NIST logo

Publications Portal

You searched on: Topic Area: Electron Physics Sorted by: title

Displaying records 81 to 90 of 100 records.
Resort by: Date / Title

81. Resonant Structure in Electron Impact Excitation of Xenon
Topic: Electron Physics
Published: 1/1/1973
Authors: Nils Swanson, Robert Celotta, C Kuyatt

82. Resonant Structure in Near-Threshold Electron Excitation of Krypton
Topic: Electron Physics
Published: 10/1/1973
Authors: Nils Swanson, J Cooper, C Kuyatt
Abstract: By using a monochromator-analyzer combination, electron-excitation functions of the lowest-lying electronic states of krypton have been obtained at a scattering angle of 45{degree} in the near-threshold region (9-14 eV). All excitation functions disp ...

83. Semiautomated Data-Recording and Control System for an Electron Energy Analyzer
Topic: Electron Physics
Published: 8/1/1973
Author: Cedric John Powell
Abstract: A description is given of a digital data-recording and control system that has been used with a high resolution low energy electron scattering apparatus for the measurement of characteristic electron energy-loss spectra and Auger-electron spectra of ...

84. Semiclassical Boltzmann transport theory for graphene multilayers
Topic: Electron Physics
Published: 5/11/2011
Authors: Hongki Min, Parakh Jain, Shaffique Adam, Mark D Stiles
Abstract: We calculate the conductivity of arbitrarily stacked multilayer graphene sheets within a relaxation time approximation by considering both short-range and long-range impurities. We investigate theoretically the feasibility of identifying the stackin ...

85. Sources of Polarized Electrons
Topic: Electron Physics
Published: 1/1/1980
Authors: Robert Celotta, Daniel Thornton Pierce

86. Spin Sensitivity of a Channel Electron Multiplier
Topic: Electron Physics
Published: 3/1/1988
Authors: R E. Scholten, Jabez J McClelland, Michael H Kelley, Robert Celotta
Abstract: We report direct measurements of the sensitivity of a channel electron multiplier to electrons with different spin orientations. Four regions of the multiplier cone were examined using polarized electrons at 100-eV incident energy. Pulse counting and ...

87. Spin-transfer dynamics in spin valves with out-of-plane magnetized CoNi free layers
Topic: Electron Physics
Published: 1/29/2010
Authors: William H Rippard, Alina M Deac, Matthew R Pufall, Justin M Shaw, Mark W Keller, Stephen E Russek, Gerrit E Bauer, Claudio Serpico
Abstract: We have measured spin-transfer-induced dynamics in magnetic nanocontact devices having a perpendicularly magnetized Co/Ni free layer and an in-plane magnetized CoFe fixed layer. The frequencies and powers of the excitations agree well with the predic ...

88. Systematic transformations of the asymptotic aberration coefficients of round electrostatic lenses (1)
Topic: Electron Physics
Published: 5/1/1978
Author: C Kuyatt
Abstract: In previous work we formulated the third-order asymptotic aberration coefficients of round (axially symmetric) electrostatic lenses in a form independent of object and aperture positions, and expressions for the six quantities which are sufficient t ...

89. Temperature Effects in Polarized Low-Energy Electron Scattering from Solids and Liquids
Topic: Electron Physics
Published: 3/1/1978
Author: W Unertl
Abstract: The effects of temperature on the polarization of low-energy electrons scattered from surfaces of liquids, polycrystals, and single crystals are discussed. The polarization of the single scattering component of the intensity is shown to be independe ...

90. Tests of Fourth-Order Difference Equations for Laplace's Equation in Cylindrical Coordinates
Topic: Electron Physics
Published: 1/1/1978
Authors: C Kuyatt, A Galejs

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series