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You searched on: Topic Area: Nanoelectronics and Nanoscale Electronics Sorted by: date

Displaying records 11 to 20 of 48 records.
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11. Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Topic: Nanoelectronics and Nanoscale Electronics
Published: 12/28/2011
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910545

12. TaOx Memristive Devices with Ferromagnetic Electrodes
Topic: Nanoelectronics and Nanoscale Electronics
Published: 12/7/2011
Authors: Hyuk-Jae Jang, Pragya Rasmi Shrestha, Oleg A Kirillov, Helmut Baumgart, Kin P Cheung, Oana Jurchescu, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910359

13. Structural and electrical properties of Flip Chip Laminated metal-molecule-silicon structures modifying molecular backbone and atomic tether
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/19/2011
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
Abstract: The formation of electrical contacts on organic molecules preserving their integrity and using a scalable technique is a key step toward the fabrication of molecular electronic devices. Here we study the structural and electrical properties of metal- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906090

14. Electron Transport in Gold Nanowires: Stable 1-, 2- and 3-Dimensional Atomic Structures and Non-Integer Conduction States
Topic: Nanoelectronics and Nanoscale Electronics
Published: 9/14/2011
Authors: Francesca M Tavazza, Douglas T Smith, Lyle E Levine, Jon Robert Pratt, Anne M. Chaka
Abstract: Experimental conductivity measurements made during highly stable tensile deformation of Au nanowires show a rich variety of behaviors, including non-integer quantum conductance plateaus, transitions and slopes. Using tight binding conductance cal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906808

15. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Nanoelectronics and Nanoscale Electronics
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932

16. Fabrication and characterization of silicon-based molecular electronic devices
Topic: Nanoelectronics and Nanoscale Electronics
Published: 5/21/2011
Authors: Christina Ann Hacker, Michael A Walsh, Sujitra Jeanie Pookpanratana, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908433

17. Electrical Reliability Testing of Single-Walled Carbon Nanotube Networks
Topic: Nanoelectronics and Nanoscale Electronics
Published: 5/18/2011
Authors: Mark C Strus, Ann Chiaramonti Chiaramonti Debay, Robert R Keller, Yung Joon Jung, Younglae Kim
Abstract: We present test methods to investigate the electrical reliability of nanoscale lines of highly-aligned, networked, metallic/semiconducting single-walled carbon nanotubes (SWCNTs) fabricated through a template-based fluidic assembly process. We find ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907014

18. Flexible Memristors Fabricated through Sol-Gel Hydrolysis
Topic: Nanoelectronics and Nanoscale Electronics
Published: 5/1/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A Herzing, Madelaine Herminia Hernandez, Joseph J Kopanski, Christina Ann Hacker, Curt A Richter
Abstract: Memristors were fabricated on flexible polyethylene terephthalate substrates consisting of an oxide film generated through hydrolysis of a spun-on sol-gel. X-ray photoelectron spectroscopy, spectroscopic ellipsometry, transmission electron microscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907805

19. Fabrication of silicon-based Molecular Electronic Structures Using Flip Chip Lamination
Topic: Nanoelectronics and Nanoscale Electronics
Published: 1/19/2011
Authors: Christina Ann Hacker, Michael A Walsh, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908430

20. Calibrated nanoscale capacitance measurements using a scanning microwave microscope
Topic: Nanoelectronics and Nanoscale Electronics
Published: 11/2/2010
Authors: H P Hubner, M. Moertelmaier, Pavel Kabos, M. Fenner, C Rankl, Atif A. Imtiaz
Abstract: A scanning microwave microscope (SMM) for spatially resolved capacitance measurements in the attofarad-to-femtofarad regime is presented. The system is based on the combination of an atomic force microscope (AFM) and a performance network analyzer ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905191



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