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Topic Area: Nanomechanics
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Displaying records 11 to 15.
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11. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Nanomechanics
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932

12. Prediction of Elastic Properties of Heterogeneous Materials With Complex Microstructures
Topic: Nanomechanics
Published: 1/1/2007
Authors: Yong Ni, Martin Y Chiang
Abstract: A homogenization method combining the Eshelby equivalent eigenstrain approach and the phase-field microelasticity for numerically solving the eigenstrain, is developed to predict all the effective elastic constants of three-dimensional heterogeneous ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852626

13. Si3N4 optomechanical crystals in the resolved-sideband regime
Topic: Nanomechanics
Published: 1/27/2014
Authors: Marcelo Ishihara Davanco, Serkan Ates, Yuxiang Liu, Kartik A Srinivasan
Abstract: We demonstrate sideband-resolved Si3N4 optomechanical crystals supporting 105 quality factor optical modes at 980 nm, coupled to approximately 4 GHz frequency mechanical modes with quality factors of approximately 3000. Optomechanical electromagneti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914944

14. Structure-property relationships for methyl-terminated alkyl self-assembled monolayers
Topic: Nanomechanics
Published: 7/20/2011
Authors: Frank W DelRio, Dave Rampulla, Cherno Jaye, Gheorghe Stan, Richard Swift Gates, Daniel A Fischer, Robert Francis Cook
Abstract: Structure-property relationships for methyl-terminated alkyl self-assembled monolayers (SAMs) are developed using near-edge X-ray absorption fine structure spectroscopy (NEXAFS) and atomic force microscopy (AFM). NEXAFS C K-edge spectra are used to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908238

15. Thickness effect on the viscoelastic properties of polystyrene thin films as measured by thermal wrinkling
Topic: Nanomechanics
Published: 12/29/2010
Authors: Edwin P Chan, Santanu S. Kundu, Qinhuang Lin, Christopher M Stafford
Abstract: The viscoelastic properties of polymer thin films can have a significant impact on the performance in many small-scale devices. In this work, we use thermal wrinkling, which is a phenomenon based on a thermally-initiated instability, to measure visco ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906587



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