NIST logo

Publications Portal

You searched on:
Topic Area: Chemistry

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 931 to 940 of 1000 records.
Resort by: Date / Title

931. Gas Chromatographic Retention Parameters Database for Composition Management of Refrigerant Mixtures
Topic: Chemistry
Published: 12/1/1998
Authors: Thomas J Bruno, G Bachmeyer, K H Wertz

932. Inexpensive Vibrational Anharmonicities from Estimated Derivatives: Diatomic Molecules
Topic: Chemistry
Published: 12/1/1998
Authors: P Hassanzadeh, Karl K Irikura

933. Nitrogen Distribution Measurements by Neutron Induced Autoradiography
Topic: Chemistry
Published: 12/1/1998
Authors: Z En, J S Brenizer, B Hostica, J Gao, D. A. Becker

934. Nuclear Reaction Prompt Gamma-Ray Analysis
Topic: Chemistry
Published: 12/1/1998
Authors: G L Molnar, Richard Mark Lindstrom

935. Preliminary Evaluation of an SF5+ Polyatomic Primary Ion Beam for Analysis of Organic Thin Films by Secondary Ion Mass Spectrometry
Topic: Chemistry
Published: 12/1/1998
Authors: John G Gillen, S V. Roberson

936. Separation of Green Tea Catechins by Micellar Electrokinetic Capillary Chromatography
Topic: Chemistry
Published: 12/1/1998
Authors: Bryant C Nelson, Jeanice M Brown Thomas, Stephen A Wise, J. J. Dalluge

937. The Formation of Abrupt n+ Doping Profiles Using Atomic Hydrogen and Sb During Si MBE
Topic: Chemistry
Published: 12/1/1998
Authors: P E Thompson, C Silvestre, M E Twigg, G Jernigan, David S Simons

938. The Southern California Ozone Study 97 Radiocarbon Experiment
Topic: Chemistry
Published: 12/1/1998
Authors: George A Klouda, C. W. Lewis, J L Marolf, D C Stiles, K G Kronmiller, K D Oliver, J R Adams

939. Configurational Temperature: Verification of Monte-Carlo Simulations
Topic: Chemistry
Published: 10/22/1998
Authors: B D. Butler, G Ayton, O G Jepps, D J Evans

940. Standard Test Data for Estimating Peak Parameter Errors in X-Ray Photoelectron Spectroscopy: I. Results for Peak Binding Energies
Topic: Chemistry
Published: 10/1/1998
Authors: Joseph M Conny, Cedric John Powell, Lloyd A. Currie
Abstract: Standard test data(STD) are simulations of analytical instrument responses that help determine the veracity of computer-based, data analysis procedures that are typically used with instruments. The STD were developed for determining errors in peak p ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series