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Topic Area: Chemistry

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911. Elemental and Molecular Imaging of Human Hair Using Secondary Ion Mass Spectrometry
Topic: Chemistry
Published: 4/1/1999
Authors: John G Gillen, S V. Roberson, C M. Ng, M Stranick
Abstract: Secondary ion mass spectrometry (SIMS) is used to image the spatial distribution of elemental and molecular species on the surface and in cross-sections of doped human hair using a magnetic sector SIMS instrument operated as an ion microprobe. Analy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831098

912. Fractal Dimension of Particle Outlines: Meaning, Utility, Limitations, Standard Images and Examples
Topic: Chemistry
Published: 4/1/1999
Author: David S. Bright
Abstract: Only a handful of shape parameters, such as aspect ratio and circularity, are in common use for characterizing individual microscopic particles. The fractal dimension, D, is seeing increased use as an additional shape parameter because particle shape ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831092

913. Quantitative Absorption Measurements Using Cavity Ringdown Spectroscopy With Pulsed Lasers
Topic: Chemistry
Published: 4/1/1999
Authors: J P. Looney, Joseph Terence Hodges, Roger D van Zee
Abstract: The theory and implementation of quantitative gas phase absorption measurements based on cavity-ringdown spectroscopy with pulsed lasers is discussed. The response of ringdown cavities is modeled using an eigenmode description of the electromagnetic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831468

914. The Kilogram: Last remaining artifact
Topic: Chemistry
Published: 4/1/1999
Author: Zeina Jabbour Kubarych
Abstract: The unit of mass, the kilogram, is the last remaining basic unit defined by an artifact. Worldwide efforts are underway to replace the artifact-based definition with invariant alternatives. This paper describes briefly the history of the kilogram, th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820097

915. Monitoring the Destruction of Carbon Phases in Soils and Sediments for Sequential Chemical Extractions
Topic: Chemistry
Published: 3/1/1999
Authors: M K Schultz, S R. Biegalski, K G Inn, Lee Lijian Yu, W. C. Burnett, J. L. W. Thomas , G. E. Smith
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100822

916. Shear-Induced Restructuring of Concentrated Colloidal Silica Gels
Topic: Chemistry
Published: 2/15/1999
Authors: H J Hanley, Chris D Muzny, B D. Butler, G C. Straty, J Bartlett, E. Drabarek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100685

917. Analysis of Urban Particulate Standard Reference Materials for the Determination of Chlorinated Organic Contaminants and Additional Chemical and Physical Properties
Topic: Chemistry
Published: 2/1/1999
Authors: Dianne L Poster, Michele M Schantz, Stephen A Wise, M. G. Vangel
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100817

918. Recent History and Future Challenges of ^u14^C Aerosol Research
Topic: Chemistry
Published: 2/1/1999
Author: Lloyd A. Currie
Abstract: A review is given of some critical events in the development 14C aerosol science, and the profound influence of 14C accelerator mass spectrometry on its current applications and future prospects. The birth of this discipline occurred shortly after th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831099

919. SO^dx^ Radical Monoanions--Reactions in Solution and in the Gas Phase
Topic: Chemistry
Published: 2/1/1999
Authors: Robert Elliott Huie, L W. Sieck
Abstract: Sulfur dioxide, SO^d2^, is a major air pollutant and a natural trace atmospheric constituent. The major anthropogenic source of SO^d2^ is the combustion of fossil fuels, although much also arises from scrubbing natural gas and from smelting sulfide ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831479

920. Surface Sensitivity of Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
Topic: Chemistry
Published: 1/1/1999
Authors: Cedric John Powell, Aleksander Jablonski, I S Tilinin, S Tanuma, David R. Penn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100662



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