstract: Conventional material measurements of transmission and reflection in the millimeter-wave and terahertz frequency range do not differentiate between scattering and absorption, grouping effects from both mechanisms together into 'loss'. Accurate knowle ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32981

27. Accurate Determination of Planar Near-Field Correction Parameters for Linearly Polarized Probes
Topic: Electronics & Telecommunications
Published: 6/1/1988
Authors: Andrew G. Repjar, Allen C. Newell, Michael H Francis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=26180

28. Adhesion Research at the National Institute of Standard and Technology (NIST)
Topic: Electronics & Telecommunications
Published: 3/11/2009
Authors: Donald Lee Hunston, Christopher M Stafford
Abstract: Over the years, NIST has been very active in adhesion research. Although there has never been an organizational group or large-scale program that focused specifically on this topic, a wide variety of projects have had adhesion, or related properties ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902030

29. Alignment Procedures for Field-Evaluation Measurements on a Spherical Surface
Topic: Electronics & Telecommunications
Published: 10/1/1999
Authors: Jeffrey R Guerrieri, Seturnino Canales
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29685

30. Amorphous Calcium Phosphate Based Composites: Effect of Surfactants and Poly(Ethylene Oxide) on Filler and Composite Properties
Topic: Electronics & Telecommunications
Published: 8/19/2008
Authors: Joseph M Antonucci, Da-Wei Liu, Drago Skrtic
Abstract: The uncontrolled aggregation of amorphous calcium phosphate (ACP) particulate fillers and their uneven distribution within polymer matrices can have adverse effects on the properties of ACP composites. In this paper we assessed the influence of non- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852635



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