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Topic Area: Electronics
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Displaying records 731 to 735.
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731. Planning Guidance for Future EMI Measurement Instrumentation
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 82-1662
Topic: Electronics & Telecommunications
Published: 4/1/1982
Authors: M G Arthur, R. D. Orr, Gerome R. Reeve
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31164

732. Synthesized Isotropic Pattern Antennas for EM FieldMeasurements
Topic: Electronics & Telecommunications
Published: 8/1/1981
Author: Gerome R. Reeve
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31193

733. Fields of a Horizontal Loop of Arbitrary Shape Buried in a Two-Layer Earth
Topic: Electronics & Telecommunications
Published: 9/1/1980
Authors: J. R. Wait, David Allan Hill
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31232

734. A 100 Tohm Guarded Hamon Transfer Standard
Topic: Electronics & Telecommunications
Published: Date unknown
Authors: Dean G Jarrett, Edward O'Brien, Marlin E Kraft
Abstract: Guarded Hamon transfer standards are used at NIST for scaling to high resistance levels. An improved design for a guarded Hamon transfer standard in the range from 1 TΩ to 100 TΩ is described. Measurements taken to select the primary and g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915486

735. Colliding Self-Assembly Waves in Organosilane Monolayers
Topic: Electronics & Telecommunications
Published: Date unknown
Authors: K Efimenko, Ali Ozcam, Jan Genzer, Daniel A Fischer, Frederick R Phelan Jr, Jack F Douglas
Abstract: Colliding autocatalytic wave-fronts of organosilane (OS) layer self-assembly are generated through the controlled positioning of sources of the volatile OS material at the edges of a silica wafer and through adjustment of the container dimensions in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903663



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